Products

Showing 81–96 of 616 results


  • The Cascade PLC50 is a precise, cost-effective cryogenic wafer probing system designed for research labs. It enables testing down to 77 K with liquid nitrogen or below 7 K with liquid helium, supporting DC, RF, MEMS, and optoelectronic measurements.

    Key Features:

    • Compatible with wafers up to 100 mm and single dies.
    • Operates at 77 K (LN₂) or < 7 K (LHe).
    • Up to six positioners for flexible probing.
    • Independently cooled cold shield ensures stable, accurate results.
    • Ice- and condensation-free probing in vacuum conditions.
    • Ergonomic design with hinged lid and easy microscope access.
    • Independent chuck stage and positioner control for high throughput.

     

  • Cascade PM8 200 mm Manual Probe System

    Key Features:

    • Stable granite base for vibration-free measurements.
    • Submicron precision with 1 µm repeatable separation stroke.
    • Configurable for DC, RF, mmW, sub-THz, FA, MEMS, and opto-engineering.
    • 40 mm platen height adjustability for flexible setups.
    • Supports thermal chucks, motorized microscopes, and dark box options.
    • Double-side probing for frontside and backside device access.
    • Ergonomic and low-profile design for easy wafer handling.
    • Upgradeable platform with accessories for future needs.

     

  • Cascade PMC200 Cryogenic Probe Station – advanced manual solution for wafer probing down to cryogenic levels with unmatched flexibility and accuracy.

    Key Features:

    • 200 mm cryogenic manual probe station with probes inside chamber
    • Supports wafers up to 200 mm or single dies
    • Probe cards and up to eight positioners for advanced measurements
    • Operates with liquid nitrogen (77 K) or helium (< 7 K)
    • Optional microscope bridge and 300 mm wafer upgrade
    • Front-loading capability for fast and ergonomic device changes
    • Independently cooled cold shield for stable cryogenic performance
    • Precise probe positioning with vibration-isolated frame
    • Covers DC, RF, MEMS, OPTO, and superconducting device tests

     

  • A high-precision vacuum probe station engineered for advanced wafer and substrate testing up to 200 mm in demanding laboratory and industrial environments.

    Key Features:

    • Supports wafers and substrates up to 200 mm or single dies
    • Up to eight positioners and probe card compatibility
    • Optional thermal chuck (-60°C to 300°C) with pressure regulation
    • Accessories available: black bodies and optical motion analysis tools
    • Upgradeable to 300 mm wafer capability
    • Built-in vibration isolation for precise, stable measurements
    • Ideal for DC, RF, MEMS, and optoelectronic testing
    • Ergonomic manual drives with front-loading capability
    • High throughput with software-controlled chuck for fast step-and-repeat

     

  • Cascade Summit 200 mm Manual Probe System

    Key Features:

    • High-precision manual on-wafer device and process characterization.
    • Wide thermal range from -60°C to +300°C.
    • Moisture-free, light-tight, EMI-shielded test environment with MicroChamber®.
    • PureLine™ and AttoGuard® technologies for low-noise performance.
    • Configurable for DC, RF, mmW, WLR, and FA applications.
    • Locking roll-out stage for safe wafer access.
    • Ergonomic 3-axis manual stage with intuitive controls.
    • Dedicated Velox software with Augmented Align for accurate RF probing.

     

  • Cascade SUMMIT200 Advanced 200 mm Probe Station

    Key Features:

    • High-accuracy electrical measurements for DC, RF, mmW, and THz applications.
    • Up to 5X faster time to accurate data with automated wafer handling.
    • Wide thermal range from -60°C to +300°C with IceShield™.
    • PureLine™, AttoGuard®, and MicroChamber® technologies for ultra-low noise performance.
    • Precision sub-micron positioning with advanced 4-axis stage and VueTrack PRO.
    • Flexible platform for device characterization, FA, WLR, and design debug.
    • Velox control software with modern UI, workflow guide, and automation tools.
    • Ergonomic operation with quick manual wafer access and roll-out stage.

     

  • Cascade TESLA300 is a 300 mm semi- and fully-automated probe system for advanced on-wafer power device characterization, ensuring safe, precise, and high-power testing.

    Key Features:

    • On-wafer device testing up to 10,000 V DC / 600 A
    • AttoGuard™ and FemtoGuard™ chuck technologies for low-leakage, high-accuracy measurements
    • MicroVac™ chuck ensures thin wafer stability and minimal contact resistance
    • TÜV-certified safety system with full enclosure and interlocks
    • Wide thermal range: -60°C to +300°C with TopHat chamber
    • Roll-out chuck and auxiliary mounts for flexible wafer handling
    • Remote operation and full software integration with Velox and analyzers
    • Material Handling Unit (MHU301) for automated wafer loading and barcode recognition

     

  • CDG 7000 Conducted Immunity Test System, 10 kHz – 400 MHz

    Key Features:

    • All-in-one IEC/EN 61000-4-6 immunity test system with RF signal generator, power amplifier, 3-channel RF voltmeter, and directional coupler.
    • Frequency range from 10 kHz to 400 MHz with multiple amplifier versions (25 W, 75 W, 75 W/10k).
    • Supports BCI tests (ISO 11452-4) and NAMUR standards.
    • Advanced software HELIA 7 with EUT monitoring and automated reporting.
    • Interfaces: USB, LAN, optional GPIB for flexible integration.
    • Expandable with external amplifiers and configurable digital I/O.
    • Compact, robust 19″ desktop housing with 3-year warranty.

