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The DCP-X probe is designed for engineers and scientists in device characterization, R&D, and testing, offering highly accurate and repeatable on-wafer electrical measurements (IV, CV, LFN). It uses MEMS technology to measure advanced devices (2, 3, 5 nm) on various pad materials, micro-bumps, and pads as small as 20 μm, reducing the need for retesting and cleaning while covering the full thermal range at lower testing costs. Compared to traditional probes, the DCP-X provides 1000x lower contact resistance, minimal skate, and over 500,000 contact cycles, ensuring precise measurements and longer probe life.

The EMI 64k software allows to embed the TDEMI systems in a fully automated test environment.

• Full automation of EMI testing according to all commercial and military standards
• Automated control of turntable, antenna and other equipment
• Height and Angular Scan
• Procedures according to standards as well as customized procedures
• Reducing the cost for EMC and communication testing and certification by tailored packages

The measurement system for all emission measurments in the frequency range 1 Hz – 44 GHz.

• Frequency Range  1 Hz – 30MHz, 1GHz, 3GHz, 6GHz, 9GHz, 18GHz, 26GHz, 40 GHz and 44GHz
• 225 MHz Real-time Analysis Bandwidth
• Weighted Real-time Spectrogram up to 44 GHz
• CISPR Bandwidths 200 Hz, 9 kHz, 120 kHz, 1 MHz
• MIL/DO Bandwidths 10 Hz, 100 Hz, 1 kHz, 10 kHz, 100 kHz, 1 MHz

The measurement system for all emission measurments in the frequency range 1 Hz – 44 GHz.

• Full compliance EMI Reciever according to standard CISPR 16-1· 1, ANSI C63.2, MIL->461, and DO·160
• Spectrum Analyzer
• Integrated LOW Noise Ampllfier (lNAI)
• Integrated Preselect1on
• Tradttional and FFT·based Mode
• Automatic Stepped Attenuator
• Ultra Low Noise Floor
• Excellent spurious Performance
• Real-time Spectrum Analyzer optional
• Vast IQ-Bandwidth

TDEMI Mobile+. The ultra mobile EMI receiver – Emission measurements everytime, everywhere. Fully stand-alone operable.

• Frequency Ranges 10Hz – 1GHz, 3GHz, 6GHz or 7GHz
• 16000x faster than conventional receivers
• Super compact design and 12V supply
• 225 MHz fully gapless real-time analysis bandwidth
• Weighted Real-time Spectrogram

Ultra High Performance RT Spectrum Analyzer. Ultrafast EMI Measurements.

• Frequency Range from 1 Hz up to 50 GHz
• 225 MHz Real-time analysis bandwidth
• 100 dB Dynamic Range
• Ultrahigh performance preselection in all modes
• Up to 510 MHz Real-time IQ-Analysis bandwidth
• Ultra High Performance Spectrum Analyzer

• Vector Network Analyzer (option up to 26.5GHz)
• WinCal XE calibration software
• Uses best measurement practices for optimized measurements
• Known measurement accuracy traced back to independent standards
• Supported by the measurement experts to make you successful
• Best in class RF performance
• Small benchtop footprint
• Industry standard calibration techniques
• Extended 2 Year warranty on FormFactor products for educational customers

Genius Education Kits Overview

• Probe station
• Keysight Streamline Vector Network Analyzer (option up to 53 GHz)
• Choice of probes
• WinCal XE calibration software
• Extended 2 Year warranty on FormFactor products for educational customers
• Optional laptop

• Flexibility
  • Temperatures range from -60°C to +300°C
  • Surfaces are nickel or gold-plated
  • Hybrid chuck design – operation with and without cooling unit
  • Field-upgradeable: On-site cold upgrades for all main prober platforms
• Highest Efficiency for Reduced Cost of Test
  • Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
  • Up to 15% faster transition times than other systems on the market
• Low Thermal Resistance
  • Low Thermal Resistance Technology
  • MultiSense with multiple temperature sensors
  • Best temperature accuracy and uniformity
• Superior Electrical Performance
  • Isolated from ground
  • Includes a jack for grounding and biasing
  • Highly planar chuck surface for consistant contact force and overtravel

PureLine 3 Technology

First automated probe station to achieve -190dB spectral noise*

Plug In and Go

Integrated TestCell Power Management provides fully managed and filtered AC power to the entire system, prober and instruments

Autonomous 24/7 Operation

Up to 4x faster flicker noise thermal testing on 30 μm pads

Reduce Setup Time and Costs
Exclusive low noise site survey, and system verification services

• Quick and easy probe tip navigation
• Maximizes field-of-view
• High magnification
• Shadow-free view of the corresponding features
• Automatically configure and optimize performance
• cTUVus certified and CE
• Compatible with TopHat for perfect shielding
• 24/7 operating, Increased MTBF
• Stops all system motion and warns of unobserved contact

Contact Intelligence

• Ease of use –  Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
• Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
• Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.

• Highest accuracy with backlash-free positioning
• Drift-free measurements over temperature and time*
• Easy, and safe swapping between arms
• Best signal integrity using optimized probe cabling systems
• Full thermal capability*
• Manual or progammable

• Ease of use –  Less experienced operators can perform an RF calibration up to 330 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
• Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
• Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
• Calibration Monitor and Re-calibration – System will continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.

• Comprehensive,
• Turn-key Integrated Measurement System (IMS)
• with Keysight PNA for On-wafer R&D Measurements
• from RF to millimeter wave to Terahertz

Accurate and precise measurement of device parameters up to 3,000 V

• Coaxial and triaxial measurements up to 3,000 V
• High-quality construction with low-noise electrical performance
• Replaceable probe tips in a variety of tip sizes
• Temperature range of -55 to 300ºC
• Triaxial measurement ensures a much better understanding of device leakage in the off state
• Highly reliable, stable and repeatable measurements
• Integrally designed as part of a complete measurement solution