Products

The Hioki 3153 HiTESTER is an all-in-one solution for insulation resistance and AC/DC voltage withstand testing. It is fully programmable for automated multi-point testing, making it ideal for industrial, manufacturing, and electrical safety applications.

Key Features

• Programmable insulation testing from 50 V to 1200 V DC
• Dielectric strength testing for AC/DC voltages up to 5 kV
• Store and program up to 32 test files with 50 steps each
• Optional scanner for automatic multi-point testing
• Accurate voltage generation via PWM method, independent of supply voltage
• Ramp timer function for controlled voltage rise/fall during testing
• Digital display of measured voltage, current, and resistance
• Compact design with full remote operation capability

The Hioki 3930 High Voltage Scanner is a passive auxiliary device designed to streamline multi-point high-voltage testing when paired with the Hioki 3153 or a sequencer. Its isolated channels allow safe and efficient AC/DC voltage testing while minimizing connection changes, making it ideal for industrial testing and quality control applications.

Key Features

• Supports AC/DC high-voltage output up to 5 kV
• Multi-point testing: 8 channels per unit, up to 32 channels with 4 connected units
• Fully isolated HV I/O, control lines, and power supply
• Operates in multi-mode or single-mode scanning for flexible testing
• Compatible with Hioki 3153 program function or standard sequencer
• Fast operation with <6 ms response and recovery time
• Includes HV test leads, control connector cable, and grounding cable

The Hioki BT5525 Tester is engineered for battery production lines to detect microscopic insulation defects and contamination before shipment. It ensures safety, reduces false negatives, and accelerates high-speed testing, making it ideal for modern battery manufacturing.

Key Features

• Proprietary BDD function detects minuscule internal short-circuits caused by contamination
• Stable insulation resistance testing even in noisy environments
• Contact check function prevents erroneous judgments
• Maximum test voltage of 500 V for battery cell, module, and pack testing
• High-speed charging up to 50 mA and discharging up to 40 mA for faster testing
• Compact design allows integration into battery production systems
• Cost-effective solution for small to large battery cells and packs
• PC application for waveform review and CSV data export

The Hioki IR5050 High Voltage Insulation Tester delivers precise and reliable insulation resistance testing up to 5 kV and 10 TΩ. Designed for professionals, it offers advanced diagnostics, wireless connectivity, and rugged durability — making it ideal for industrial maintenance and electrical testing.

Key Features:

• Measures insulation resistance up to 10 TΩ
• Test voltages from 250 V to 5000 V DC
• Calculates and displays PI, DAR, and DD diagnostics automatically
• Supports both wireless (Bluetooth) and USB data transfer
• Compact, lightweight design with IP65-rated carrying case
• Step and ramp voltage testing for advanced insulation analysis
• CAT IV and CAT III safety ratings for enhanced protection
• Compatible with GENNECT Cross app for real-time reporting

Key Features:

• Safely measure solar PV insulation resistance while generating power
• CAT III 2000 V and CAT IV 1000 V safety rating for reliable high-voltage testing
• 5 kV test voltage and 10 TΩ insulation resistance range
• Specialized PV insulation measurement mode compliant with IEC 62446-1
• Automatically calculates and displays PI, DAR, and DD diagnostics
• Flexible voltage adjustment from 250 V to 5000 V
• Data memory with wireless and USB connectivity options
• Compact, lightweight design with IP65-rated carrying case for durability

Key Features:

• Fastest insulation tester in the industry with results in as little as 50 ms
• Wide test voltage range: 25 V to 1000 V with 1 V resolution
• Quick residual voltage discharge for faster takt times
• Contact check function prevents false readings from poor connections
• Short-circuit check detects micro-shorts before testing
• Built-in LAN and RS-232C for system integration
• Compact, lightweight design ideal for battery and production line testing
• Models available: ST5520 (I/O output) and ST5520-01 (BCD output)

Experience precision RF signal analysis on the go with this lightweight, handheld analyzer designed for both lab and field use.

Key Features:

• Frequency range: 1MHz to 1.3GHz (PSA1303) or 2.7GHz (PSA2703)
• RBW: 300Hz to 10MHz
• -115dBm typical noise floor
• Dual markers with absolute/difference values
• AM/FM demodulation in zero span
• Auto-find & smart marker peak tracking
• USB for waveform saving and PC connection
• Live, View, and Reference trace modes
• 6-hour lithium-ion battery operation
• Weighs just 0.58 kg
• Optional U01 Upgrade: Limit lines, data logging, triggering, compensation tables

High-performance, battery-powered spectrum analyzers ideal for RF engineers and field use.

