Products

The Hioki 3506-10 C Meter is a high-speed dual-band capacitance meter designed specifically for ceramic capacitor testing on automated production lines. Built for seamless integration with taping machines and sorting systems, it delivers fast, stable, and repeatable measurements even in demanding manufacturing environments.

Key Features

• Dual measurement frequencies of 1 kHz and 1 MHz
• Ultra-fast analog test time of 0.6 ms at 1 MHz
• Stable low-capacitance measurement for MLCC production
• Enhanced noise resistance for reliable inline testing
• BIN function for efficient component screening
• Designed for integration with taping machines and sorters
• Excellent repeatability for high-volume manufacturing

The Hioki 3153 HiTESTER is an all-in-one solution for insulation resistance and AC/DC voltage withstand testing. It is fully programmable for automated multi-point testing, making it ideal for industrial, manufacturing, and electrical safety applications.

Key Features

• Programmable insulation testing from 50 V to 1200 V DC
• Dielectric strength testing for AC/DC voltages up to 5 kV
• Store and program up to 32 test files with 50 steps each
• Optional scanner for automatic multi-point testing
• Accurate voltage generation via PWM method, independent of supply voltage
• Ramp timer function for controlled voltage rise/fall during testing
• Digital display of measured voltage, current, and resistance
• Compact design with full remote operation capability

The Hioki 3930 High Voltage Scanner is a passive auxiliary device designed to streamline multi-point high-voltage testing when paired with the Hioki 3153 or a sequencer. Its isolated channels allow safe and efficient AC/DC voltage testing while minimizing connection changes, making it ideal for industrial testing and quality control applications.

Key Features

• Supports AC/DC high-voltage output up to 5 kV
• Multi-point testing: 8 channels per unit, up to 32 channels with 4 connected units
• Fully isolated HV I/O, control lines, and power supply
• Operates in multi-mode or single-mode scanning for flexible testing
• Compatible with Hioki 3153 program function or standard sequencer
• Fast operation with <6 ms response and recovery time
• Includes HV test leads, control connector cable, and grounding cable

The Hioki BT5525 Tester is engineered for battery production lines to detect microscopic insulation defects and contamination before shipment. It ensures safety, reduces false negatives, and accelerates high-speed testing, making it ideal for modern battery manufacturing.

Key Features

• Proprietary BDD function detects minuscule internal short-circuits caused by contamination
• Stable insulation resistance testing even in noisy environments
• Contact check function prevents erroneous judgments
• Maximum test voltage of 500 V for battery cell, module, and pack testing
• High-speed charging up to 50 mA and discharging up to 40 mA for faster testing
• Compact design allows integration into battery production systems
• Cost-effective solution for small to large battery cells and packs
• PC application for waveform review and CSV data export

Key Features:

• Fastest insulation tester in the industry with results in as little as 50 ms
• Wide test voltage range: 25 V to 1000 V with 1 V resolution
• Quick residual voltage discharge for faster takt times
• Contact check function prevents false readings from poor connections
• Short-circuit check detects micro-shorts before testing
• Built-in LAN and RS-232C for system integration
• Compact, lightweight design ideal for battery and production line testing
• Models available: ST5520 (I/O output) and ST5520-01 (BCD output)

The Hioki IM7583 Impedance Analyzer is a high-speed, reliable LCR measurement device ideal for testing electronic components in high-volume production environments. It combines precision, compact design, and flexible operation for a wide range of applications.

Key Features

• Test frequency range: 1 MHz to 600 MHz
• Fastest analog test speed: 0.5 milliseconds
• Basic accuracy: ±0.65% rdg.
• Half-rack body with palm-sized test head for flexible placement
• RF I-V method for accurate impedance measurement
• Contact check with DCR testing, Hi-Z reject, or waveform judgment
• Frequency sweeps, level sweeps, and time interval measurements in Analyzer Mode
• Comparator function for automated PASS/FAIL judgments

The Hioki IM7585 Impedance Analyzer is a high-speed, high-precision LCR and impedance measurement device designed for R&D and production environments. It delivers fast, accurate testing of electronic components from 1 MHz to 1.3 GHz.

Key Features

• Test frequency range: 1 MHz to 1.3 GHz
• Fastest test speed: 0.5 milliseconds (analog measurement)
• Exceptional stability with 0.07% measured value variability at 1 GHz
• Basic accuracy: ±0.65% rdg.
• Half-rack body with a palm-sized test head for flexible placement
• RF I-V method for precise impedance analysis
• Contact check with DCR testing, Hi-Z reject, or waveform judgment
• Frequency sweeps, level sweeps, and time interval measurements in Analyzer Mode
• Comparator function for PASS/FAIL judgments

The Hioki IM9201 SMD Test Fixture is a high frequency test fixture designed exclusively for the IM7580 series impedance analyzers. Supporting six common SMD package sizes, it enables stable, repeatable impedance measurements up to 3 GHz for advanced component evaluation in R&D and production environments.

Key Features

• Designed exclusively for Hioki IM7580 series impedance analyzers
• Supports impedance measurement up to 3 GHz
• Accommodates six SMD package sizes in one fixture
• Dual device guides allow fast and accurate component placement
• Optimized for high frequency stability and repeatability
• Ideal for RF components, ferrite beads, and chip inductors

A high-speed, high-precision LCR meter ideal for low-ESR and impedance testing in advanced electronic components like polymer capacitors, inductors, and piezoelectric elements.

Key Features:

• Continuous LCR/DCR/sweep measurements with one instrument
• Ultra-fast testing speeds: 1.5 ms (1 kHz), 0.5 ms (100 kHz)
• High accuracy: ±0.08% basic accuracy for Z parameter
• Ideal for low-ESR measurement of functional polymer capacitors
• Suitable for resonance testing of piezoelectric elements
• Accurate DCR and L-Q testing of inductors, coils, and transformers

The Hioki IM7580A is a compact, high-speed impedance analyzer for 1 MHz to 300 MHz testing, ideal for both production and R&D. It works seamlessly with the IM9201 SMD fixture for reliable component testing.

Key Features:

• 1 MHz to 300 MHz frequency range
• 0.5 ms test speed
• ±0.72% basic accuracy
• Compact half-rack size with palm-sized test head
• Reliable contact check functions
• Frequency, level, and time sweeps in Analyzer Mode
• RF I-V method for precise measurement

The Hioki IM7581 is a compact, high-speed impedance analyzer designed for accurate testing from 100 kHz to 300 MHz. It’s ideal for both production and development environments.

Key Features:

• 100 kHz to 300 MHz frequency range
• 0.5 ms fastest test speed
• ±0.72% basic accuracy
• Compact half-rack size, palm-sized test head
• Reliable contact check via DCR, Hi-Z reject, or waveform judgment
• Supports frequency, level, and time sweeps in Analyzer Mode
• Uses RF I-V method for precise measurement

The Hioki Impedance Analyzer IM7587 3 GHz provides precision, speed, and versatility for impedance measurements from 1 MHz to 3 GHz, ideal for both R&D and mass production applications in electronic component testing.

Key Features:

• Frequency range: 1 MHz to 3 GHz
• Test speed: 0.5 ms
• Measurement variability: 0.07%
• Basic accuracy: ±0.65% reading
• RF I-V measurement technique
• Compact half-rack design with palm-sized test head
• Robust contact check capabilities
• Analyzer mode: frequency and level sweeps, time interval measurements