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  • Single-phase, 2U, industrial amplifier/battery simulator

    • Bench-sized
    • Powered from 120V/230VAC
    • Source and Sink (4 quadrant)
    • Rugged Design
    • 3-Year, No-Fault Warranty

    Key Performance Capabilities:

    • Drop outs and surges as fast as 1.2µs
    • Small signal response up to 1 MHz
    • 13.5 VDC at up to 28A
    • Field-selectable ±40V, 75V or 150V potential

     

  • The First Wide-Bandwidth, High-Power Digital Amplifiers

    • Max Continuous Output Current: 300A RMS
    • Surge Rating: 2X power at up to 400 VP or 750A
    • Apparent Power Rating: Up to 5X continuous power rating atup to 400 VP or 750A
    • Supply Voltage: Three-phase, 208V ±10%, 60A, 50/60 Hz; 400V ±10%, 15A version available.
    • Dimensions (HxWxD): 36.5 x 21.0 x 30.75 inches (92.7 x 53.3 x 78.1 cm)
    • Weight: Appx. 540 lbs. (244.9 kg)

     

  • The DCP-X probe is designed for engineers and scientists in device characterization, R&D, and testing, offering highly accurate and repeatable on-wafer electrical measurements (IV, CV, LFN). It uses MEMS technology to measure advanced devices (2, 3, 5 nm) on various pad materials, micro-bumps, and pads as small as 20 μm, reducing the need for retesting and cleaning while covering the full thermal range at lower testing costs. Compared to traditional probes, the DCP-X provides 1000x lower contact resistance, minimal skate, and over 500,000 contact cycles, ensuring precise measurements and longer probe life.

  • The EMI 64k software allows to embed the TDEMI systems in a fully automated test environment.

    • Full automation of EMI testing according to all commercial and military standards
    • Automated control of turntable, antenna and other equipment
    • Height and Angular Scan
    • Procedures according to standards as well as customized procedures
    • Reducing the cost for EMC and communication testing and certification by tailored packages

     

  • The measurement system for all emission measurments in the frequency range 1 Hz – 44 GHz.

    • Frequency Range  1 Hz – 30MHz, 1GHz, 3GHz, 6GHz, 9GHz, 18GHz, 26GHz, 40 GHz and 44GHz
    • 225 MHz Real-time Analysis Bandwidth
    • Weighted Real-time Spectrogram up to 44 GHz
    • CISPR Bandwidths 200 Hz, 9 kHz, 120 kHz, 1 MHz
    • MIL/DO Bandwidths 10 Hz, 100 Hz, 1 kHz, 10 kHz, 100 kHz, 1 MHz

     

  • The measurement system for all emission measurments in the frequency range 1 Hz – 44 GHz.

    • Full compliance EMI Reciever according to standard CISPR 16-1· 1, ANSI C63.2, MIL->461, and DO·160
    • Spectrum Analyzer
    • Integrated LOW Noise Ampllfier (lNAI)
    • Integrated Preselect1on
    • Tradttional and FFT·based Mode
    • Automatic Stepped Attenuator
    • Ultra Low Noise Floor
    • Excellent spurious Performance
    • Real-time Spectrum Analyzer optional
    • Vast IQ-Bandwidth

     

  • TDEMI Mobile+. The ultra mobile EMI receiver – Emission measurements everytime, everywhere. Fully stand-alone operable.

    • Frequency Ranges 10Hz – 1GHz, 3GHz, 6GHz or 7GHz
    • 16000x faster than conventional receivers
    • Super compact design and 12V supply
    • 225 MHz fully gapless real-time analysis bandwidth
    • Weighted Real-time Spectrogram

     

  • Ultra High Performance RT Spectrum Analyzer. Ultrafast EMI Measurements.

    • Frequency Range from 1 Hz up to 50 GHz
    • 225 MHz Real-time analysis bandwidth
    • 100 dB Dynamic Range
    • Ultrahigh performance preselection in all modes
    • Up to 510 MHz Real-time IQ-Analysis bandwidth
    • Ultra High Performance Spectrum Analyzer

     

     

    • Vector Network Analyzer (option up to 26.5GHz)
    • WinCal XE calibration software
    • Uses best measurement practices for optimized measurements
    • Known measurement accuracy traced back to independent standards
    • Supported by the measurement experts to make you successful
    • Best in class RF performance
    • Small benchtop footprint
    • Industry standard calibration techniques
    • Extended 2 Year warranty on FormFactor products for educational customers

     

  • Genius Education Kits Overview

     

    • Flexibility
      • Temperatures range from -60°C to +300°C
      • Surfaces are nickel or gold-plated
      • Hybrid chuck design – operation with and without cooling unit
      • Field-upgradeable: On-site cold upgrades for all main prober platforms
    • Highest Efficiency for Reduced Cost of Test
      • Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
      • Up to 15% faster transition times than other systems on the market
    • Low Thermal Resistance
      • Low Thermal Resistance Technology
      • MultiSense with multiple temperature sensors
      • Best temperature accuracy and uniformity
    • Superior Electrical Performance
      • Isolated from ground
      • Includes a jack for grounding and biasing
      • Highly planar chuck surface for consistant contact force and overtravel

     

  • PureLine 3 Technology

    First automated probe station to achieve -190dB spectral noise*

    Plug In and Go

    Integrated TestCell Power Management provides fully managed and filtered AC power to the entire system, prober and instruments

    Autonomous 24/7 Operation

    Up to 4x faster flicker noise thermal testing on 30 μm pads

    Reduce Setup Time and Costs
    Exclusive low noise site survey, and system verification services

     

    • Quick and easy probe tip navigation
    • Maximizes field-of-view
    • High magnification
    • Shadow-free view of the corresponding features
    • Automatically configure and optimize performance
    • cTUVus certified and CE
    • Compatible with TopHat for perfect shielding
    • 24/7 operating, Increased MTBF
    • Stops all system motion and warns of unobserved contact

     

  •  

    Contact Intelligence

    • Ease of use –  Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
    • Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
    • Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.

     

     

    • Highest accuracy with backlash-free positioning
    • Drift-free measurements over temperature and time*
    • Easy, and safe swapping between arms
    • Best signal integrity using optimized probe cabling systems
    • Full thermal capability*
    • Manual or progammable

     

    • Ease of use –  Less experienced operators can perform an RF calibration up to 330 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
    • Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
    • Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
    • Calibration Monitor and Re-calibration – System will continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.

     


Showing 1–16 of 78 results