SANBlaze VirtuaLUN storage emulation for FCoE is the key piece of test equipment for anyone developing products supporting the FCoE storage protocol. The VirtuaLUN feature set provides a unique set of functions applicable in all aspects of a product life cycle: from development to design validation and test and QA.
An add-on to the WaveJudge 5000, Sanjole’s CipherJudge enables
• Real-time SIM key retrieval and parsing of ciphered traffic
• Identify and track UE’s within commercial LTE networks
• Test UE’s from lab to field environment
• Capture/decode/trigger off ciphered control messages such as handovers
LTE Advanced brings increased network efficiency and higher throughput, but Carrier Aggregation is the key to meeting global expectations for mobile broadband performance. It does so by allowing service providers to consolidate multiple component carriers and use the bandwidth as a single medium between the user equipment (UE) and an evolved NodeB (eNB). LTE CA gives carriers with fragmented spectrum the flexibility to offer 4G performance to subscribers.
It has the ability to test in the middle, not at the ends, means you do not have to modify the system to fit the test tool. Not only does this improve ease of testing, it avoids disruption to the system that can change or influence the very behavior you are trying to troubleshoot. You get more reliable results and fewer troubleshooting dead ends.
SynthJudge (OCXO Module) / Dual-frequency, from 380 MHz to 6 GHz, is particularly useful when developing systems for multiple markets. Leverage your testing investment to cover multiple spectrum bands.
The IntelliJudge takes this unique capability to the next level by taking it to the next layer – real-time analysis and storage of PHY and protocol interactions along with real-time triggering on lower and upper layer events, errors, messages, and message content. The result is the powerful ability to isolate problem areas regardless of the layer in which they occur.
The WaveJudge 5000’s modular system provides a selection of modules (cards) that can be installed in or removed from chassis slots as your application requires. This modularity give you the ultimate flexibility in customizing a test solution targeted to your specific situation.
Higher-bandwidth version of the CT100S featuring the fastest TDR system risetime, ideal for testing high-frequency cables and interconnects with resolution and precision previously restricted to unwieldly bench-top TDR instruments.
Electrically-rugged, multipurpose metallic TDR designed for high-resolution testing of a wide range of coaxial and twisted-pair cable types and lengths — in the field, on the manufacturing floor, or in the lab. Exceeds all Tektronix® 1502C TDR specifications.
Next-gen Time-Domain Reflectometers replace the Tektronix® 1502C
The new CT100 and CT100HF are the industry’s highest-resolution portable metallic TDRs, designed for testing all coaxial and twisted-pair cables and interconnects used in modern microwave/RF and digital systems. These are the only portable instruments that exceed all TDR specifications of the Tektronix® 1502C Metallic TDR Cable Tester, while providing next-generation improvements in TDR analysis, data storage, connectivity, and ergonomics.
CT100 Series TDRs feature 8-10x sharper spatial resolution and100-1000x better Distance-to-Fault (DTF) resolution than competing TDR instruments, and have multi-GHz bandwidth similar to competing FDR (Frequency-Domain Reflectometer) instruments with similar or better cable fault sensitivity andorders-of-magnitude better DTF precision.
These instruments’ unique combination of fast system rise-time,high-resolution time-base, and precision 16-bit impedance measurements allow you to identify and correct subtle changes in cable and connector performance before system failure. Some of the CT100 Series’ innovative features are described below. Also, please read CT100 Series Features for more information.