June 3, 2021 (US/EU) | 9:00am PDT/ 6:00pm CEST
June 3 and 4, 2021 (US/ASIA) | 5:00pm PDT/ 9:00am China
New generations of 5G devices can have dozens of RF channels operating at high frequency, creating a need for a greater on wafer test volume. In engineering, more device tests are needed to support the expanded speed bands, increasing the workload to complete testing. How can test engineers manage the load? What if the probers could operate unattended — start a test and measure during a whole shift, overnight, or even over the weekend? There is a real, hands-free solution that provides fast, accurate measurements with high throughput — leading to more accurate design models and faster time to market.
Learn how an autonomous wafer probe system with integrated components from Keysight and FormFactor can:
- Automatically perform wafer and die soaks to get the probes quickly to consistent operating temperature
- Quickly and automatically clean probes and then calibrate at mmw frequencies without user input
- Adjust automatically to multiple probe-to-probe spacings for different device geometries in a single test run
- Monitor calibration drift and recalibrate on the fly when necessary
- Work seamlessly for full temperature range -60 to 175C operation using N5291A Solution, from Keysight technologies, providing single sweep operation of 900 Hz to 130 GHz, and beyond this using Virginia diodes Waveguide mini modules and waveguide probes
