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    • Current measurement from insulated probing of conductor
    • Suitable for observation and measurement of current in PCB tracks, component leads and ground planes
    • Wide dynamic range of 10mA to 20A peak to peak
    • Wide bandwidth of DC to 5MHz
    • Low noise figure equivalent to <6mA rms at full B/W
    • Safety rated to 300V Cat II (600V Cat 1)
    • Suitable for connection to any oscilloscope
    • High accuracy general purpose H-field probe
    • Converts to ‘closed magnetic circuit’ current probe

     

  • The Hioki MR6000 Memory HiCorder sets a new benchmark in waveform recording, combining cutting-edge technology, intuitive design, and world-class performance. Built from the ground up, it’s engineered to tackle both current and future measurement challenges with ease and precision.

    Key Features:

    • Large, intuitive touch panel for efficient and user-friendly operation
    • Simultaneous multi-channel isolation measurement at up to 200 MS/s (with High Speed Analog Unit U8976)
    • Significantly faster data saving for a seamless experience
    • Real-time data saving without interrupting ongoing measurements
  • The Hioki Rack-mounted Multi-channel System Recorder (MR8741/MR8740) is a powerful, high-speed, single-device solution for waveform recording and generation. Ideal for test systems, it offers high-resolution, isolated multi-channel measurements with fast sampling capabilities.

    Key Features:

    • Integrated waveform recording and generation in one device
    • Equipped with DVM Unit MR8990 for high-accuracy 24-bit resolution measurements
    • Supports up to 16 channels (MR8741) for multi-channel testing
    • Isolated input between channels and from input to chassis (up to 300 V AC/DC)
    • High-speed sampling up to 20 MS/s
    • Compact rack-mountable design (4U height, under 180 mm depth)
    • Monitor display and setting access via DVI-D and mouse
    • Enables remote measurement and control via LAN
    • Browser-based screen monitoring or advanced control via Hioki 9333 LAN Communicator
  • The Hioki Memory Recorder is a high-speed, fully-isolated data acquisition system designed for precise and simultaneous measurement of multiple analog and logic signals. Ideal for testing, simulation, and system diagnostics, it combines waveform generation and recording in one powerful unit.

    Key Features:

    • Generate and record waveforms using a single device
    • Simulate issues by outputting previously recorded problematic waveforms to test devices
    • Supports 32 analog + 32 logic channels, expandable to 28 analog + 64 logic channels
    • High-speed sampling up to 20 MS/s with fully isolated inputs
    • Ensures safe measurement with complete analog input isolation
    • Equipped with a large-capacity 512M-word memory
    • Simultaneously measures high voltage and ultra-low voltage system signals

     

  • The DCP-X probe is designed for engineers and scientists in device characterization, R&D, and testing, offering highly accurate and repeatable on-wafer electrical measurements (IV, CV, LFN). It uses MEMS technology to measure advanced devices (2, 3, 5 nm) on various pad materials, micro-bumps, and pads as small as 20 μm, reducing the need for retesting and cleaning while covering the full thermal range at lower testing costs. Compared to traditional probes, the DCP-X provides 1000x lower contact resistance, minimal skate, and over 500,000 contact cycles, ensuring precise measurements and longer probe life.

  • Max. 108 Analog Channels, Reduce Inspection Data Transfer Time to Zero

    Key Features of HiCORDER MR8740T – High-Speed Data Acquisition:

    • Ideal for multipoint inspection of high performance boards such as ECU
    • 108ch analog to 96ch analog + 48ch logic input
    • Reduce time required to save to external media to max.1/100 compared with conventional method
    • 20 MS/s simultaneous sampling on all channels
    • Safe measurement with all analog inputs isolated
    • Supports 4K monitor to display multi-channel waveforms without overlapping
    • Measure 4 channels with 1 unit (4 ch analog Unit U8975, 4 ch DVM Unit U8991)
    • Generate constant voltage, constant current, and simulated resistance (VIR Generator Unit U8794)

     

