HIOKI E E CORPORATION

The Hioki IM7583 Impedance Analyzer is a high-speed, reliable LCR measurement device ideal for testing electronic components in high-volume production environments. It combines precision, compact design, and flexible operation for a wide range of applications.

Key Features

• Test frequency range: 1 MHz to 600 MHz
• Fastest analog test speed: 0.5 milliseconds
• Basic accuracy: ±0.65% rdg.
• Half-rack body with palm-sized test head for flexible placement
• RF I-V method for accurate impedance measurement
• Contact check with DCR testing, Hi-Z reject, or waveform judgment
• Frequency sweeps, level sweeps, and time interval measurements in Analyzer Mode
• Comparator function for automated PASS/FAIL judgments

The Hioki IM7585 Impedance Analyzer is a high-speed, high-precision LCR and impedance measurement device designed for R&D and production environments. It delivers fast, accurate testing of electronic components from 1 MHz to 1.3 GHz.

Key Features

• Test frequency range: 1 MHz to 1.3 GHz
• Fastest test speed: 0.5 milliseconds (analog measurement)
• Exceptional stability with 0.07% measured value variability at 1 GHz
• Basic accuracy: ±0.65% rdg.
• Half-rack body with a palm-sized test head for flexible placement
• RF I-V method for precise impedance analysis
• Contact check with DCR testing, Hi-Z reject, or waveform judgment
• Frequency sweeps, level sweeps, and time interval measurements in Analyzer Mode
• Comparator function for PASS/FAIL judgments

The Hioki IM9201 SMD Test Fixture is a high frequency test fixture designed exclusively for the IM7580 series impedance analyzers. Supporting six common SMD package sizes, it enables stable, repeatable impedance measurements up to 3 GHz for advanced component evaluation in R&D and production environments.

Key Features

• Designed exclusively for Hioki IM7580 series impedance analyzers
• Supports impedance measurement up to 3 GHz
• Accommodates six SMD package sizes in one fixture
• Dual device guides allow fast and accurate component placement
• Optimized for high frequency stability and repeatability
• Ideal for RF components, ferrite beads, and chip inductors

A high-speed, high-precision LCR meter ideal for low-ESR and impedance testing in advanced electronic components like polymer capacitors, inductors, and piezoelectric elements.

Key Features:

• Continuous LCR/DCR/sweep measurements with one instrument
• Ultra-fast testing speeds: 1.5 ms (1 kHz), 0.5 ms (100 kHz)
• High accuracy: ±0.08% basic accuracy for Z parameter
• Ideal for low-ESR measurement of functional polymer capacitors
• Suitable for resonance testing of piezoelectric elements
• Accurate DCR and L-Q testing of inductors, coils, and transformers

The Hioki IM7580A is a compact, high-speed impedance analyzer for 1 MHz to 300 MHz testing, ideal for both production and R&D. It works seamlessly with the IM9201 SMD fixture for reliable component testing.

Key Features:

• 1 MHz to 300 MHz frequency range
• 0.5 ms test speed
• ±0.72% basic accuracy
• Compact half-rack size with palm-sized test head
• Reliable contact check functions
• Frequency, level, and time sweeps in Analyzer Mode
• RF I-V method for precise measurement

The Hioki IM7581 is a compact, high-speed impedance analyzer designed for accurate testing from 100 kHz to 300 MHz. It’s ideal for both production and development environments.

Key Features:

• 100 kHz to 300 MHz frequency range
• 0.5 ms fastest test speed
• ±0.72% basic accuracy
• Compact half-rack size, palm-sized test head
• Reliable contact check via DCR, Hi-Z reject, or waveform judgment
• Supports frequency, level, and time sweeps in Analyzer Mode
• Uses RF I-V method for precise measurement

The Hioki Impedance Analyzer IM7587 3 GHz provides precision, speed, and versatility for impedance measurements from 1 MHz to 3 GHz, ideal for both R&D and mass production applications in electronic component testing.

Key Features:

• Frequency range: 1 MHz to 3 GHz
• Test speed: 0.5 ms
• Measurement variability: 0.07%
• Basic accuracy: ±0.65% reading
• RF I-V measurement technique
• Compact half-rack design with palm-sized test head
• Robust contact check capabilities
• Analyzer mode: frequency and level sweeps, time interval measurements