Products

Cascade SUMMIT200 Advanced 200 mm Probe Station

Key Features:

• High-accuracy electrical measurements for DC, RF, mmW, and THz applications.
• Up to 5X faster time to accurate data with automated wafer handling.
• Wide thermal range from -60°C to +300°C with IceShield™.
• PureLine™, AttoGuard®, and MicroChamber® technologies for ultra-low noise performance.
• Precision sub-micron positioning with advanced 4-axis stage and VueTrack PRO.
• Flexible platform for device characterization, FA, WLR, and design debug.
• Velox control software with modern UI, workflow guide, and automation tools.
• Ergonomic operation with quick manual wafer access and roll-out stage.

Cascade TESLA300 is a 300 mm semi- and fully-automated probe system for advanced on-wafer power device characterization, ensuring safe, precise, and high-power testing.

Key Features:

• On-wafer device testing up to 10,000 V DC / 600 A
• AttoGuard™ and FemtoGuard™ chuck technologies for low-leakage, high-accuracy measurements
• MicroVac™ chuck ensures thin wafer stability and minimal contact resistance
• TÜV-certified safety system with full enclosure and interlocks
• Wide thermal range: -60°C to +300°C with TopHat chamber
• Roll-out chuck and auxiliary mounts for flexible wafer handling
• Remote operation and full software integration with Velox and analyzers
• Material Handling Unit (MHU301) for automated wafer loading and barcode recognition

Cascade CM300xi-SiPh Probe System – 300 mm Wafer and Die-Level Photonics Testing

Key Features:

• Integrated silicon photonics wafer and die-level probing solution.
• Autonomous SiPh Measurement Assistant for hands-free calibration.
• OptoVue™ technology for real-time, in-situ optical calibrations.
• Supports vertical, horizontal edge, and wafer-level edge coupling.
• Dark, shielded, frost-free environment with SiPh TopHat.
• Thermal capability from -40°C to +125°C.
• Exclusive SiPh-Tools and Photonics Controller Interface (PCI) software.
• Partnerships with Keysight and PI for precision instrumentation.
• Easy setup and automation with Velox and Velox Dash™ interface.

Cascade CM300xi-ULN Probe System – Ultra Low Noise 300 mm Wafer Prober

Key Features:

• Ultra-low noise measurements with patented PureLine™ 3 technology.
• Ideal for flicker noise (1/f), RTN, and phase noise testing of ultra-sensitive devices.
• Fully shielded MicroChamber™ for EMI/RFI protection and frost-free low-temperature operation.
• Plug-and-Go TestCell Power Management eliminating ground-loop noise.
• Autonomous 24/7 operation with optimized motorized probe positioners.
• Wide thermal range from -65°C to +300°C with fA/fF measurement precision.
• Integrated Velox software for simple, efficient automation.

The EME Wide is a professional wideband field meter designed to monitor and record electromagnetic field (EMF) exposure with accuracy and reliability.

Key Features:

• Frequency range: 0.1 MHz – 6.5 GHz
• Tri-axial probe ensures maximum isotropy in measurements
• Measures isotropic and single-axis (X, Y, Z) field values
• Supports RMS, maximum, and time/spatial averaging
• Selectable units: V/m, A/m, W/m²
• Built-in alarm with programmable thresholds
• Large 2.8” LCD display with LED backlight
• Stores up to 20,000 measurement points in non-volatile memory
• Rechargeable AA NiMH battery with external wall charger
• Compliance with 2013/35/EU Directive, ICNIRP, FCC 96-326, and Safety Code 6

A compact and flexible semi-automated wafer probe system designed for RF/DC modeling, device characterization, and advanced measurement needs.

Key Features:

• Mechanical platen lift for safer RF set-ups and reduced operator errors
• Fully compatible with Autonomous RF/DC measurement assistants and Velox Dash™ app
• Reconfigurable platen inserts (TopHat, PCH, IceShield) for versatile test configurations
• Spacious platen design supporting RF and DC setups with ease
• Compact footprint with field-upgradable components
• Integrated Low-Volume MicroChamber and FemtoGuard thermal triaxial chuck

Key Features

• Supports wafers up to 200 mm (optional 300 mm upgrade)
• Operates at cryogenic temperatures down to 10 K
• Semi-automated with optional full automation via autoloader
• Compatible with liquid nitrogen, liquid helium, or cryo-cooler
• Ice- and condensation-free probing for stable performance
• Up to eight probe positioners or probe card integration
• Solid vibration-isolated frame for precision measurements
• Velox software with intuitive alignment and automation

