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A high-precision vacuum probe station engineered for advanced wafer and substrate testing up to 200 mm in demanding laboratory and industrial environments.

Key Features:

• Supports wafers and substrates up to 200 mm or single dies
• Up to eight positioners and probe card compatibility
• Optional thermal chuck (-60°C to 300°C) with pressure regulation
• Accessories available: black bodies and optical motion analysis tools
• Upgradeable to 300 mm wafer capability
• Built-in vibration isolation for precise, stable measurements
• Ideal for DC, RF, MEMS, and optoelectronic testing
• Ergonomic manual drives with front-loading capability
• High throughput with software-controlled chuck for fast step-and-repeat

Cascade Summit 200 mm Manual Probe System

Key Features:

• High-precision manual on-wafer device and process characterization.
• Wide thermal range from -60°C to +300°C.
• Moisture-free, light-tight, EMI-shielded test environment with MicroChamber®.
• PureLine™ and AttoGuard® technologies for low-noise performance.
• Configurable for DC, RF, mmW, WLR, and FA applications.
• Locking roll-out stage for safe wafer access.
• Ergonomic 3-axis manual stage with intuitive controls.
• Dedicated Velox software with Augmented Align for accurate RF probing.

Cascade SUMMIT200 Advanced 200 mm Probe Station

Key Features:

• High-accuracy electrical measurements for DC, RF, mmW, and THz applications.
• Up to 5X faster time to accurate data with automated wafer handling.
• Wide thermal range from -60°C to +300°C with IceShield™.
• PureLine™, AttoGuard®, and MicroChamber® technologies for ultra-low noise performance.
• Precision sub-micron positioning with advanced 4-axis stage and VueTrack PRO.
• Flexible platform for device characterization, FA, WLR, and design debug.
• Velox control software with modern UI, workflow guide, and automation tools.
• Ergonomic operation with quick manual wafer access and roll-out stage.

Cascade TESLA300 is a 300 mm semi- and fully-automated probe system for advanced on-wafer power device characterization, ensuring safe, precise, and high-power testing.

Key Features:

• On-wafer device testing up to 10,000 V DC / 600 A
• AttoGuard™ and FemtoGuard™ chuck technologies for low-leakage, high-accuracy measurements
• MicroVac™ chuck ensures thin wafer stability and minimal contact resistance
• TÜV-certified safety system with full enclosure and interlocks
• Wide thermal range: -60°C to +300°C with TopHat chamber
• Roll-out chuck and auxiliary mounts for flexible wafer handling
• Remote operation and full software integration with Velox and analyzers
• Material Handling Unit (MHU301) for automated wafer loading and barcode recognition

CDG 7000 Conducted Immunity Test System, 10 kHz – 400 MHz

Key Features:

• All-in-one IEC/EN 61000-4-6 immunity test system with RF signal generator, power amplifier, 3-channel RF voltmeter, and directional coupler.
• Frequency range from 10 kHz to 400 MHz with multiple amplifier versions (25 W, 75 W, 75 W/10k).
• Supports BCI tests (ISO 11452-4) and NAMUR standards.
• Advanced software HELIA 7 with EUT monitoring and automated reporting.
• Interfaces: USB, LAN, optional GPIB for flexible integration.
• Expandable with external amplifiers and configurable digital I/O.
• Compact, robust 19″ desktop housing with 3-year warranty.

Cascade CM300xi-SiPh Probe System – 300 mm Wafer and Die-Level Photonics Testing

Key Features:

• Integrated silicon photonics wafer and die-level probing solution.
• Autonomous SiPh Measurement Assistant for hands-free calibration.
• OptoVue™ technology for real-time, in-situ optical calibrations.
• Supports vertical, horizontal edge, and wafer-level edge coupling.
• Dark, shielded, frost-free environment with SiPh TopHat.
• Thermal capability from -40°C to +125°C.
• Exclusive SiPh-Tools and Photonics Controller Interface (PCI) software.
• Partnerships with Keysight and PI for precision instrumentation.
• Easy setup and automation with Velox and Velox Dash™ interface.

Cascade CM300xi-ULN Probe System – Ultra Low Noise 300 mm Wafer Prober

Key Features:

• Ultra-low noise measurements with patented PureLine™ 3 technology.
• Ideal for flicker noise (1/f), RTN, and phase noise testing of ultra-sensitive devices.
• Fully shielded MicroChamber™ for EMI/RFI protection and frost-free low-temperature operation.
• Plug-and-Go TestCell Power Management eliminating ground-loop noise.
• Autonomous 24/7 operation with optimized motorized probe positioners.
• Wide thermal range from -65°C to +300°C with fA/fF measurement precision.
• Integrated Velox software for simple, efficient automation.

The DAM 6.0-P Dual Antenna Mast is a high-precision, dual-antenna mast designed for accurate EMC measurements in magnetic absorption chambers.

