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  • Cascade SUMMIT200 Advanced 200 mm Probe Station

    Key Features:

    • High-accuracy electrical measurements for DC, RF, mmW, and THz applications.
    • Up to 5X faster time to accurate data with automated wafer handling.
    • Wide thermal range from -60°C to +300°C with IceShield™.
    • PureLine™, AttoGuard®, and MicroChamber® technologies for ultra-low noise performance.
    • Precision sub-micron positioning with advanced 4-axis stage and VueTrack PRO.
    • Flexible platform for device characterization, FA, WLR, and design debug.
    • Velox control software with modern UI, workflow guide, and automation tools.
    • Ergonomic operation with quick manual wafer access and roll-out stage.

     

  • Cascade TESLA300 is a 300 mm semi- and fully-automated probe system for advanced on-wafer power device characterization, ensuring safe, precise, and high-power testing.

    Key Features:

    • On-wafer device testing up to 10,000 V DC / 600 A
    • AttoGuard™ and FemtoGuard™ chuck technologies for low-leakage, high-accuracy measurements
    • MicroVac™ chuck ensures thin wafer stability and minimal contact resistance
    • TÜV-certified safety system with full enclosure and interlocks
    • Wide thermal range: -60°C to +300°C with TopHat chamber
    • Roll-out chuck and auxiliary mounts for flexible wafer handling
    • Remote operation and full software integration with Velox and analyzers
    • Material Handling Unit (MHU301) for automated wafer loading and barcode recognition

     

  • Cascade CM300xi-SiPh Probe System – 300 mm Wafer and Die-Level Photonics Testing

    Key Features:

    • Integrated silicon photonics wafer and die-level probing solution.
    • Autonomous SiPh Measurement Assistant for hands-free calibration.
    • OptoVue™ technology for real-time, in-situ optical calibrations.
    • Supports vertical, horizontal edge, and wafer-level edge coupling.
    • Dark, shielded, frost-free environment with SiPh TopHat.
    • Thermal capability from -40°C to +125°C.
    • Exclusive SiPh-Tools and Photonics Controller Interface (PCI) software.
    • Partnerships with Keysight and PI for precision instrumentation.
    • Easy setup and automation with Velox and Velox Dash™ interface.

     

  • Cascade CM300xi-ULN Probe System – Ultra Low Noise 300 mm Wafer Prober

    Key Features:

    • Ultra-low noise measurements with patented PureLine™ 3 technology.
    • Ideal for flicker noise (1/f), RTN, and phase noise testing of ultra-sensitive devices.
    • Fully shielded MicroChamber™ for EMI/RFI protection and frost-free low-temperature operation.
    • Plug-and-Go TestCell Power Management eliminating ground-loop noise.
    • Autonomous 24/7 operation with optimized motorized probe positioners.
    • Wide thermal range from -65°C to +300°C with fA/fF measurement precision.
    • Integrated Velox software for simple, efficient automation.

     

  • A compact and flexible semi-automated wafer probe system designed for RF/DC modeling, device characterization, and advanced measurement needs.

    Key Features:

    • Mechanical platen lift for safer RF set-ups and reduced operator errors
    • Fully compatible with Autonomous RF/DC measurement assistants and Velox Dash™ app
    • Reconfigurable platen inserts (TopHat, PCH, IceShield) for versatile test configurations
    • Spacious platen design supporting RF and DC setups with ease
    • Compact footprint with field-upgradable components
    • Integrated Low-Volume MicroChamber and FemtoGuard thermal triaxial chuck

     

  • Key Features

    • Supports wafers up to 200 mm (optional 300 mm upgrade)
    • Operates at cryogenic temperatures down to 10 K
    • Semi-automated with optional full automation via autoloader
    • Compatible with liquid nitrogen, liquid helium, or cryo-cooler
    • Ice- and condensation-free probing for stable performance
    • Up to eight probe positioners or probe card integration
    • Solid vibration-isolated frame for precision measurements
    • Velox software with intuitive alignment and automation

     

  • Key Features

    • Entry-level manual wafer probing in vacuum < 1×10⁻⁴ mbar
    • Supports wafers up to 150 mm or single dies
    • Up to six probe positioners for flexible testing
    • Optional thermal chuck from -60°C to +300°C
    • Probing possible with open chamber lid at atmosphere
    • Stable, vibration-isolated frame for precise results
    • Ergonomic design with hinged topside lid for easy access
    • Independent control of chuck stage and positioners
    • Fast, manual step-and-repeat wafer testing

     

  • Cascade PM300 – 300 mm Analytical Probe Station

    Key Features:

    • Industry benchmark for manual wafer probing and failure analysis.
    • Superior mechanical stability with granite base for precision and repeatability.
    • High-precision probe positioning with independent X-Y coarse and fine adjustments.
    • Configurable for DC, RF, mmW, WLR, FA, and 3D IC testing.
    • Wide thermal range: -60°C to +200°C (PM300PS) / +15°C to +300°C (PM300).
    • Optional electromagnetic shielding (PM300PS) for ultra-low-noise environments.
    • Spacious, ergonomic design supporting up to 12 positioners.
    • Upgradeable platform to support future testing needs.

