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HIOKI E E CORPORATION

Established in 1935, HIOKI E E CORPORATION  has grown to become a world leader in providing consistent delivery of test and measuring instruments through advanced design, manufacturing, sales and services. By offering over 200 main products characterized by safety and quality while meeting an expansive range of applications, we aim to contribute to the efficiency and value of our customers’ work in research and development, production and electrical maintenance.

 

HIOKI is used for testing of electronic circuit boards and boards with embedded active and passive devices, development of transport-related equipment and monitoring to detect equipment malfunctions, testing of electronic components and evaluation of the quality of energy-saving equipment and power supplies and maintenance and inspection of electrical work and equipment.HIOKI E E CORPORATION Electrical measuring instruments, known as the “mother tools” of industry, play an essential role in research and development, manufacturing, maintenance, and service. It comprise four product groups: automatic test equipment, data recording equipment, electronic measuring instruments, and field measuring instruments used in a broad range of industries and fields, from maintenance and inspection of electrical work and equipment to testing of electronic components used in smart phones and computers and development of electric vehicles and solar power generation technologies.

 

HIOKI Power Quality Analyzers (PQA); Insulation Testing; Data Acquisition Recorders; Power Demand Meters; Data Loggers; AM Meters; Volt Meters; Clamp-On; Digital Multimeters; Meters; Testers; Field Use Measurement Instruments; Electronic Measurement Instruments; Recorders and Automatic Test Equipment.                           download (8)

General Catalog: Electrical Measuring Instruments 2018 (64.5MB)

Short Form Catalog

Catalog: Short Form Catalog (4.7MB)

Catalog: 2018 Field Measuring Instruments (43.5MB)

Hioki CLAMP METER Series Catalog

Hioki Clamp Meter Series Catalog


  • A high-speed, high-precision LCR meter ideal for low-ESR and impedance testing in advanced electronic components like polymer capacitors, inductors, and piezoelectric elements.

    Key Features:

    • Continuous LCR/DCR/sweep measurements with one instrument
    • Ultra-fast testing speeds: 1.5 ms (1 kHz), 0.5 ms (100 kHz)
    • High accuracy: ±0.08% basic accuracy for Z parameter
    • Ideal for low-ESR measurement of functional polymer capacitors
    • Suitable for resonance testing of piezoelectric elements
    • Accurate DCR and L-Q testing of inductors, coils, and transformers
  • The Hioki IM7580A is a compact, high-speed impedance analyzer for 1 MHz to 300 MHz testing, ideal for both production and R&D. It works seamlessly with the IM9201 SMD fixture for reliable component testing.

    Key Features:

    • 1 MHz to 300 MHz frequency range
    • 0.5 ms test speed
    • ±0.72% basic accuracy
    • Compact half-rack size with palm-sized test head
    • Reliable contact check functions
    • Frequency, level, and time sweeps in Analyzer Mode
    • RF I-V method for precise measurement
  • The Hioki IM7581 is a compact, high-speed impedance analyzer designed for accurate testing from 100 kHz to 300 MHz. It’s ideal for both production and development environments.

    Key Features:

    • 100 kHz to 300 MHz frequency range
    • 0.5 ms fastest test speed
    • ±0.72% basic accuracy
    • Compact half-rack size, palm-sized test head
    • Reliable contact check via DCR, Hi-Z reject, or waveform judgment
    • Supports frequency, level, and time sweeps in Analyzer Mode
    • Uses RF I-V method for precise measurement
  • The Hioki Impedance Analyzer IM7587 3 GHz provides precision, speed, and versatility for impedance measurements from 1 MHz to 3 GHz, ideal for both R&D and mass production applications in electronic component testing.

    Key Features:

    • Frequency range: 1 MHz to 3 GHz
    • Test speed: 0.5 ms
    • Measurement variability: 0.07%
    • Basic accuracy: ±0.65% reading
    • RF I-V measurement technique
    • Compact half-rack design with palm-sized test head
    • Robust contact check capabilities
    • Analyzer mode: frequency and level sweeps, time interval measurements