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• High Accuracy & Precision – Achieves ±30 ηA accuracy on multi-current range channels, ensuring reliable and consistent results.
• Scalable Configurations – Choose from 1 to 16 channels across three series configurations, providing flexibility to expand as testing needs grow.
• Compact & Space-Efficient Design – Desktop form factor saves space while maintaining full testing capabilities.
• Comprehensive Data Collection – Log current, voltage, time, temperature, and other critical parameters with high-speed data acquisition.
• Versatile Applications – Ideal for cell and battery testing, fuel cell testing, super-capacitor testing, thermal battery testing, qualification testing, and more.
• Turn-Key System – Pre-configured software and hardware bundles ensure quick deployment and easy setup.
• Advanced Software Integration – Seamlessly integrates with Maccor’s proprietary software for automated testing, data analysis, and reporting.
• Safety & Reliability – Designed with built-in safety features to protect both users and equipment.
• High-Speed Data Logging – Collects high-resolution data for in-depth performance analysis and characterization.
• Multiple Test Modes & Sequences – Supports constant current, power, resistance, pulse, and custom waveforms for comprehensive testing scenarios.

The Maccor Cell, Battery, and Module Test Systems are perfect for:

• Battery and Cell Testing
• Module and Pack Testing
• Fuel Cell & Super-Capacitor Testing
• Research & Development
• Quality Control & Manufacturing

• Electrical energy is returned to the AC grid during discharge
• 100% duty cycle standard – No system power limit, test channel rated for continuous operation at full power, allows use in testing very high power storage batteries and EV systems
• Drive Cycle Simulation – Waveforms can be imported into the test procedure to increase test efficiency and reduce potential operator error
• Local emergency cut-off switch, automatic shutdown on loss of AC power, reverse voltage protection, internal circuit breakers – Provides a high level of safety
• Automatic scaling of data in W/kg or C-rate for drive cycle simulation programs and other test procedures – Reduces operator workload
• Real-time data and graphics – Allows battery performance to be visually monitored at any time as the test progresses

• High-Density Testing – Up to 192 test positions per rack or 32 positions per desktop unit, ensuring high-throughput testing.
• Independent Operation – Each test position operates independently, enabling simultaneous testing of multiple cells under different conditions.
• User-Programmable Multi-Step Testing – Configure constant current, power, voltage, or resistance test sequences with easy-to-use software.
• Precise Data Logging & Analysis – Logs current, voltage, time, temperature, and other critical parameters with high-speed data acquisition.
• Real-Time Monitoring & Control – Data can be viewed, plotted, and analyzed in real-time, providing instant insights into cell performance.
• Compact & Scalable Design – Available in desktop models (32 positions) and rack-mounted configurations (up to 192 positions per rack).
• Seamless Integration – Powered by Maccor’s standard test system software, ensuring consistent performance and compatibility with existing systems.
• Turn-Key Solution – Supplied as a complete system with PC and software, ensuring quick deployment and easy setup.
• Advanced Safety Features – Includes automatic shutdown on power loss, reverse voltage protection, and internal circuit breakers for safe operation.
• Versatile Applications – Suitable for single-cell testing, R&D, quality control, battery performance evaluation, and cycle life testing.

• Advanced Multi-Level Pulse (AMLP) – Design complex pulse profiles with up to 15,000 levels for high-precision battery testing.
• Ultra-Fast Data Collection – Log data at 1 kHz across multiple channels with 20 kHz sampling for the first milliseconds, capturing critical transient events.
• High-Resolution Step Length Control – Specify test steps as short as 750 microseconds with 1-microsecond increments, enabling ultra-fast dynamic testing.
• High-Speed Set Point Lock-In – Achieve setpoint stabilization in as little as 1 millisecond, ensuring accurate and consistent results.
• Customizable Waveforms – Stream external text test files with programmable waveforms, supporting constant current or power modes with 1-millisecond increments and 1-microsecond resolution.
• Unmatched Flexibility – Run multiple unique waveforms in a single test without limitations on the number of levels.
• Comprehensive Data Logging – Log data on current, voltage, time, and other factors continuously, providing comprehensive performance insights.
• Optimized for Complex Testing – Ideal for cycle life testing, pulse power characterization, impedance measurements, and battery performance evaluation.
• Scalable and Modular Design – Expand testing capabilities by integrating multiple Series 6000 units, ensuring scalable solutions for R&D and production environments.

