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Introducing the FormFactor Autonomous Silicon Photonics (SiPh)
FormFactor understands a test engineer‘s goal is to make measurements. An integrated, verified solution will prevent engineers from spending valuable time on long development projects. We have developed all the tools, fixtures and calibration techniques to enable you to measure your photonic devices in days instead of months or years.
FormFactor’s Autonomous Silicon Photonics Measurement Assistant is a highly flexible solution that enables quick changeover for a multitude of testing needs from single fibers to arrays and from vertical coupling to edge coupling.
Our Photonics Integration Kit and the revolutionary OptoVue Calibration Kit, will get you productionproven, optimized optical measurements right after installation.
Key Features
OptoVue
Revolutionary technology advancement for wafer and die-level photonics probing
Real-time in-situ calibrations
Singulated die testing
True die-level edge coupling
In-situ power measurements
Advanced calibration technologies
Enables autonomous measurements
Horizontal Die-Level Edge Coupling
Highest accuracy in test results
Lowest coupling loss
Repeatable measurement results due to exclusive automated fiber-to-facet alignment technology
Reduced risk of damaging fibers with collision avoidance technology
Ease of use for less experienced users
Enables close simulation of real-world conditions with device performance closest to the final application
Wafer-Level Edge Coupling
New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
Minimized coupling losses with minimal trench dimensions
Easy setup even for less experienced users
Repeatable measurement results due to unique fiber-to-facet gap alignment technology
Reduced risk of damaging fibers with collision avoidance technology
Vertical Coupling
Industry standard for vertical coupling to wafer-level grating couplers
Positioning hardware is precisely calibrated to the probe station and ready to perform die-to-die optical optimizations in minutes
Exclusive Pivot Point calibration determines the optimal point of minimal translation at the fiber/array tip
Search First Light feature enables automated determination of initial position for optimization
Other integrated features: Incident Angle Cal, Optical Rotation Scan, Optical Scan Data Analysis, Optical Tracking, Align Optical Probes
Key Benefits
When integrated with noise test equipment (flicker noise, RTN, phase noise) on the new CM300xi-ULN, the system offers the industry’s highest test throughput for ultra-low noise probing with low contact resistance on small pads down to 30µm. All capabilities are optimized to ensure ultra-low noise performance is not compromised.
Trust the Experts at ACA TMetrix Inc.
ACA TMetrix Inc. is a leading Canadian distributor of test and measurement instruments and design tools. For over 55 years we have provided products manufactured by the world’s leading instrument manufacturers. Leading Distributor of Design Tools and Test Equipment in Canada.
Specifications
Thermal Capability
Dark, shielded and frost-free
-40°C to +125°C
Only solution available that enables minimized air flow impact at cold temperatures to the fibers/fiber arrays for stable and repeatable measurement results
Exclusive ITO-coated TopHat window for easy setup
Enables hands-free autonomous calibration and re-calibration at multiple temperatures
Exclusive Automated Calibrations
Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
Step-by-step wafer to probe height training
CalVue utilizes uniquely designed retro-mirror technology to view all aspects of the fiber/array without external light and enables real-time in-situ automated calibrations
Further exclusive calibration functions: motor calibration, z-displacement calibration, theta calibrations, pzt calibration, planarity calibrations, automatic pivot point calibration
Proven Performance
Exclusive FormFactor-developed automated test methodology
Demonstrates full performance of the positioning solution calibrated to the probe station by measuring the coupled power repeatability
Verifies that the coupled power results across 900 measurements are within less than 0.3 dB
In between each measurement, all solution elements are moved including the wafer chuck, hexapod stages and piezo stages
Truly demonstrates the integrated performance and robustness of FormFactor’s Autonomous Silicon Photonics Measurement Assistant
Ease of use – Less experienced operators can perform an RF calibration up to 330 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
Calibration Monitor and Re-calibration – System will continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.
Ease of use – Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