Key Features:

• Adjustable height from 1.0 m to 6.0 m with electric stepper motor
• Pneumatic polarization change 0° to 90° in approx. 3 seconds
• Dual antenna support with max. load 20 kg (balanced)
• Rotating antenna bars to eliminate elevation errors
• Robust base: 0.95 m x 0.73 m
• Non-metallic construction (plastic and reinforced fiberglass)
• Remote control via LAN (TCP/IP) with FCU3.0 or NCD Controller
• Suitable for EMC testing labs, automotive, industrial, and telecom setups

Reliable digital transmission system for analog audio and video signals with multiple configuration options for EMC testing and monitoring.

Key Features:

• Transmits analog audio and video signals digitally over fiber optics
• Supports both unidirectional and bidirectional communication
• Available in multiple configurations: audio (stereo), video (NTSC/PAL), or combined
• Ideal for EMC testing, acoustic monitoring, and immunity test surveillance
• Integrated microphone and external input/output support in intercom models
• Suitable for automotive, military, aerospace, and RF industries
• Compliant with MIL-STD-461 standards

The DYN 8WD I-30t Dynamometer integrated into TT 16.0-30t Turntable is a high-capacity vehicle testing solution designed for EMC-compliant measurement and simulation.

Key Features:

• Load capacity: 30,000 kg with adjustable axle configuration
• Maximum dynamometer speed: 120 km/h
• Turntable diameter: 16.0 m, rotational speed 0.1–0.5 rpm
• Adjustable track width: 900 mm – 2700 mm
• Turntable height: 2800 mm, stainless steel cover plate
• Servo motor-driven turntable with bevel gear for smooth rotation
• Integrated emergency stop and safety switches
• Software-controlled with Maturo DynSoft, including cycle simulation, speed, torque, and force monitoring
• EMC compliant: emissions typically 10 dB under CISPR 12 and CISPR 25 limits
• Supports advanced vehicle test cycles, ABS/ESP testing, uphill/downhill simulation, and tractive force control

EMC03640A Low Noise Preamplifier – 30 MHz to 6 GHz

Key Features:

• Wide frequency range: 30 MHz to 6 GHz
• High gain: 40 dB minimum with ±2.5 dB flatness
• Low noise figure: ≤ 2.5 dB
• High EMI performance with excellent linearity
• Compensates for long cable loss in EMI measurements
• Improves system noise floor flatness
• Unconditionally stable with high dynamic range
• State-of-the-art technology for compliance testing
• Meets major EMI/EMC standards (ANSI, CISPR, MIL-STD)
• Compact and robust design with AC mains power input

The EMC051835SE is a high-performance preamplifier designed to deliver exceptional gain and EMI measurement accuracy across a wide frequency range.

Key Features:

• Wide frequency coverage: 500 MHz to 18 GHz
• 35 dB minimum gain with ±2.5 dB flatness
• Low noise figure of 3 dB for improved sensitivity
• High linearity LNA for EMI testing applications
• Enhances system noise floor flatness
• Compensates for long cable losses in EMI measurements
• Built-in AC input power with grounding detect circuit
• Durable, compact design with SMA female connectors
• Unconditionally stable performance

EMC1150 Low Noise Preamplifier (9 kHz – 1 GHz, 50 dB Gain)

Key Features:

• Wide frequency range: 9 kHz to 1 GHz
• High gain performance: 50 dB minimum
• Low noise figure: 1.8 dB typical, 2.5 dB max
• Excellent EMI measurement capability
• Improves system noise floor flatness
• High linearity and dynamic range
• Unconditionally stable operation
• Built-in AC input power with grounding detect circuit
• Compact, lightweight design (2.8 kg)
• Optional pulse/ESD protector available

EMC118A45SE Low Noise Preamplifier | 1–18 GHz, 45 dB Gain

Key Features:

• Wide 1–18 GHz frequency range for versatile EMI testing
• High 45 dB gain with flatness across the band
• Low noise figure (3.5–8 dB max) for improved sensitivity
• Compensates long cable loss for accurate EMI measurements
• Unconditionally stable with high linearity and dynamic range
• Built-in grounding detect circuit for reliable operation
• Compact design with 50-ohm SMA female connectors
• Available in multiple versions with mounting options

The EMC184040SE is a high-performance low noise preamplifier designed for EMI measurements across 18–40 GHz. With 40 dB gain and a 5 dB noise figure, it ensures reliable, stable, and accurate performance for demanding EMC testing environments.

Key Features:

• Wide frequency range: 18–40 GHz
• 40 dB minimum gain with ±4.5 dB flatness
• 5 dB noise figure for low-noise operation
• Compensates for long cable losses in EMI measurements
• High linearity and dynamic range for precise testing
• Unconditionally stable design
• Available in multiple mounting versions (bench, tube clamp, box clamp)

Key Features:

• Wide frequency range: 18–40 GHz
• 40 dB minimum gain with ±4.5 dB flatness
• 5 dB maximum noise figure for accurate EMI testing
• Compensates for long cable loss in EMI measurements
• Enhances system noise floor flatness
• High linearity LNA for EMI compliance applications
• High dynamic range and unconditionally stable
• Built-in AC input power supply with grounding detect circuit
• Rugged 2.92 mm female connectors for reliability
• Versions: Bench model and mast-mount with clamp & power supply