Hioki POWER METER PW3337
Description
Cascade PMC200 Cryogenic Probe Station for Advanced Research
The Cascade PMC200 Cryogenic Probe Station is a highly precise manual wafer probing solution designed for advanced laboratory and industrial environments. Supporting wafers and substrates up to 200 mm, it enables cryogenic testing in high vacuum environments down to 77 K with liquid nitrogen or below 7 K with liquid helium. This system delivers flexibility, stability, and ease of use for a wide range of applications, including DC, RF, MEMS, superconducting, and optoelectronic device characterization.
Flexibility for Advanced Testing
The PMC200 accommodates different substrate carriers for wafers up to 200 mm or single dies. With probe cards or up to eight positioners, it adapts to complex testing needs. Optional accessories, such as black bodies and optical motion analysis tools, expand its functionality, while future-proof options like microscope bridges and 300 mm wafer upgrades ensure long-term value.
Stability and Accuracy in Cryogenic Conditions
Engineered with an independently cooled cold shield, short probe arms, and a vibration-isolated frame, the PMC200 guarantees stability during sensitive measurements. Ice- and condensation-free probing ensures reliable results at both 77 K and < 7 K. Its superior vibration attenuation and stable imaging capabilities make it suitable for high-resolution microscopy.
Ergonomic Operation with High Throughput
Front-loading capability simplifies device exchange while intuitive manual drives provide easy, comfortable operation. The independent chuck and positioner control allow quick, manual step-and-repeat testing across an entire wafer. With simultaneous probe contact and separation, measurement throughput is significantly enhanced.
This combination of flexibility, precision, and ergonomic design positions the Cascade PMC200 Cryogenic Probe Station as an ideal choice for both cutting-edge research and demanding industrial testing.
Technical Highlights Table
| Specification | Details |
| Wafer Size Capacity | Up to 200 mm (upgradeable to 300 mm) |
| Operating Temperature | 77 K (LN2) to < 7 K (LHe) |
| Positioners | Up to 8, plus probe cards |
| Measurement Types | DC, RF, MEMS, OPTO, superconductors |
| Probe Environment | High vacuum with cryogenic cooling |
| Loading Method | Front-loading with load door |
| Cold Shield | Independently cooled for stability |
| Frame Design | Solid, vibration-isolated |
| Microscope Options | High-resolution with optional bridge |
| Accessories | Black bodies, optical motion tools |
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