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The DCP100 delivers the measurement accuracy needed for advanced on-wafer process, device characterization and reliability testing. With superior guarding and shielding, these probes overcome the performance limitations of non-coaxial needle probes. They are integrally designed as part of a complete measurement solution, these probes are highly reliable, stable and repeatable.
For full-triaxial current/voltage measurements using combined signal, guard and shield cables, the DCP-100 probe should be used with Cascade Microtech’s probing systems with MicroChamber®. The MicroChamber system provides full-EMI shielding around the wafer chuck and the probes, offering a fully-shielded, guarded, dark measurement environment. The triaxial connections from DC parametric semiconductor test instruments are then extended to the probe tip.
ACA TMetrix Inc. is a leading Canadian distributor of test and measurement instruments and design tools. For over 55 years we have provided products manufactured by the world’s leading instrument manufacturers. Leading Distributor of Design Tools and Test Equipment in Canada.
|Breakdown voltage||>500 V|
|Isolation resistance||>1 x 10E13 Ω|
|Frequency response (3 dB)||150 MHz|
|Temperature range||-65°C to 150°C|
|Characteristic impedance||50 Ω|
|Body material||Gold plated|