FormFactor T-Wave Probe

Introducing the FormFactor T-Wave Probe

Industry-leading performance for on-wafer measurement of millimeter and submillimeter wavelength devices. The T-Wave Probes set the industry performance standard for characterization of mmWave devices. This probe delivers low insertion loss and low contact resistance when probing gold pads. Excellent tip visibility. Ability to characterize 1.1 THz devices. Typical Insertion loss < 1.5 dB between 140 GHz and 220 GHz. Integrated DC bias-T with low-profile GPPO connector.

Key Features

T-Wave Probe Key Features

• Low insertion loss
• Low contact resistance
• 140 GHz – 1.1 THz versions
• Probe pitch as narrow as 25 μm
• Lithographically-defined probe tip
• Nickel contacts

Key Benefits

• Excellent tip visibility
• Ability to characterize 1.1 THz devices
• Typical Insertion loss < 1.5 dB between 140 and 220 GHz
• Integrated DC bias-T with low-profile GPPO connector

Specifications

Autonomous RF Measurement Assistant

FormFactor’s Autonomous RF Measurement Assistant is the only solution in the market that enables true automatic, hands-free calibration and measurement of RF devices at multiple temperatures.

The 220, 260, and 330 GHz waveguide probes come in two different models. The “T” body style is compatible with FormFactor’s Summit 11000/12000, S300 and Elite300 probe stations. The “S” body style is compatible with FormFactor’s 150 mm probe stations. All models are available without bias-T by request.