     

  • Cascade TESLA300 – Advanced On-Wafer Power Device Characterization

    Key Features:

    • High-voltage and high-current testing up to 10 kV / 600 A.
    • Integrated AttoGuard™ and FemtoGuard™ technology for ultra-low leakage and capacitance.
    • MicroVac™ chuck surface for thin wafer handling and low contact resistance.
    • TÜV-certified safety system with interlocks and full enclosure.
    • Top-lift wafer loading eliminates lift pins for accurate vertical device measurements.
    • Full thermal range from -60°C to +300°C with efficient transition times.
    • Seamless integration with Keysight and Keithley analyzers.
    • Remote operation capability for safe offsite control.
    • Velox and Velox Dash™ software for intuitive automation.

     

    • Versatile Current Sensing: Accurately measure small and large currents, from sub-milliamp levels to thousands of amps.
    • High-Speed Pulse Monitoring: Patented distributed termination technology enables ultra-fast rise time measurement (as short as 2ns).
    • Enhanced Noise Immunity & Safety: Double shielding minimizes external noise, making these monitors ideal for high-voltage applications.
    • Robust Construction: Sealed models are suitable for high-voltage insulating oil or vacuum environments.
    • Broad Compatibility: Works with oscilloscopes, spectrum analyzers, power analyzers, digital voltmeters, ADCs, and more.

     

  • High-Precision Current Measurement with BNC Connectivity

    • Precision Current Sensing: ±1% accuracy ensures reliable real-time current monitoring.
    • BNC Connector for Seamless Connectivity: Works with oscilloscopes, ADCs, spectrum analyzers, and power analyzers.
    • Clamp-On Design for Non-Intrusive Measurement: Safely monitor live current flow without circuit disruption.
    • 50 Ohm Termination Compatible: Output reduces by half when using a 50Ω termination.
    • High-Voltage Safety Considerations: Conductive case requires adequate insulation for user safety.

     

  • High-Precision Current Sensing with BNC Connectivity

    • High-Precision Measurement: ±1% accuracy for reliable current sensing.
    • Customizable Configurations: Designed to meet specific user requirements for precision measurement.
    • BNC Connector for Easy Integration: Works with oscilloscopes, ADCs, spectrum analyzers, and power analyzers.
    • Non-Insulated Conductive Case: Proper insulation must be provided on the monitored conductor.
    • 50 Ohm Termination Compatibility: Using a 50Ω termination reduces the output to half.

     

  • High-Precision Voltage Measurement Up to 500kV

    • High-Voltage Measurement Capability: Supports up to 500kV in insulating oil and customizable calibration for air use.
    • Precision Division Ratios: Models with 5000:1, 10,000:1, and custom ratios, ensuring reliable voltage scaling.
    • Temperature-Compensated Accuracy: ±1% over 20°C to 80°C, providing stable voltage readings.
    • Robust Design for Harsh Environments: Sealed for high-voltage insulating oil use, with custom air calibration available.
    • Safe Operation with Ground Loop Control: The outer conductor is isolated from the case, allowing controlled grounding connections.

     

  • Precision Pulse Output Up to 500kV

    • Wide Voltage Range: Supports 100kV to 500kV pulse outputs for high-energy applications.
    • Fast Pulse Transmission: Pulse durations from 0.25 to 50 microseconds, ensuring efficient energy transfer.
    • Insulating Oil Immersion: Open-construction design for operation in high-voltage insulating oil, reducing breakdown risks.
    • Advanced Overvoltage Protection: Designed with built-in safety factors (50-100%) to prevent damage from overvoltages.
    • Reliable Flashover Protection: Corona ring-to-core insulation prevents damage from accidental flashovers.

     

  • The EMI 64k software allows to embed the TDEMI systems in a fully automated test environment.

    • Full automation of EMI testing according to all commercial and military standards
    • Automated control of turntable, antenna and other equipment
    • Height and Angular Scan
    • Procedures according to standards as well as customized procedures
    • Reducing the cost for EMC and communication testing and certification by tailored packages

     

  • The measurement system for all emission measurments in the frequency range 1 Hz – 44 GHz.

    • Frequency Range  1 Hz – 30MHz, 1GHz, 3GHz, 6GHz, 9GHz, 18GHz, 26GHz, 40 GHz and 44GHz
    • 225 MHz Real-time Analysis Bandwidth
    • Weighted Real-time Spectrogram up to 44 GHz
    • CISPR Bandwidths 200 Hz, 9 kHz, 120 kHz, 1 MHz
    • MIL/DO Bandwidths 10 Hz, 100 Hz, 1 kHz, 10 kHz, 100 kHz, 1 MHz