Products

Enabling single-contact high-current/high-voltage test

• Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
• Even distribution of high current with innovative multi-fingertip design
• Compatible with Tesla 200/300 mm power device characterization system
• Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
• Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
• Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)

• provides precision bi-polar output currents
• minimal zero-cross over distortion
• 19” rack mounted 6U x 220 mm crate
• crate has 17 slots; 16 (slot 0 thru 15)
• connectors
  • J1 (ExtIntlk),
  • J2 (CrateOK),
  • J3 (Input Reference Voltages),
  • J4 (Output Monitors), and
  • J9 (Bitbus)