     

  • A high-performance analyzer designed for R&D applications involving electrochemical components, materials, batteries, and EDLCs. It enables precise impedance measurements essential for advanced evaluation and development.

    Key Features:

    • Wide frequency range: 1 mHz to 200 kHz for detailed ion and solution behavior analysis
    • Dual function: High-speed continuous LCR and sweep measurements with one device
    • Battery analysis: Measures internal impedance under no-load conditions
    • Ultra-fast sweep: Perform measurements in as little as 2 ms
    • High accuracy: ±0.05% basic precision for reliable R&D and testing
    • Advanced analysis: Supports Cole-Cole plots and equivalent-circuit modeling for electrochemical studies
  • The CIS-25 Test Kit by AE Techron is an all-in-one solution for aviation conducted and induced susceptibility testing. Designed to meet rigorous standards like DO-160 Sections 16, 18, and 19, this kit includes everything needed to perform accurate, repeatable EMC tests with minimal setup.

    Key Features:

    • Meets Multiple Standards: DO-160 Sections 16 (up to 24VDC), 18, 19, MIL STD 461, Airbus ABD0100.1.8
    • Complete Test Kit: Includes DSR 100-25 power system, three coupling transformers, and chattering relay
    • 4x Power Surge Capability: Ideal for in-rush testing (up to 200 ms)
    • Built-In Standards Library: 3110A library for additional EMC tests
    • Expert Guidance Included: Two hours of consulting from EMC specialist Patrick G. Andre
    • Secure & Durable: Comes with a lockable storage cabinet and all necessary accessories

     

  • The Hioki Clamp On Leak Sensor 9657-10 is a versatile voltage output sensor designed for general purpose leak current testing as well as load current measurement. Using a high-permeability magnetic core and shielding structure, it delivers accurate and stable measurement of weak AC currents. This makes it an excellent choice for insulation fault checks, grounding inspections, and routine electrical maintenance.

    Key Features

    • Designed for general purpose leak current testing
    • Supports both leak current and load current measurement
    • High accuracy voltage output for reliable diagnostics
    • Ideal for identifying insulation faults and grounding issues
    • Compatible with power quality analyzers and data recorders
    • Clamp design suitable for insulated conductors

     

  • The Hioki Clamp On Leak Sensor 9675 is a high-accuracy voltage output sensor designed for reliable leak current measurement on insulated conductors. Built with a high-permeability magnetic core and magnetic shielding, it enables stable and precise detection of extremely small AC leak currents. This sensor is ideal for grounding inspections, insulation fault checks, and preventive electrical maintenance in industrial and commercial environments.

    Key Features

    • High accuracy of ±1.0 percent for reliable leak current detection
    • Designed specifically for AC leak current measurement at 50 Hz and 60 Hz
    • Ideal for testing ground conductors and identifying insulation faults
    • High-permeability magnetic core for measuring very weak currents
    • Voltage output compatible with power quality analyzers and recorders
    • Compact, lightweight clamp design for easy field use

     

  • The Hioki Clamp On Sensor 9272-05 is a high-accuracy AC current sensor designed for precise measurement of low-frequency currents in inverter-controlled equipment. With excellent phase accuracy and a wide frequency range from 1 Hz to 100 kHz, it is ideal for harmonic analysis, FFT analysis, and waveform observation when used with compatible power meters, power analyzers, or Memory HiCorders.

    Key Features

    • Optimized for low-frequency AC current measurement in inverter systems
    • Wide frequency bandwidth from 1 Hz to 100 kHz for waveform and harmonic analysis
    • High amplitude and phase accuracy for precise power and efficiency testing
    • Selectable 20 A and 200 A AC measurement ranges
    • Designed for use with power analyzers, Memory HiCorders, and sensor units
    • CAT III 600 V rated for safe industrial and laboratory measurements
    • Large clamp diameter suitable for thicker conductors

     

  • The Hioki Clamp On Sensor 9660 is a 100 A AC voltage output clamp sensor designed for accurate load current measurement in industrial and commercial applications. Compatible with power meters, PQAs, and data acquisition systems, it delivers reliable readings in narrow or constrained spaces.

    Key Features

    • Measures AC load current up to 100 A
    • High accuracy: ±0.3% amplitude, ±1° phase
    • Compact design fits conductors up to 15 mm
    • Voltage output compatible with power meters and PQAs
    • Ideal for inverter devices and commercial power lines
    • Easy connection via 3-meter cord with BNC output

     

  • The Hioki Clamp On Sensor 9661 is a 500 A AC voltage output clamp sensor designed for precise load current measurements in industrial and commercial applications. Compatible with power meters, PQAs, and other data acquisition equipment, it ensures accurate readings in constrained spaces.

    Key Features

    • Measures AC load current up to 500 A
    • High accuracy: ±0.3% amplitude, ±0.5° phase
    • Compact design fits conductors up to 46 mm
    • Voltage output compatible with power meters and PQAs
    • Ideal for inverter devices and commercial power lines
    • Easy connection via 3-meter cord with BNC output

     

  • The Hioki Clamp On Sensor 9669 is a high-capacity 1000 A AC voltage output clamp sensor designed for precise load current measurement. Ideal for power meters, PQAs, and inverter-based systems, it ensures reliable readings even in demanding industrial applications.

    Key Features

    • Measures AC load current up to 1000 A
    • High accuracy: ±1.0% amplitude, ±1° phase
    • Compact design for conductors up to 55 mm
    • Voltage output compatible with power meters and PQAs
    • Suitable for inverter devices and commercial power lines
    • Easy connection via 3-meter cord with BNC output

     


Showing 81–96 of 616 results