Description
Cascade Summit Manual Probe System for 200 mm Wafers
The Cascade Summit 200 mm Manual Probe System is designed for precise on-wafer device and process characterization, offering researchers and engineers a robust, flexible, and accurate measurement platform. Its ability to support a wide thermal range from -60°C to +300°C ensures stable and repeatable measurements across diverse testing scenarios, from R&D to failure analysis.
Flexible and Future-Ready Probe Station
Engineered for versatility, the Cascade Summit can be reconfigured to support DC, RF, mmW, FA, WLR, and MEMS applications, providing an adaptable testing platform that grows with your evolving requirements. Its upgrade path ensures long-term value, making it suitable for both current projects and future innovations.
Advanced Shielding for Low-Noise Accuracy
Achieving reliable test results requires precise environmental control, and the Summit delivers with its MicroChamber® technology, which creates a moisture-free, light-tight, and EMI-shielded test environment. Integrated PureLine™ and AttoGuard® technologies minimize AC and spectral noise, making it an excellent solution for low-noise and 1/f measurements. The system’s shielding and stability significantly reduce settling times, ensuring efficient and accurate measurements over the full thermal range.
User-Friendly Design for Efficient Testing
The Cascade Summit emphasizes ease of use with its manual 3-axis stage, intuitive ergonomic controls, and locking roll-out stage for quick and safe wafer access. Users can rely on fast setup, simple navigation, and comfortable operation for long test cycles. The innovative microscope remote control further enhances precision when probing at sub-micron levels.
Enhanced Control with Velox Software
Dedicated Velox probe station software provides simplified operation and includes AugmentedAlign, an on-screen marker tool that improves RF measurement accuracy. This integration minimizes training needs while boosting efficiency and reliability in data collection.
With its combination of precision, shielding, flexibility, and user-friendly design, the Cascade Summit 200 mm Manual Probe System is the perfect platform for accurate and repeatable wafer-level testing across a broad range of applications.
Technical Specifications
| Feature | Details |
| Wafer Size | 200 mm |
| Measurement Applications | DC, RF, mmW, FA, WLR, MEMS, Reliability, IV/CV |
| Thermal Range | -60°C to +300°C |
| Shielding Technologies | MicroChamber®, PureLine™, AttoGuard® |
| Noise Performance | Optimized for low-noise and 1/f measurements |
| Stage | Manual 3-axis stage, ergonomic controls |
| Wafer Access | Locking roll-out stage for quick and safe handling |
| Imaging & Navigation | Innovative microscope remote control, easy wafer navigation |
| Control Software | Velox software with AugmentedAlign for RF accuracy |
| Environment | Moisture-free, light-tight, EMI-shielded |
