HIOKI E E CORPORATION

Wide Range 30 mΩ to 3 MΩ DC Resistance Meters with Temperature Correction for High Speed Testing on Production Lines

Wide Range 10 mΩ to 1000 MΩ DC Resistance Meters with Multiplexer Option for High-speed Multi-point Testing

Compact, dual-band 120Hz/1kHz LCR Meter for Integration into Automated Production Lines

Dual-band 120Hz/1kHz Capacitance Meter for High Speed Inspection of Multi-Layer Ceramic Capacitors (MLCC) on Taping Machines

Dual-band 1kHz/1MHz Capacitance Meter for High Speed Testing of Ceramic Capacitors on Production Lines

Wide band 1mHz to 200kHz LCR Meter for R&D Applications to Windings, Coil and Transformer Manufacturing

Wide band 40Hz to 200kHz LCR Meter for High Speed Automated Testing on Production Lines

The New Standard for General-Purpose LCR Meters with Measurement Frequency from DC, 4Hz to 8MHz

DC, 4Hz to 8MHz measurement frequency

• High-speed measurement of 1ms (fastest time)

• High-precision measurement of ±0.05% rdg. (representative value)

• Guaranteed accuracy range from 1 mΩ, low-impedance measurement with unmatched repeatability

• DC bias function: Measure under conditions simulating actual use or in accordance with industry standards

• Exceptional specifications and cost-performance for a wide range of applications, from R&D to production lines

Wide band 4Hz to 5Mz Impedance Analyzer for High Speed Testing and Frequency Sweeping of Piezoelectric Elements, Functional Polymer Capacitors, Coils and Transformers

Firmware Upgrade for the IM3570 Impedance Analyzer to Enable Cole-Cole Plots, Simple Circuit Analysis and Detailed Acceptance/Rejection Decisions

Wide band 1mHz to 200kHz Chemical Impedance Analyzer for Testing Electrochemical Components and Materials, Batteries, and EDLC

1MHz to 600MHz Measurement Frequency and 0.5ms Test Speed

1MHz to 1.3GHz Measurement Frequency, 0.5ms Test Speed, and 0.07% Variability

100kHz to 300MHz Measurement Frequency Impedance Analyzer with 0.5ms Test Speed

1MHz to 300MHz Measurement Frequency Impedance Analyzer with 0.5ms Test Speed and Superior Repeatability