  • High-speed 20 MS/s (*1), 32-channel, Fully Isolated Memory Recorder for On-site Jobs and R&D

    Key Features:

    • Supports a wide variety of measurements with a total of 17 plug-in modules
    • Generate and record with a single unit
    • Direct 1000 V high voltage input testing
    • High-speed sampling up to 20MS/s (*1) with fully isolated inputs
    • 32 analog channels + 16 logic ch to 20 analog channels + 64 logic ch
    • High-speed sampling with waveform judgement function
    • Soil-resistant construction strong against adverse working environments
    • Big buttons coated to withstand industrial oil and residue
    • Drop-in paper loading and one-touch setup, along with high-speed 50mm/s printing

     

    • High speed sampling of 5 MS/s ensures catching high speed phenomena
    • Isolated 4 channel input
    • Max. rated voltage to ground: 300 V AC or DC (CAT II)
    • High resolution measurement with 16 bit A/D
    • For Memory HiCorder MR6000 and MR8740T

     

  • The TESLA300 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables the collection of accurate high-voltage and high-current measurement data up to 3 kV (triaxial) / 10 kV (coaxial) and 200 A (standard) / 600 A (high current), with complete operator safety.

    • Vector Network Analyzer (option up to 26.5GHz)
    • WinCal XE calibration software
    • Uses best measurement practices for optimized measurements
    • Known measurement accuracy traced back to independent standards
    • Supported by the measurement experts to make you successful
    • Best in class RF performance
    • Small benchtop footprint
    • Industry standard calibration techniques
    • Extended 2 Year warranty on FormFactor products for educational customers

     

    • Re-configurable for DC, RF, mmW, FA, WLR and more
    • table and repeatable measurements over a wide thermal range
    • Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
    • Minimize AC and spectral noise
    • Manual 3-axis stage with ergonomic controls
    • Fast, accurate “hands on” wafer positioning
    • Quick, safe, and comfortable wafer access

     

    • Comfortable and ergonomic operation
    • Thermal range ambient to +300°C
    • RF/microwave device characterization, FA and design debug
    • Seamless integration between Velox and analyzers/measurement software
    • Complete solutions using probe positioners and probe cards
    • Achieve unsurpassed RF/mmW measurement and calibration accuracy with integrated RF tools and WinCal
    • Shortest signal path test integration for accurate, thermally stable, and low-error data collection
    • Powerful automation tools, reduce total test time on wafers, singulated dies, and modules
    • Faster time to first data for standard and “hard to test” devices such as thin wafer, small pad and high power
    • Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact

     

  • Genius Education Kits Overview

     

    • Flexibility
      • Temperatures range from -60°C to +300°C
      • Surfaces are nickel or gold-plated
      • Hybrid chuck design – operation with and without cooling unit
      • Field-upgradeable: On-site cold upgrades for all main prober platforms
    • Highest Efficiency for Reduced Cost of Test
      • Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
      • Up to 15% faster transition times than other systems on the market
    • Low Thermal Resistance
      • Low Thermal Resistance Technology
      • MultiSense with multiple temperature sensors
      • Best temperature accuracy and uniformity
    • Superior Electrical Performance
      • Isolated from ground
      • Includes a jack for grounding and biasing
      • Highly planar chuck surface for consistant contact force and overtravel

     

  • PureLine 3 Technology

    First automated probe station to achieve -190dB spectral noise*

    Plug In and Go

    Integrated TestCell Power Management provides fully managed and filtered AC power to the entire system, prober and instruments

    Autonomous 24/7 Operation

    Up to 4x faster flicker noise thermal testing on 30 μm pads

    Reduce Setup Time and Costs
    Exclusive low noise site survey, and system verification services

     

    • Quick and easy probe tip navigation
    • Maximizes field-of-view
    • High magnification
    • Shadow-free view of the corresponding features
    • Automatically configure and optimize performance
    • cTUVus certified and CE
    • Compatible with TopHat for perfect shielding
    • 24/7 operating, Increased MTBF
    • Stops all system motion and warns of unobserved contact