Products

High power, High performance probe

• High power – 66 W at 2.4 GHz and 43 W at 5 GHz
• Extremely low insertion loss of ≤ 0.4 dB (typical) up to 40 GHz
• Excellent contact control and low contact resistance
• High performance on any pad material (Al or Au)
• Longest lifetime – typically one million (1,000,000) touchdowns

Excellent Performance – Longest Lifetime

• Best price per contact – typically over one million (1,000,000) touchdowns
• RF/Microwave signal is shielded and completely air isolated in the probe body
• Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
• Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
• Probe on any pad material with minimal damage

• Highest accuracy in test results
• Easy setup even for less experienced users
• Minimized coupling losses with minimal trench dimensions
• Exclusive FormFactor-developed automated test methodology
• Wide range of tools for capturing, logging and interpreting data
• Enables hands-free autonomous calibration and re-calibration at multiple temperatures
• Search First Light feature enables automated determination of initial position for optimization
• Once aligned, all calibration functions are automated and performed through SiPh-Tool

The new G5.RSS series features

• High control dynamics
• An exceptional accuracy
• A nominal output voltage of up to 3000 VDC
• A wide current-voltage range with an auto-ranging factor of 3.
• You get the best value for your investment.

• On-wafer power device characterization up to 10,000 V DC / 600 A
• Reduced probe and device destruction at high currents up to 20 A DC and 300 A pulse
• Prevent thin wafers from curling and breaking
• Accurate Rds(on) measurement at high current
• Accurate UIS measurements at high temperature
• Roll-out stage for full wafer access and easy wafer loading/unloading
• Seamless integration between Velox and analyzers/measurement software
• High-throughput wafer autoloading (standard, thinned, warped, TAIKO)
• Easy on-screen navigation, wafer mapping, and operation of accessories with Velox

Enabling single-contact high-current/high-voltage test

• Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
• Even distribution of high current with innovative multi-fingertip design
• Compatible with Tesla 200/300 mm power device characterization system
• Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
• Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
• Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)

• compact and completely modular design
• high effectiveness in all operation modes, few requirements on building infrastructure
• ability to use an existing liquid cooling system directly
• optional matched liquid-to-air cooling unit TC.LAE available
• possibility of upgrading to systems of up to 1 MVA
• high level of system dynamics, ≤ 5 kHz modulation bandwidth
• non-restrictive capability of refeeding in the Q4 operation mode
• possibility of operating as an autonomous 4-Q and 3-phase quasi-analogue amplifier
• possibility of “Hardware-in-the loop”-operation (HIL mode)
• user friendly application software with pre-configured test patterns
• possibility of integrating into a complete SAS simulation and test system
• galvanic isolation available as an option without derating the simulator port data

Bidirectional (source & sink), Regenerative 0…65VDC to 0…1500VDC, 20kW up to 1.5 MW 

• cell system nominal voltage and type of chemistry
• number of cells
• internal resistance and associated parameters
• cell temperature progression
• allowed current
• charge efficiency
• energy computing and management facilities
• time-dependent and functional dependent parameters

• Setting of operational parameters for each output phase: (frequency, phase, voltage, basic waveform)
• Defining functional blocks enabling a wide variety of modulation capabilities
• Defining, editing and storing of even complex and long test sequences
• Preview window for output voltage waveforms
• LC load mode, definition of complex equivalent circuits
• Hand drawing curve tool and FOURIER tool (harmonics synthesis)
• TC.ACS provides an extensive safety concept in order to detect unwanted or off-limit conditions very quickly and to initiate controlled limiting or even a shutdown.

• compact and completely modular design
• high effectiveness in all operation modes, few requirements on building infrastructure
• ability to use an existing liquid cooling system directly
• optional matched liquid-to-air cooling unit TC.LAE available
• possibility of upgrading to systems of up to 1 MVA
• high level of system dynamics, ≤ 5 kHz modulation bandwidth
• non-restrictive capability of refeeding in the Q4 operation mode
• possibility of operating as an autonomous 4-Q and 3-phase quasi-analogue amplifier
• possibility of “Hardware-in-the loop”-operation (HIL mode)
• user friendly application software with pre-configured test patterns
• possibility of integrating into a complete SAS simulation and test system
• galvanic isolation available as an option without derating the simulator port data

• 16K Video Generator & Analyzer
• Dolby Vision™, HDR 10 and HDR 10+
• validating DP 1.4a & DP 2.0 Link Layer on DP Sinks and Sources
• Power Input +12 Vdc (AC/DC converter included)
• Module Size/Weight TBD for Weight and Size

• Compact sized DisplayPort™ 1.2 compliant Reference Sink
• HBR2 and MST capable Sink and Branch device
• Cerified as the platform for DP 1.2 LL CTS Ext1 tests
• Optional MST Debug panel and AUX Channel Monitor
• Debug and Test Controller GUI enables monitoring and previewing any MST stream
• User programmable EDID and DPCD

•  HDMI 2.1 Test Equipment (FRL)
• Enhanced Gaming Features (VRR, ALLM)
• FEC, Forward Error Correction
• HDCP 2.2 & HDCP 2.3 support  TMDS Support
• Dolby Vision™ Test Tool
• 8K@60 fps Support (12 Gbps/channel)
• eARC Support (end of 2019)
• DSC Support (ESTIMATED 2020)
• UCD Console GUI for debugging
• High level API for easy integreation

• Automated tests for USB-C™ DisplayPort™ Alt Mode
• Electrical Test to verify whole USB-C connector with single cable insert
• Test USB 2.0 and USB 3.0
• 4K@60 support
• Easily set test parameters with provided Software
• Easily run tests from the commandline
• Unigraf’s Test System Interface (TSI) Support
• Third Part Test Management Software
• Support e.g. NI TestStand Support

• UHD / 4K compliant test equipment
• HDMI 2.0 and DP 1.2 input and output in one unit
• DCP Approved HDCP 2.3 CTS Test Tool
• HDCP 1.3 and HDCP 2.3 support
• Sink and source video, audio and configuration parameters
• USB 3.0 connected
• UCD Console GUI for debugging
• High level API for easy integration

• Test DP over USB-C video and audio
• Test USB-C Power Delivery with DP Alt Mode
• DCP Apporved HDCP 2.3 CTS Tests
• Verify interface signal continuity
• 4K@60 support
• HDCP 1.3 and HDCP 2.3 support
• Capture video and audio, monitor and control interface parameters
• USB signal pass-thru
• UCD Console GUI for debugging
• High level API for easy integration