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Products

Showing 81–96 of 617 results

  • Cascade EPS200RF Probe System
    Cascade EPS200RF Probe System
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    FormFactor Beaverton Inc Cascade EPS200RF Probe System

    Cascade EPS200RF 200 mm Manual Probe System

    Key Features:

    • Complete RF measurement package up to 67 GHz.
    • Based on the PM8 platform for stability and flexibility.
    • Supports Infinity, ACP, and |Z| probe technologies for different material types.
    • High precision probing with RF chuck ±3 μm planarity.
    • 500 μm platen stroke with ≤±1 μm accuracy for repeatable contact.
    • Reliable probing for pads as small as 25 µm x 35 µm.
    • Includes matching cables, substrates, and WinCal XE calibration software.
    • Delivers accurate S-parameter measurements with automated calibration.

     

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  • Cascade MPS150 Probe Station - 1
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    FormFactor Beaverton Inc Cascade MPS150 Probe Station

    Key Features:

    • 150 mm modular probe station with customizable base and starter kits.
    • Flexible options for IV/CV, RF, mmWave, THz, high power, and failure analysis.
    • Solid frame with built-in vibration isolation for measurement stability.
    • Supports advanced microscopes, triax, coax, and RF chucks.
    • Seamless integration with leading measurement instruments.
    • Ergonomic design with quick pull-out stage for fast device handling.
    • Re-configurable and upgradable to grow with future testing needs.

     

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  • Cascade MPS150-SiPh Probe Station - 1
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    FormFactor Beaverton Inc Cascade MPS150-SiPh Probe Station

    Cascade MPS150-SiPh Manual Silicon Photonics Probe Station

    Key Features:

    • Cost-effective entry-level photonics probe station.
    • Supports surface coupling and horizontal edge coupling.
    • Retro-mirror technology for precise fiber alignment.
    • Tip-tilt base positioner with 6 degrees of freedom.
    • Compatible with single fibers and fiber arrays.
    • Optional eVue digital imaging or SlimVue high-performance microscope.
    • Modular, upgradable design with platen extensions.
    • Ergonomic and intuitive for users of all experience levels.

     

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  • Cascade PAP200 Probe Station - 1
    Cascade PAP200 Probe Station - 2
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    FormFactor Beaverton Inc Cascade PAP200 Probe Station

    Key Features:

    • Supports wafers and substrates up to 200 mm
    • Operates in high vacuum down to <1×10⁻⁵ mbar or overpressure up to 4.0 bar
    • Flexible setup with probe cards or up to eight positioners
    • Optional thermal chuck from -60°C to +300°C with pressure regulation
    • Accessories include IR black bodies and optical motion analysis tools
    • Upgrade path to 300 mm wafers
    • Solid station frame with built-in vibration isolation for stable measurements
    • Ergonomic front-side loading with joystick control
    • Velox software for efficient wafer alignment and step-and-repeat automation
    • Ideal for MEMS, DC, RF, C-V, and optoelectronic testing

     

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  • Cascade PAV200 Probe System - 1
    Cascade PAV200 Probe System - 3
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    FormFactor Beaverton Inc Cascade PAV200 Probe System

    Cascade PAV200 – 200 mm Semi-Automated Vacuum Probe System

    Key Features:

    • Supports wafers and substrates up to 200 mm (optional upgrade to 300 mm)
    • Operates in high vacuum down to < 1×10⁻⁴ mbar
    • Semi-automated control with joystick and software-driven chuck movement
    • Up to eight probe positioners and/or probe card integration
    • Optional thermal chuck with -60°C to 300°C range
    • Solid frame with vibration isolation for stable, accurate measurements
    • Wide application support: DC, RF, MEMS, and optoelectronics
    • Velox software for wafer alignment, mapping, and simplified automation

     

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  • Cascade PLC50 - 1
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    FormFactor Beaverton Inc Cascade PLC50

    The Cascade PLC50 is a precise, cost-effective cryogenic wafer probing system designed for research labs. It enables testing down to 77 K with liquid nitrogen or below 7 K with liquid helium, supporting DC, RF, MEMS, and optoelectronic measurements.

    Key Features:

    • Compatible with wafers up to 100 mm and single dies.
    • Operates at 77 K (LN₂) or < 7 K (LHe).
    • Up to six positioners for flexible probing.
    • Independently cooled cold shield ensures stable, accurate results.
    • Ice- and condensation-free probing in vacuum conditions.
    • Ergonomic design with hinged lid and easy microscope access.
    • Independent chuck stage and positioner control for high throughput.

