Discount Products: Look through products available for a 25% – 50% discount in 2020. The items provided on a first come, first serve basis.
View Discounted Products

FormFactor DCP 100 Series Probe

FormFactor DCP 100 Series Probe

Delivers superior guarding and shielding

  • High-quality construction with low-noise electrical performance
  • Kelvin version for convenient 4-point measurements
  • Replaceable coaxial probe tips, with choice of tip radii, and full electrical guard to the probe tip
  • SSMC 50 connectors
  • Ultra-low, fA and fF measurements from -65 º C to 150 º C

 

REQUEST A QUOTE
SKU: DCP 100 Category:



Introducing the FormFactor DCP 100 Series Probe

DCP 100 Series Probe Overview

The DCP100 delivers the measurement accuracy needed for advanced on-wafer process, device characterization and reliability testing. With superior guarding and shielding, these probes overcome the performance limitations of non-coaxial needle probes. They are integrally designed as part of a complete measurement solution, these probes are highly reliable, stable and repeatable.

Advantages

  • Ultra-low, fA and fF measurements from -65 º C to 150 º C
  • Full electrical guard to the probe tip
  • Integrally designed as part of Cascade’s complete measurement solution
  • Highly reliable, stable and repeatable

 

FormFactor DCP 100 Series Probe



FormFactor DCP 100 Series Probe

Key Features

DCP 100 Series Probe Key Features

  • High-quality construction with low-noise electrical performance
  • Kelvin version for convenient 4-point measurements
  • Replaceable coaxial probe tips, with choice of tip radii, and full electrical guard to the probe tip
  • SSMC 50 connectors
  • Ultra-low, fA and fF measurements from -65 º C to 150 º C

 



Key Benefits

For full-triaxial current/voltage measurements using combined signal, guard and shield cables, the DCP-100 probe should be used with Cascade Microtech’s probing systems with MicroChamber®. The MicroChamber system provides full-EMI shielding around the wafer chuck and the probes, offering a fully-shielded, guarded, dark measurement environment. The triaxial connections from DC parametric semiconductor test instruments are then extended to the probe tip.

 


FormFactor DCP 100 Series Probe


Trust the Experts at ACA TMetrix Inc.

ACA TMetrix Inc. is a leading Canadian distributor of test and measurement instruments and design tools. For over 55 years we have provided products manufactured by the world’s leading instrument manufacturers. Leading Distributor of Design Tools and Test Equipment in Canada.

Specifications

Breakdown voltage >500 V
Isolation resistance >1 x 10E13 Ω
Frequency response (3 dB) 150 MHz
Temperature range -65°C to 150°C
Characteristic impedance 50 Ω
Tip material Tungsten
Body material Gold plated
Connector type SSMC

 

Datasheet


Get in touch with us to inquire about our tailored consulting services.