Products

Cascade SUMMIT200 Advanced 200 mm Probe Station

Key Features:

• High-accuracy electrical measurements for DC, RF, mmW, and THz applications.
• Up to 5X faster time to accurate data with automated wafer handling.
• Wide thermal range from -60°C to +300°C with IceShield™.
• PureLine™, AttoGuard®, and MicroChamber® technologies for ultra-low noise performance.
• Precision sub-micron positioning with advanced 4-axis stage and VueTrack PRO.
• Flexible platform for device characterization, FA, WLR, and design debug.
• Velox control software with modern UI, workflow guide, and automation tools.
• Ergonomic operation with quick manual wafer access and roll-out stage.

Cascade TESLA300 is a 300 mm semi- and fully-automated probe system for advanced on-wafer power device characterization, ensuring safe, precise, and high-power testing.

Key Features:

• On-wafer device testing up to 10,000 V DC / 600 A
• AttoGuard™ and FemtoGuard™ chuck technologies for low-leakage, high-accuracy measurements
• MicroVac™ chuck ensures thin wafer stability and minimal contact resistance
• TÜV-certified safety system with full enclosure and interlocks
• Wide thermal range: -60°C to +300°C with TopHat chamber
• Roll-out chuck and auxiliary mounts for flexible wafer handling
• Remote operation and full software integration with Velox and analyzers
• Material Handling Unit (MHU301) for automated wafer loading and barcode recognition

Cascade CM300xi-SiPh Probe System – 300 mm Wafer and Die-Level Photonics Testing

Key Features:

• Integrated silicon photonics wafer and die-level probing solution.
• Autonomous SiPh Measurement Assistant for hands-free calibration.
• OptoVue™ technology for real-time, in-situ optical calibrations.
• Supports vertical, horizontal edge, and wafer-level edge coupling.
• Dark, shielded, frost-free environment with SiPh TopHat.
• Thermal capability from -40°C to +125°C.
• Exclusive SiPh-Tools and Photonics Controller Interface (PCI) software.
• Partnerships with Keysight and PI for precision instrumentation.
• Easy setup and automation with Velox and Velox Dash™ interface.

Cascade CM300xi-ULN Probe System – Ultra Low Noise 300 mm Wafer Prober

Key Features:

• Ultra-low noise measurements with patented PureLine™ 3 technology.
• Ideal for flicker noise (1/f), RTN, and phase noise testing of ultra-sensitive devices.
• Fully shielded MicroChamber™ for EMI/RFI protection and frost-free low-temperature operation.
• Plug-and-Go TestCell Power Management eliminating ground-loop noise.
• Autonomous 24/7 operation with optimized motorized probe positioners.
• Wide thermal range from -65°C to +300°C with fA/fF measurement precision.
• Integrated Velox software for simple, efficient automation.

Teledyne Test Tools Digital Power Meters provide reliable, high-precision AC and DC power measurements in a compact design. Ideal for R&D, QA, and compliance testing.

Key Features:

• Bandwidth: DC, 0.1 Hz to 100 kHz
• High-resolution 4″ and 5″ TFT LCD displays
• 19 power measurement parameters
• 16-bit ADC and 300 kHz sampling rate (T3PM1100)
• Waveform, harmonic, and integration functions
• External current sensor input (T3PM1100)
• Supports IEC 62301 and IEC 61000-4-7 standards
• Interfaces: USB, LAN, RS-232C
• Front/rear terminal inputs for flexible testing

A compact and flexible semi-automated wafer probe system designed for RF/DC modeling, device characterization, and advanced measurement needs.

Key Features:

• Mechanical platen lift for safer RF set-ups and reduced operator errors
• Fully compatible with Autonomous RF/DC measurement assistants and Velox Dash™ app
• Reconfigurable platen inserts (TopHat, PCH, IceShield) for versatile test configurations
• Spacious platen design supporting RF and DC setups with ease
• Compact footprint with field-upgradable components
• Integrated Low-Volume MicroChamber and FemtoGuard thermal triaxial chuck

HDA125 High-Speed Digital Analyzer brings advanced logic analysis capabilities to your existing Teledyne LeCroy oscilloscopes. Compact, accurate, and versatile.

Key Features:

• 12.5 GS/s sample rate for high-speed digital capture
• Supports up to 18 digital channels
• Compatible with WaveMaster/SDA 8 Zi-B and LabMaster 10Zi-A oscilloscopes
• QuickLink Probe System for fast, low-impact signal access
• 3 GHz bandwidth and 80 ps timing accuracy
• Command bus decoding for in-depth DDR/LPDDR memory debugging
• Minimal signal loading with 110 kΩ, 0.12 pF tip impedance
• Cost-effective QuickLink solder-in tips simplify multi-point testing
• Ideal for mixed-signal, high-speed, and memory interface debugging

Teledyne Test Tools LCR Meters offer precision testing in a compact form, perfect for R&D labs and production lines.

Key Features:

• 3.5” high-resolution color LCD display
• Test frequency up to 300 kHz with continuous output
• 0.05% basic measurement accuracy
• Spot or full frequency range with OPEN/SHORT correction
• Automatic Level Control (ALC) for consistent voltage on components like MLCCs
• Measure up to 4 parameters simultaneously
• DCR measurement & built-in ±2.5 V DC bias
• PASS/FAIL indicator and 10-bin sorting function
• List measurement for automated test sweeps (up to 10 points)
• Interfaces: RS-232C, USB, handler, and USB storage
• Compact 2U, 1/2 rack size for automated test setups

Teledyne Test Tools Milli Ohm Meter offers high-precision low-resistance measurement with advanced drive modes, temperature compensation, and fast sampling.