Key Features:

• Frequency range: 10MHz to 3.6GHz or 6.0GHz
• -120dBm typical noise floor
• Resolution bandwidths from 300Hz to 10MHz
• AM/FM audio demodulation with zero span
• Live, View & Reference traces with markers
• Smart marker tracking with peak detection
• USB data logging & real-time PC view
• Compact, lightweight (0.56 kg) with >3hr battery
• Optional U02 features: limit lines, OBW, ACPR, AM/FM waveform demodulation

Key Features:

• PXI/cPCI JTAG controller for seamless integration into PXI-based test systems
• Supports up to 4 JTAG chains on a Unit Under Test (UUT)
• Configurable I/O pin-out for maximum flexibility across projects
• Fully compatible with other XJLink2 controllers
• TCK clock speeds up to 166 MHz
• Programmable voltage domains from 1.1 V to 3.3 V in 0.1 V steps
• Built-in voltage meter and frequency counter on all I/O pins
• Adjustable signal termination with auto-skew control
• Includes LabVIEW™ Virtual Instruments (VIs) for easy integration
• Self-contained licence for use on multiple PXI racks or servers

The Teledyne T3SA Series Spectrum Analyzers deliver high-performance signal analysis from 9 kHz to 3.2 GHz in a compact, easy-to-use design. Ideal for R&D, education, production, and pre-compliance testing, it features a large touchscreen and advanced digital IF technology.

Key Features:

• All Digital IF technology10.1”
• WVGA (1024 x 600) touchscreen display
• Frequency range from 9 kHz to 3.2 GHz
• -161 dBm/Hz displayed average noise level (typical)
• -98 dBc/Hz @ 10 kHz offset phase noise (typical)
• Total amplitude accuracy < 0.7 dB
• 1 Hz minimum resolution bandwidth (RBW)
• Built-in preamplifier for improved sensitivity

Typical Applications

● Research Laboratory
● Development Laboratory
● Repair and Maintenance
● Calibration Laboratory
● Automatic Production Test
● General bench-top use

Key Features:

• Portable USB-C to JTAG controller with 40 I/O pins
• Supports up to 8 separate JTAG TAP chains with independent frequencies
• Compact and rugged aluminium casing for lab, production, or field use
• Configurable JTAG pin-out to suit any Unit Under Test (UUT)
• Electrical protection against –30 V to +30 V input
• Four programmable I/O voltages (1.2 V to 3.3 V, in 0.1 V steps)
• Built-in voltmeter and frequency counter on all pins
• High-speed operation with TCK up to 166 MHz
• USB bus-powered with locking Type-C connector
• Self-contained licence for maximum flexibility

Key Features:

• Compact USB JTAG controller for flexible board testing
• Supports up to 4 JTAG chains per UUT
• Lightweight, portable, and ideal for lab, production, or field use
• Configurable pin-out for easy adaptation to any PCB design
• High-speed TCK clock up to 166 MHz
• Two programmable voltages from 1.1 V to 3.3 V in 0.1 V steps
• Built-in voltmeter and frequency counter on all I/O pins
• +5 V tolerant signals with auto-skew control
• USB bus-powered, no external PSU needed
• Self-contained licence, usable on multiple PCs

Key Features

• Approved by Keysight Technologies for i3070 ICT integration
• Fully compatible with all XJTAG projects
• High-speed programming with TCK up to 166 MHz
• Supports up to 4 JTAG chain connections to UUT
• Configurable interface voltages (1.1 V to 3.3 V)
• Adjustable signal slew rate and drive strength
• Automatic signal skew control for maximum reliability
• Frequency counter on all I/O pins (up to 200 MHz input)
• Fits into one i3070 utility card slot (multiple units supported)
• Enables test + programming in a single stage to boost throughput
• Supports additional protocols including I²C, SPI, and vendor-specific interfaces
• Flexible software licensing options for stand-alone or network operation

Key Features:

• 4-port JTAG tester for simultaneous testing of up to 4 boards
• High-speed USB 2.0 interface with robust performance
• Supports up to 4 TAP chains per UUT
• Configurable JTAG pin-out for simplified connectivity
• Parallel or independent testing on each port
• Programmable voltages from 1.1 V to 3.3 V in 0.1 V steps
• Built-in voltmeter and frequency counter on all I/O pins
• Automatic signal skew control for reliable operation
• Self-contained licence for use across multiple PCs
• Ideal for production lines and PCB manufacturers

3-Range, 250 to 1000V Analog Insulation Tester with Continuity Check