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  • HDA125 High-Speed Digital Analyzer brings advanced logic analysis capabilities to your existing Teledyne LeCroy oscilloscopes. Compact, accurate, and versatile.

    Key Features:

    • 12.5 GS/s sample rate for high-speed digital capture
    • Supports up to 18 digital channels
    • Compatible with WaveMaster/SDA 8 Zi-B and LabMaster 10Zi-A oscilloscopes
    • QuickLink Probe System for fast, low-impact signal access
    • 3 GHz bandwidth and 80 ps timing accuracy
    • Command bus decoding for in-depth DDR/LPDDR memory debugging
    • Minimal signal loading with 110 kΩ, 0.12 pF tip impedance
    • Cost-effective QuickLink solder-in tips simplify multi-point testing
    • Ideal for mixed-signal, high-speed, and memory interface debugging
  • The Teledyne T3SA Series Spectrum Analyzers deliver high-performance signal analysis from 9 kHz to 3.2 GHz in a compact, easy-to-use design. Ideal for R&D, education, production, and pre-compliance testing, it features a large touchscreen and advanced digital IF technology.

    Key Features:

    • All Digital IF technology10.1”
    • WVGA (1024 x 600) touchscreen display
    • Frequency range from 9 kHz to 3.2 GHz
    • -161 dBm/Hz displayed average noise level (typical)
    • -98 dBc/Hz @ 10 kHz offset phase noise (typical)
    • Total amplitude accuracy < 0.7 dB
    • 1 Hz minimum resolution bandwidth (RBW)
    • Built-in preamplifier for improved sensitivity

    Typical Applications

    ● Research Laboratory
    ● Development Laboratory
    ● Repair and Maintenance
    ● Calibration Laboratory
    ● Automatic Production Test
    ● General bench-top use

  • The T3VNA Series from Teledyne Test Tools is a powerful, compact solution for engineers who demand precision and versatility in RF and spectrum analysis.

    Key Features:

    • Vector Network Analysis from 10 MHz to 3.2 GHz
    • Spectrum Analysis from 9 kHz to 3.2 GHz
    • All-digital IF technology for clean signal processing
    • Built-in tracking generator (up to 1.5 GHz)
    • Advanced features like Distance-to-Fault, OBW, ACPR
    • -156 dBm/Hz typical displayed average noise level
    • -98 dBc/Hz @ 10 kHz offset phase noise
    • 1 Hz minimum RBW for high-resolution measurements
    • 10.1″ WVGA display for smooth operation
    • High accuracy with <1.2 dB amplitude error
    • S-parameters DC to 40 GHz, single-ended and mixed-mode
    • Impedance Profile with <1 mm resolution, differential and common-mode
    • Internal, automatic OSLT calibration
    • USB-connected, small, lightweight
    • Flexible display of the measurements
    • Remove effects from fixtures, connectors and cables
    • Emulate eye diagrams with CTLE, DFE and FFE equalization
    • Advanced jitter analysis

     

    • Dynamic set up: During a simple frame reading, users can define elements to be acquired, recorded, visualized and surveyed in real time.
    •  Macro-command: Users can write and execute complex test sequences thanks to macro-command functions.
    •  Local & Distant Integration: AT-DIAG can be driven and interrogated by external software. It can also be used with a computer through Ethernet.
    • Communication ports: Communication is done through RS232, NI CAN acq. Card, specific acquisition card or system.
    •  Protocols: FREERUNNING, KWP2000, CAN, LIN, FlexRay, ARINC, … Possibility to implement new protocols (customized protocol, …).
    •  Multi-product & Multi-protocol Communication: Communication can be set up with multiple addresses and protocols during a single test.

     

    • 1 software for all your equipment
    • 1 software for all standards
    • 1 software for your electrical and EMC tests
    • Advanced functions of monitoring and control
    • Automated reports
    • Team of specialists at your disposal

     

    • Fast: ACA compression and parallelization allow to speed up the calculation
    • Accurate: Fully validated with measurement results on real mock-up
    • Innovative: New method from research labs
    • Powerful: Compute very large models
    • Easy: Dedicated graphical user interface with modern layout

     

    • Fast: ACA compression and parallelization allow to speed up the calculation
    • Accurate: Fully validated with measurement results on real mock-up
    • Innovative: New method from research labs
    • Powerful: Compute very large models
    • Easy: Dedicated graphical user interface with modern layout

     

    • Unique user interface for all tests
    • Independent from any measuring device manufacturers
    • Free drivers and over 500 supported devices
    • Efficient and dedicated Technical support
    • Wide range of supported standards (ENxx, CISPR, AUTOMOTIVE, DO160, …)
    • Interface Agilent VEE™, WindowsLabView™, LabWindows CVI™, Visual C++
    • Operating system: Win XP, Vista, Seven, Windows 8
    • Report in MS Office™ 2003, 2007, 2010, 2013, Open office