PureLine 3 Technology

First automated probe station to achieve -190dB spectral noise*

Plug In and Go

Integrated TestCell Power Management provides fully managed and filtered AC power to the entire system, prober and instruments

Autonomous 24/7 Operation

Up to 4x faster flicker noise thermal testing on 30 μm pads

Reduce Setup Time and Costs
Exclusive low noise site survey, and system verification services

• Quick and easy probe tip navigation
• Maximizes field-of-view
• High magnification
• Shadow-free view of the corresponding features
• Automatically configure and optimize performance
• cTUVus certified and CE
• Compatible with TopHat for perfect shielding
• 24/7 operating, Increased MTBF
• Stops all system motion and warns of unobserved contact

• Comprehensive,
• Turn-key Integrated Measurement System (IMS)
• with Keysight PNA for On-wafer R&D Measurements
• from RF to millimeter wave to Terahertz

Accurate and precise measurement of device parameters up to 3,000 V

• Coaxial and triaxial measurements up to 3,000 V
• High-quality construction with low-noise electrical performance
• Replaceable probe tips in a variety of tip sizes
• Temperature range of -55 to 300ºC
• Triaxial measurement ensures a much better understanding of device leakage in the off state
• Highly reliable, stable and repeatable measurements
• Integrally designed as part of a complete measurement solution

Delivers superior guarding and shielding

• High-quality construction with low-noise electrical performance
• Kelvin version for convenient 4-point measurements
• Replaceable coaxial probe tips, with choice of tip radii, and full electrical guard to the probe tip
• SSMC 50 connectors
• Ultra-low, fA and fF measurements from -65 º C to 150 º C

High-performance DC Parametric Probe

• Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
• Guarantees fully-guarded measurements to fA and fF levels
• Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
• Allows probing of different pad materials and sizes
• Fast replacement of worn probes without the need for tools

Multi-contact DC Probe with flat tip needles

• Power bypass inductance: 8 nH
• Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil.
• Supports collinear and non-standard needle configurations
• Up to 16 DC for standard; maximum of 24 DC for custom
• Ideal for probing the entire circuit for functional test
• DC probes can provide power or slow logic to circuit under test

Multi-contact DC Probe with full-radius needles

• Full-radius, nickel-plated tungsten needles
• Power bypass inductance: 16 nH
• Supports collinear and non-standard needle configurations
• Support up to a maximum of 12 ceramic blades DC needles / contacts
• Ideal for probing the entire circuit for functional test
• DC probes can provide power or slow logic to circuit under test

Rugged, deep reach RF probing for modules and circuit boards

• DC-40 GHz bandwidth
• 10 ps rise time
• Low insertion and return loss
• 2 mils of tip-to-tip compliance
• High probing angle and clearance

• SlimVue Microscope
  • Combined eye-pieces and CCD camera mount
  • 3x zoom and quick lens exchange
  • Quick lens exchange
  • 1 um optical resolution
  • Minimized scope footprin
• Application Specific Sigma Kits
  • Optical feedback on platen position (gauge)
  • Adaptable to any mmW/sub-THz applications
  • Seamless integration with any mmW modules and tuners
  • Fast mounting and setup change
• THz measurement capability
  • Rock-solid mechanical design
  • Submicron stage accuracy
  • Optical feedback on platen and probe position (gauge)
  • Motorized positioner

Durable multi-contact wafer probe with controlled impedance power bypass technology

• High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz
• RF bandwidth to 500 MHz
• Long probe life: > 250,000 contacts
• Beryllium-copper tips for gold pads or tungsten for aluminum pads
• Oscillation-free testing of wide-bandwidth analog circuits
• Use with ACP series probes to provide functional at-speed testing for known-good-die
• Mix multiple contact types: Ground, Power (Standard or Eye-Pass), Logic/Signal
• Low and repeatable contact resistance on aluminum pads ( < 0.25 Ω on Al, < 0.01 Ω on Au)