     

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  • Cascade PM8 Probe System - 1
    Cascade PM8 Probe System - 2
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    FormFactor Beaverton Inc Cascade PM8 Probe System

    Cascade PM8 200 mm Manual Probe System

    Key Features:

    • Stable granite base for vibration-free measurements.
    • Submicron precision with 1 µm repeatable separation stroke.
    • Configurable for DC, RF, mmW, sub-THz, FA, MEMS, and opto-engineering.
    • 40 mm platen height adjustability for flexible setups.
    • Supports thermal chucks, motorized microscopes, and dark box options.
    • Double-side probing for frontside and backside device access.
    • Ergonomic and low-profile design for easy wafer handling.
    • Upgradeable platform with accessories for future needs.

     

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  • Cascade PMC200 Cryogenic Probe Station - 1
    Cascade PMC200 Cryogenic Probe Station - 2
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    FormFactor Beaverton Inc Cascade PMC200 Cryogenic Probe Station

    Cascade PMC200 Cryogenic Probe Station – advanced manual solution for wafer probing down to cryogenic levels with unmatched flexibility and accuracy.

    Key Features:

    • 200 mm cryogenic manual probe station with probes inside chamber
    • Supports wafers up to 200 mm or single dies
    • Probe cards and up to eight positioners for advanced measurements
    • Operates with liquid nitrogen (77 K) or helium (< 7 K)
    • Optional microscope bridge and 300 mm wafer upgrade
    • Front-loading capability for fast and ergonomic device changes
    • Independently cooled cold shield for stable cryogenic performance
    • Precise probe positioning with vibration-isolated frame
    • Covers DC, RF, MEMS, OPTO, and superconducting device tests

     

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  • Cascade PMV200 Vacuum Probe - 1
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    FormFactor Beaverton Inc Cascade PMV200 Vacuum Probe

    A high-precision vacuum probe station engineered for advanced wafer and substrate testing up to 200 mm in demanding laboratory and industrial environments.

    Key Features:

    • Supports wafers and substrates up to 200 mm or single dies
    • Up to eight positioners and probe card compatibility
    • Optional thermal chuck (-60°C to 300°C) with pressure regulation
    • Accessories available: black bodies and optical motion analysis tools
    • Upgradeable to 300 mm wafer capability
    • Built-in vibration isolation for precise, stable measurements
    • Ideal for DC, RF, MEMS, and optoelectronic testing
    • Ergonomic manual drives with front-loading capability
    • High throughput with software-controlled chuck for fast step-and-repeat

     

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  • Cascade Summit Probe System
    Cascade Summit Probe System
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    FormFactor Beaverton Inc Cascade Summit Probe System

    Cascade Summit 200 mm Manual Probe System

    Key Features:

    • High-precision manual on-wafer device and process characterization.
    • Wide thermal range from -60°C to +300°C.
    • Moisture-free, light-tight, EMI-shielded test environment with MicroChamber®.
    • PureLine™ and AttoGuard® technologies for low-noise performance.
    • Configurable for DC, RF, mmW, WLR, and FA applications.
    • Locking roll-out stage for safe wafer access.
    • Ergonomic 3-axis manual stage with intuitive controls.
    • Dedicated Velox software with Augmented Align for accurate RF probing.

     

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  • Cascade SUMMIT200 Probe Station - 1
    Cascade SUMMIT200 Probe Station - 2
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    FormFactor Beaverton Inc Cascade SUMMIT200 Probe Station

    Cascade SUMMIT200 Advanced 200 mm Probe Station

    Key Features:

    • High-accuracy electrical measurements for DC, RF, mmW, and THz applications.
    • Up to 5X faster time to accurate data with automated wafer handling.
    • Wide thermal range from -60°C to +300°C with IceShield™.
    • PureLine™, AttoGuard®, and MicroChamber® technologies for ultra-low noise performance.
    • Precision sub-micron positioning with advanced 4-axis stage and VueTrack PRO.
    • Flexible platform for device characterization, FA, WLR, and design debug.
    • Velox control software with modern UI, workflow guide, and automation tools.
    • Ergonomic operation with quick manual wafer access and roll-out stage.

     

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  • Cascade TESLA300 - 1
    Cascade TESLA300 - 2
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    FormFactor Beaverton Inc Cascade TESLA300

    Cascade TESLA300 is a 300 mm semi- and fully-automated probe system for advanced on-wafer power device characterization, ensuring safe, precise, and high-power testing.