Key Features

• Entry-level manual wafer probing in vacuum < 1×10⁻⁴ mbar
• Supports wafers up to 150 mm or single dies
• Up to six probe positioners for flexible testing
• Optional thermal chuck from -60°C to +300°C
• Probing possible with open chamber lid at atmosphere
• Stable, vibration-isolated frame for precise results
• Ergonomic design with hinged topside lid for easy access
• Independent control of chuck stage and positioners
• Fast, manual step-and-repeat wafer testing

Cascade PM300 – 300 mm Analytical Probe Station

Key Features:

• Industry benchmark for manual wafer probing and failure analysis.
• Superior mechanical stability with granite base for precision and repeatability.
• High-precision probe positioning with independent X-Y coarse and fine adjustments.
• Configurable for DC, RF, mmW, WLR, FA, and 3D IC testing.
• Wide thermal range: -60°C to +200°C (PM300PS) / +15°C to +300°C (PM300).
• Optional electromagnetic shielding (PM300PS) for ultra-low-noise environments.
• Spacious, ergonomic design supporting up to 12 positioners.
• Upgradeable platform to support future testing needs.

Cascade TESLA300 – Advanced On-Wafer Power Device Characterization

Key Features:

• High-voltage and high-current testing up to 10 kV / 600 A.
• Integrated AttoGuard™ and FemtoGuard™ technology for ultra-low leakage and capacitance.
• MicroVac™ chuck surface for thin wafer handling and low contact resistance.
• TÜV-certified safety system with interlocks and full enclosure.
• Top-lift wafer loading eliminates lift pins for accurate vertical device measurements.
• Full thermal range from -60°C to +300°C with efficient transition times.
• Seamless integration with Keysight and Keithley analyzers.
• Remote operation capability for safe offsite control.
• Velox and Velox Dash™ software for intuitive automation.

The EME Guard Plus is a lightweight and robust personal protection monitor designed to ensure the safety of workers operating near electromagnetic field (EMF) emitters such as antennas, radars, and base stations. With a frequency range of 1 MHz to 40 GHz, this device continuously monitors and records EMF exposure levels while providing immediate audio, visual, and vibrating alerts when exposure exceeds predefined safety thresholds. Customizable alarm settings and a triaxial isotropic probe ensure accurate and reliable measurements.

The EME Guard XS Radar is a state-of-the-art RF safety monitor, specifically designed for workers operating near radar transmitters and antennas. With its isotropic tri-axis E-field sensors, this compact device provides continuous EMF monitoring over a frequency range of 1 MHz to 40 GHz, including short pulsed signal detection. Equipped with audio and visual alarms, it alerts users instantly when EMF exposure exceeds predefined safety thresholds, creating a safer working environment for military, aviation, and telecom personnel.

Solutions For:

•  Accurate measurement with tri-axis sensors
• Instant audio and visual alarm
• Robust, reliable and user-friendly
• Covers 5G / 6G bands, measuring up to 71 GHz

User profile:

• Persons working near antennas including installation and maintenance workers, broadcast, PMR and mobile phone operators or regulatory body employees

Measurement capabilities:

• Continuous monitoring of Electromagnetic Field levels with isotropic tri-axis E-field sensors
• EMF Level indicated by a LED color scale
• Audio and visual alarms triggered when EMF exceeds the reference level

• Dynamic set up: During a simple frame reading, users can define elements to be acquired, recorded, visualized and surveyed in real time.
•  Macro-command: Users can write and execute complex test sequences thanks to macro-command functions.
•  Local & Distant Integration: AT-DIAG can be driven and interrogated by external software. It can also be used with a computer through Ethernet.
• Communication ports: Communication is done through RS232, NI CAN acq. Card, specific acquisition card or system.
•  Protocols: FREERUNNING, KWP2000, CAN, LIN, FlexRay, ARINC, … Possibility to implement new protocols (customized protocol, …).
•  Multi-product & Multi-protocol Communication: Communication can be set up with multiple addresses and protocols during a single test.

• 1 software for all your equipment
• 1 software for all standards
• 1 software for your electrical and EMC tests
• Advanced functions of monitoring and control
• Automated reports
• Team of specialists at your disposal

• Fast: ACA compression and parallelization allow to speed up the calculation
• Accurate: Fully validated with measurement results on real mock-up
• Innovative: New method from research labs
• Powerful: Compute very large models
• Easy: Dedicated graphical user interface with modern layout