Key Features:

• 50,000-count high-resolution display
• 3.5″ TFT LCD (320×240)
• 0.05% measurement accuracy
• 1 Amp test current with 0.1 μΩ resolution
• Fast 60 readings per second
• Four-wire measurement method
• Temperature compensation and delayed measurement
• 20-panel memory settings
• Dry circuit testing (T3MIL50X only)
• USB, RS-232C, and EXT I/O interfaces
• Multiple drive modes: DC+, DC-, Pulsed, PWM (T3MIL50X)

Key Features

• Supports wafers up to 200 mm (optional 300 mm upgrade)
• Operates at cryogenic temperatures down to 10 K
• Semi-automated with optional full automation via autoloader
• Compatible with liquid nitrogen, liquid helium, or cryo-cooler
• Ice- and condensation-free probing for stable performance
• Up to eight probe positioners or probe card integration
• Solid vibration-isolated frame for precision measurements
• Velox software with intuitive alignment and automation

Key Features

• Entry-level manual wafer probing in vacuum < 1×10⁻⁴ mbar
• Supports wafers up to 150 mm or single dies
• Up to six probe positioners for flexible testing
• Optional thermal chuck from -60°C to +300°C
• Probing possible with open chamber lid at atmosphere
• Stable, vibration-isolated frame for precise results
• Ergonomic design with hinged topside lid for easy access
• Independent control of chuck stage and positioners
• Fast, manual step-and-repeat wafer testing

Cascade PM300 – 300 mm Analytical Probe Station

Key Features:

• Industry benchmark for manual wafer probing and failure analysis.
• Superior mechanical stability with granite base for precision and repeatability.
• High-precision probe positioning with independent X-Y coarse and fine adjustments.
• Configurable for DC, RF, mmW, WLR, FA, and 3D IC testing.
• Wide thermal range: -60°C to +200°C (PM300PS) / +15°C to +300°C (PM300).
• Optional electromagnetic shielding (PM300PS) for ultra-low-noise environments.
• Spacious, ergonomic design supporting up to 12 positioners.
• Upgradeable platform to support future testing needs.

T3AFG Series – Waveform Generators from Teledyne Test Tools combine precision, speed, and flexibility with advanced DDS technology for high-quality signal generation.

Key Features:

• Models available with 30 MHz to 500 MHz bandwidth
• Dual-channel output with 20 Vpp amplitude
• Max sampling rate up to 2.4 GSa/s
• 14-bit or 16-bit vertical resolution (model-dependent)
• 4.3″ responsive touchscreen display
• 196 built-in arbitrary waveforms
• Supports AM, FM, PM, PSK, FSK, ASK, PWM, Sweep, Burst, Harmonic
• USB Host, USB Device, LAN VXI-11 standard interfaces
• Optional IQ modulation support (on high-end models)
• True waveform combination and flexible phase/channel control

T3AWG3K Series – Waveform Generators deliver high-definition, multi-channel precision for engineers who demand signal quality, flexibility, and performance.

Key Features:

• Models available with 250 MHz or 350 MHz sinewave frequency
• 2, 4, and 8 analog channel configurations
• 16-bit vertical resolution for high signal fidelity
• Max sampling rate of 1.2 GS/s
• Output voltage window up to ±24 V (into High Impedance)
• 128 Mpts/channel memory (upgradeable to 1 Gpts/channel)
• True Arbitrary Mode and Direct Digital Synthesis (DDS)
• Add 8, 16, or 32 digital patterns synchronized with analog output
• Ideal for mixed-signal testing, high-voltage waveform generation, and multi-domain R&D

T3AWG6K Series – Waveform Generators combine precision, flexibility, and speed for advanced signal generation in R&D and automated test environments.

Key Features:

• Available in 2, 4, or 8 analog channel configurations
• Up to 12.32 GS/s sampling rate (RF mode)
• 16-bit vertical resolution for high signal fidelity
• 4 Gpts waveform memory per channel
• Up to 32 synchronous digital channels
• Built-in waveforms: sine, square, ramp, noise, gaussian, exponential, DC, and more
• Advanced modulations: AM, FM, PM, PWM, FSK, PSK
• Variable clock true-arbitrary technology up to 6.16 GS/s (12.32 GS/s in RF)
• Digital I/Q modulation with 16-bit components
• Multifunctional operation: waveform generator, pattern generator, modulator

T3DMM Series – Digital Multimeters deliver precision, speed, and display-rich features, ideal for professional labs, R&D, and production testing.

Key Features:

• Available in 4.5-digit (60,000 counts) and 6.5-digit (2,200,000 counts) models
• True RMS AC voltage and current measurement
• 4.3” TFT-LCD with 480×272 resolution
• Multiple display modes: Number, Histogram, Trend Chart, Bar Meter, Statistics
• Advanced math functions: Max, Min, Avg, Std Dev, dBm/dB, Relative, Pass/Fail
• Supports remote operation via USB, LAN, SCPI commands
• Built-in cold terminal thermocouple compensation
• Wide range of measurements: Voltage, Current, Resistance, Capacitance, Frequency, Period, Temperature
• Internal 1GB storage and USB host for external data access
• User-friendly softkey interface and built-in help system