    Key Features:

    • On-wafer device testing up to 10,000 V DC / 600 A
    • AttoGuard™ and FemtoGuard™ chuck technologies for low-leakage, high-accuracy measurements
    • MicroVac™ chuck ensures thin wafer stability and minimal contact resistance
    • TÜV-certified safety system with full enclosure and interlocks
    • Wide thermal range: -60°C to +300°C with TopHat chamber
    • Roll-out chuck and auxiliary mounts for flexible wafer handling
    • Remote operation and full software integration with Velox and analyzers
    • Material Handling Unit (MHU301) for automated wafer loading and barcode recognition

     

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  • CDG 7000 Conducted Immunity - 1
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    Absolute EMC CDG 7000 Conducted Immunity

    CDG 7000 Conducted Immunity Test System, 10 kHz – 400 MHz

    Key Features:

    • All-in-one IEC/EN 61000-4-6 immunity test system with RF signal generator, power amplifier, 3-channel RF voltmeter, and directional coupler.
    • Frequency range from 10 kHz to 400 MHz with multiple amplifier versions (25 W, 75 W, 75 W/10k).
    • Supports BCI tests (ISO 11452-4) and NAMUR standards.
    • Advanced software HELIA 7 with EUT monitoring and automated reporting.
    • Interfaces: USB, LAN, optional GPIB for flexible integration.
    • Expandable with external amplifiers and configurable digital I/O.
    • Compact, robust 19″ desktop housing with 3-year warranty.

     

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  • CHEMICAL IMPEDANCE ANALYZER IM3590
    CHEMICAL IMPEDANCE ANALYZER IM3590 - 2
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    HIOKI E E CORPORATION CHEMICAL IMPEDANCE ANALYZER IM3590 USD $ 10,510.56

    A high-performance analyzer designed for R&D applications involving electrochemical components, materials, batteries, and EDLCs. It enables precise impedance measurements essential for advanced evaluation and development.

    Key Features:

    • Wide frequency range: 1 mHz to 200 kHz for detailed ion and solution behavior analysis
    • Dual function: High-speed continuous LCR and sweep measurements with one device
    • Battery analysis: Measures internal impedance under no-load conditions
    • Ultra-fast sweep: Perform measurements in as little as 2 ms
    • High accuracy: ±0.05% basic precision for reliable R&D and testing
    • Advanced analysis: Supports Cole-Cole plots and equivalent-circuit modeling for electrochemical studies
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  • CIS-25 Test Kit - 1
    CIS-25 Test Kit - 2
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    AE Techron CIS-25 Test Kit

    The CIS-25 Test Kit by AE Techron is an all-in-one solution for aviation conducted and induced susceptibility testing. Designed to meet rigorous standards like DO-160 Sections 16, 18, and 19, this kit includes everything needed to perform accurate, repeatable EMC tests with minimal setup.

    Key Features:

    • Meets Multiple Standards: DO-160 Sections 16 (up to 24VDC), 18, 19, MIL STD 461, Airbus ABD0100.1.8
    • Complete Test Kit: Includes DSR 100-25 power system, three coupling transformers, and chattering relay
    • 4x Power Surge Capability: Ideal for in-rush testing (up to 200 ms)
    • Built-In Standards Library: 3110A library for additional EMC tests
    • Expert Guidance Included: Two hours of consulting from EMC specialist Patrick G. Andre
    • Secure & Durable: Comes with a lockable storage cabinet and all necessary accessories

     

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  • Clamp On Leak Sensor 9657-10
    Clamp On Leak Sensor 9657-10
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    HIOKI E E CORPORATION Clamp On Leak Sensor 9657-10

    The Hioki Clamp On Leak Sensor 9657-10 is a versatile voltage output sensor designed for general purpose leak current testing as well as load current measurement. Using a high-permeability magnetic core and shielding structure, it delivers accurate and stable measurement of weak AC currents. This makes it an excellent choice for insulation fault checks, grounding inspections, and routine electrical maintenance.

    Key Features

    • Designed for general purpose leak current testing
    • Supports both leak current and load current measurement
    • High accuracy voltage output for reliable diagnostics
    • Ideal for identifying insulation faults and grounding issues
    • Compatible with power quality analyzers and data recorders
    • Clamp design suitable for insulated conductors

     

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Showing 81–96 of 617 results