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FormFactor Cascade High Voltage Probe

FormFactor Cascade High Voltage Probe

Accurate and precise measurement of device parameters up to 3,000 V

  • Coaxial and triaxial measurements up to 3,000 V
  • High-quality construction with low-noise electrical performance
  • Replaceable probe tips in a variety of tip sizes
  • Temperature range of -55 to 300ºC
  • Triaxial measurement ensures a much better understanding of device leakage in the off state
  • Highly reliable, stable and repeatable measurements
  • Integrally designed as part of a complete measurement solution

 

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Description

High Voltage Probe Overview

FormFactor Cascade High Voltage Probe from FormFactor provide a complete on-wafer solution for over-temperature, low-contact resistance measurements of power semiconductors. Together with Tesla series on-wafer power device characterization system, FormFactor’s high-power probes achieve reliable and repeatable on-wafer measurements up to 300 A and 10,000 V

High Voltage Probe Key Features

  • Coaxial and triaxial measurements up to 3,000 V
  • High-quality construction with low-noise electrical performance
  • Replaceable probe tips in a variety of tip sizes
  • Temperature range of -55 to 300ºC
  • Triaxial measurement ensures a much better understanding of device leakage in the off state
  • Highly reliable, stable and repeatable measurements
  • Integrally designed as part of a complete measurement solution

 

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