Products

The BAT EMC software suite by NEXIO is an advanced electromagnetic compatibility testing platform designed to automate, control, and streamline EMC testing workflows. Built for laboratories, automotive engineers, and compliance specialists, it enables accurate emission and immunity testing with powerful configuration and reporting tools.

Key Features

• Automated EMC emission and immunity testing workflows
• Supports conducted and radiated emission and immunity tests
• Configurable test parameters including RBW, detectors, scan time, and limits
• Automotive-focused testing aligned with CISPR25 standards
• BAT-ELEC module for transient, burst, and surge testing automation
• Real time monitoring tools including voltmeters, analyzers, and cameras
• Centralized project management for EMC test data and resources
• Multi brand compatibility for test generators and measurement equipment
• Automatic compliance report generation for regulatory requirements
• Designed for aerospace, automotive, healthcare, and industrial labs

The BAT metrology software suite by NEXIO is a precision-driven measurement solution designed to support EMC laboratories and engineering teams in analyzing, calibrating, and validating electrical and RF test systems. It enhances accuracy, ensures compliance, and simplifies complex measurement workflows across multiple testing environments.

Key Features

• Comprehensive metrology platform for EMC and RF measurement systems
• Supports VNA based testing for RSIL, RCD, and cable validation
• Oscilloscope based analysis for ESD guns and signal generators
• Amplifier calibration to maintain consistent performance standards
• BAT-NSA and SVSWR testing for anechoic chamber and OATS environments
• Ensures accurate signal measurement and system validation
• Improves compliance, reliability, and measurement consistency
• Suitable for EMC laboratories, research centers, and industrial testing
• Reduces calibration errors and improves test repeatability
• Supports modern metrology workflows for complex RF systems

The BAT-SCAN near field system is an advanced robotic EMC measurement solution designed to analyze and visualize electromagnetic behavior in electronic components and circuits. Developed by NEXIO, it enables precise near-field scanning to identify EMC issues early in the design stage, improving product reliability and reducing development costs.

Key Features

• Robotic near-field scanning system for EMC analysis
• High precision measurement accuracy up to 0.1 mm
• Measurement volume of 500 x 500 x 400 mm
• High speed scanning up to 1 m/s
• Integrated 4K high resolution camera for visual analysis
• Lightweight system design at 11.2 kg
• Automated EMC failure detection and localization
• Compatible with multiple robotic scanning platforms
• Supports PCB, IC, shielding, and enclosure analysis
• Reduces qualification test cycles and debugging time

CAPITOLE RCS software is an advanced radar signature prediction tool developed by NEXIO for calculating Radar Cross Section (RCS) with high precision. It enables defense engineers and research organizations to analyze, simulate, and optimize the radar visibility of complex systems such as aircraft, ships, and military equipment.

Key Features

• Dedicated radar cross section (RCS) simulation platform
• High accuracy radar signature prediction for defense systems
• Advanced solvers for small and large complex structures
• Supports millions of unknowns for large scale simulations
• Digital twin based modeling for pre prototype evaluation
• Parametric studies for optimizing radar stealth performance
• Reduces physical prototyping and testing costs
• Clean and user friendly interface for RCS analysis
• Suitable for aircraft, naval, and defense system design
• Helps improve detection and stealth performance analysis

CAPITOLE RF software by NEXIO is an advanced radio frequency simulation and antenna design tool that enables engineers to predict, analyze, and optimize RF performance during the early design phase. It helps reduce development time, minimize prototyping costs, and improve overall system efficiency through accurate digital simulation.

Key Features

• Advanced RF and antenna design simulation platform
• High precision electromagnetic propagation modeling
• Creation of realistic digital twin system models
• Parametric study support for performance optimization
• Reduces prototype iterations and development costs
• Validates antenna performance before physical testing
• Optimized for telecommunications, radar, and radiolocation applications
• Supports PCB antenna design and material selection analysis
• High performance solver technology for accurate results
• Helps ensure compliance with RF design specifications

Cascade Autonomous DC delivers fully automated DC wafer probing with unmatched precision and efficiency powered by Contact Intelligence™.

Key Features:

• Autonomous DC wafer probing with hands-free 24/7 operation
• Contact Intelligence™ technology for dynamic probe correction and reliable pad placement
• High throughput with up to 4x faster flicker noise thermal testing on pads as small as 30 µm
• Unattended operation for overnight or weekend testing without user intervention
• Automatic probe alignment compensating for thermal drift to reduce soak time
• Flexible probe layouts supporting single DUT and multi-DUT configurations
• Ease of use – start testing with just one button, ideal for operators at all levels

Cascade Autonomous RF delivers fully automated RF and mm-wave wafer probing with Contact Intelligence™ for unmatched accuracy and efficiency.

Key Features:

• Autonomous RF wafer probing with hands-free 24/7 operation
• Contact Intelligence™ for on-the-fly probe correction and pad placement
• Automatic calibration up to 500 GHz with WinCal XE software
• Calibration drift monitoring with auto re-calibration when needed
• Reduced soak time through dynamic probe re-alignment across temperatures
• Unattended operation for continuous overnight and weekend testing
• Supports 200 mm and 300 mm probe stations including CM300xi, SUMMIT200, Summit 12000, and Elite 300
• Simplified one-button operation, suitable for operators at all levels

Cascade Autonomous Silicon Photonics delivers fully automated wafer and die-level photonics probing with Contact Intelligence™ for unmatched accuracy.

