Products

100 mm manual cryogenic probe system

• Specially designed for laboratory environments
• Different substrate carriers for wafers up to 100 mm or single dies
• Probe positioners placed inside vacuum chamber
• Excellent measurement accuracy and repeatability
• Simple microscope operation
• Comfortable and easy operation
• Fast, manual step-and-repeat testing of the whole wafer
• Simultaneous contacting and separation of all probes

Multi-Configurable Optical Probe for Photonic Device Characterization

• Flexibility and ease of use
  • Field-replaceable fibers optimized for a variety of applications
  • Wafer mapping capability and visual display of key parameters
• Accuracy
  • Patented contact protection design ensures fast, accurate, and repeatable measurements at the wafer and substrate level
  • Minimized electrical parasitics for at-speed testing
• Compatibility
  • Standard FC type fiber-optic connector
  • Compatible with FormFactor probe stations and accessories

Custom configured for your application

• Choice of Series resistance or Termination (signal line to ground)
• Use of High Performance RF Resistors
• Choice of Resistor values available
• Choice of body styles, Infinity, ACP or FPC

Wafer-level electrical measurement of mmW devices and materials up to 1.1 THz

• Low insertion loss
• Low contact resistance
• 140 GHz – 1.1 THz versions
• Probe pitch as narrow as 25 μm
• Lithographically-defined probe tip
• Nickel contacts

• Supports up to 12 VNA ports than can be mapped to four logical ports for calibration
• Extensive guidance, wizards and management features automate calibration setup, measurement, result data conversion and report creation
• LRRM-SOLT, multi-line TRL and second-tier calibration methods enable precision and simple multi-port calibrations
• Automatic load inductance compensation function ensures the most repeatable calibrations
• Easy to use Probe to ISS/CSR matching tool
• Additional remoting methods
• Interface with Velox™ over LAN

• Easily create tasks
• Obtain fast results
• Adapts to the user’s needs and skills level
• Reduces working time
• Saves money!
• Designed to operate with maximum intelligence
• Automates workflows
• Enables autonomous measurements

Robust RF Test on PCB and Ceramic

• Replace costly and inflexible test fixtures with easy-to-use probe tips
• Long lifetime – typically over 1,000,000 contacts
• GS/SG footprint up to 4 GHz and GSG up to 20 GHz
• High-power RF test: up to 30 Watts
• Test at temperatures from -60°C to 200°C

High power, High performance probe

• High power – 66 W at 2.4 GHz and 43 W at 5 GHz
• Extremely low insertion loss of ≤ 0.4 dB (typical) up to 40 GHz
• Excellent contact control and low contact resistance
• High performance on any pad material (Al or Au)
• Longest lifetime – typically one million (1,000,000) touchdowns

Excellent Performance – Longest Lifetime

• Best price per contact – typically over one million (1,000,000) touchdowns
• RF/Microwave signal is shielded and completely air isolated in the probe body
• Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
• Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
• Probe on any pad material with minimal damage

• Highest accuracy in test results
• Easy setup even for less experienced users
• Minimized coupling losses with minimal trench dimensions
• Exclusive FormFactor-developed automated test methodology
• Wide range of tools for capturing, logging and interpreting data
• Enables hands-free autonomous calibration and re-calibration at multiple temperatures
• Search First Light feature enables automated determination of initial position for optimization
• Once aligned, all calibration functions are automated and performed through SiPh-Tool

• Super high precision, ±0.05% amplitude accuracy, ±0.2° phase accuracy
• Wide-bandwidth DC to 500kHz excellent frequency characteristics
• Applications in the fields of electric and hybrid electric vehicles
• Wide operating temperature range(-30 ℃ to 85 ℃) fit for automobile applications
• deal for evaluation of solar power generation and fuel cells to measure battery charge and discharge and the secondary side of inverters
• For observing waveforms to be used with the oscilloscopes or Memory HiCorders (use with SENSOR UNIT)

• Online Battery Testing – Diagnose batteries while in operation without system shutdown.
• Rapid Results – Get resistance and voltage readings in as fast as 2 seconds.
• Intelligent Diagnostics – Auto-assesses battery status: PASS, WARNING, or FAIL.
• Noise-Resistant Design – Proprietary technology ensures stable readings, even near UPS inverters.
• Wireless Integration – Transfer and organize data on your mobile device using GENNECT Cross.
• Measurement Navigator – Screen and audio guidance helps streamline testing workflows.
• Large Data Capacity – Save up to 6,000 measurement records linked to customizable site profiles.
• Ergonomic Design – Improved grip and field durability with a new protective cover.

Easy Pole Clamp-On Ground Resistance Tester with Super Slim Jaw

• Earth resistance measurement for multi-grounded systems
•  Measure leak current with absolute certainty with highly sensitive 0.01 mA resolution (at 20.00 mA range)
• Measure load current up to 60.0 A range
• Clamp at the narrowest point

• Cord is insulated
• BNC connectors at both ends,
• 1.6 m (5.25 ft) length

Simple Circuit Analysis & Detailed Acceptance/Rejection Decision-Making Firmware Upgrade for the IM3570

• Automatically select the equivalent circuit model from the five typical models to minimize the differences between the measured values and the ideal frequency characteristics derived from the analysis results
• Determine acceptance/rejection for the L, C, and R elements comprising a part and the resonance sharpness (mechanical quality coefficient)
• Make detailed decisions on the elements using the resonance of a piezoelectric element or inductor

• LCR measurement, DCR measurement, sweep measurement, continuous measurement and high-speed testing achieved with one instrument
• High-speed testing, achieving maximum speeds of 1.5ms (1 kHz) and 0.5ms (100kHz) in LCR mode
• High-accuracy measurements, basic accuracy of Z parameter: ± 0.08%
• Perfect impedance analyzer for testing the resonance characteristics of piezoelectric elements, C-D and low ESR measurement of functional polymer capacitors, DCR and L-Q measurement of inductors (coils and transformers)
• Perform frequency sweeps, level sweeps, and time interval measurements in analyzer mode