Key Features:

• Flexible vertical and edge coupling with single fibers or fiber arrays
• OptoVue™ technology for real-time in-situ calibrations
• Exclusive TopHat environment for dark, frost-free thermal testing (-40°C to +125°C)
• Sub-micron placement accuracy with Z displacement sensing
• Collision avoidance technology for safe fiber alignment
• SiPh-Tools software for automated alignment, calibration, and data management
• Partnership with Keysight and PI for seamless instrumentation and precision positioning
• Available on CM300xi-SiPh and SUMMIT200 probe stations

Cascade CM300xi – 300 mm Semi-/Fully-Automated Probe System

Key Features:

• Supports DC, AC, RF/microwave, WLR, FA, and design debug applications
• Wide thermal range from -60°C to +300°C with IceShield or TopHat compatibility
• Reliable, repeatable probe contact in a moisture-free, EMI-shielded environment
• Contact Intelligence™ technology for autonomous alignment and accurate measurements
• Modular design with upgrade paths for semi- or fully-automated configurations
• Handles up to 50 wafers with SEMI-standard cassette automation
• Fast transition times with MicroVac™ and FemtoGuard™ low-noise technologies
• Intuitive Velox software and Velox Dash™ touchscreen interface for simplified operation

Engineered for precision and safety, the EPS150TESLA delivers accurate on-wafer power device characterization up to 3,000 V and 100 A, making it a trusted choice for high-voltage and high-current testing.

Key Features:

• On-wafer power device characterization up to 3,000 V (triaxial) / 10,000 V (optional coaxial).
• High-current probing up to 100 A with ultra-low contact resistance.
• Triax chuck design for accurate low-leakage measurements.
• Shielded test environment with advanced grounding and arcing protection.
• Seamless integration with analyzers via SIGMA kit and optimized signal path.
• Safe probe tip exchange and thin-wafer handling capability.

Cascade EPS200MMW mmW and THz Probe System

Key Features:

• Complete mmW, THz, and load-pull measurement solution.
• Accurate probing up to 500 GHz with T-Wave Probes and VDI Extenders.
• SlimVue Microscope with 1 μm resolution and quick lens exchange.
• Resolves pads smaller than 50 μm with precision optics.
• Sigma Application Kits for broadband, load-pull, coax RF, and waveguide setups.
• Rock-solid mechanical design with submicron stage accuracy.
• Motorized positioner with ±1 μm separation repeatability.
• Stable and repeatable probe placement for THz frequencies.

Cascade EPS200RF 200 mm Manual Probe System

Key Features:

• Complete RF measurement package up to 67 GHz.
• Based on the PM8 platform for stability and flexibility.
• Supports Infinity, ACP, and |Z| probe technologies for different material types.
• High precision probing with RF chuck ±3 μm planarity.
• 500 μm platen stroke with ≤±1 μm accuracy for repeatable contact.
• Reliable probing for pads as small as 25 µm x 35 µm.
• Includes matching cables, substrates, and WinCal XE calibration software.
• Delivers accurate S-parameter measurements with automated calibration.

Key Features:

• 150 mm modular probe station with customizable base and starter kits.
• Flexible options for IV/CV, RF, mmWave, THz, high power, and failure analysis.
• Solid frame with built-in vibration isolation for measurement stability.
• Supports advanced microscopes, triax, coax, and RF chucks.
• Seamless integration with leading measurement instruments.
• Ergonomic design with quick pull-out stage for fast device handling.
• Re-configurable and upgradable to grow with future testing needs.

Cascade MPS150-SiPh Manual Silicon Photonics Probe Station

Key Features:

• Cost-effective entry-level photonics probe station.
• Supports surface coupling and horizontal edge coupling.
• Retro-mirror technology for precise fiber alignment.
• Tip-tilt base positioner with 6 degrees of freedom.
• Compatible with single fibers and fiber arrays.
• Optional eVue digital imaging or SlimVue high-performance microscope.
• Modular, upgradable design with platen extensions.
• Ergonomic and intuitive for users of all experience levels.

Cascade PAV200 – 200 mm Semi-Automated Vacuum Probe System

Key Features:

• Supports wafers and substrates up to 200 mm (optional upgrade to 300 mm)
• Operates in high vacuum down to < 1×10⁻⁴ mbar
• Semi-automated control with joystick and software-driven chuck movement
• Up to eight probe positioners and/or probe card integration
• Optional thermal chuck with -60°C to 300°C range
• Solid frame with vibration isolation for stable, accurate measurements
• Wide application support: DC, RF, MEMS, and optoelectronics
• Velox software for wafer alignment, mapping, and simplified automation

The Cascade PLC50 is a precise, cost-effective cryogenic wafer probing system designed for research labs. It enables testing down to 77 K with liquid nitrogen or below 7 K with liquid helium, supporting DC, RF, MEMS, and optoelectronic measurements.

Key Features:

• Compatible with wafers up to 100 mm and single dies.
• Operates at 77 K (LN₂) or < 7 K (LHe).
• Up to six positioners for flexible probing.
• Independently cooled cold shield ensures stable, accurate results.
• Ice- and condensation-free probing in vacuum conditions.
• Ergonomic design with hinged lid and easy microscope access.
• Independent chuck stage and positioner control for high throughput.