Discount Products: Look through products available for a 25% – 50% discount in 2020. The items provided on a first come, first serve basis.
View Discounted Products

FormFactor Cascade IMS-K-LFN Integrated system with Keysight A-LFNA

FormFactor Cascade IMS-K-LFN Integrated system with Keysight A-LFNA

for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements

  • FormFactor probe system: CM300xi-ULN, SUMMIT200 (others available)
  • Manual, semi-automatic and fully automatic probes station options
  • FormFactor analytical probes: DCP probes (others available) on manual or motorized positioners
  • FormFactor DC automation software: Autonomous DC Measurement Assistant for unattended probing over temperature on small pads
  • Full over temperature measurements and automation from -60°C to +300°C
  • Keysight advanced low-frequency noise analyzer (A-LFNA): E4727B
  • Keysight automation and modeling software: PathWave WaferPro (WaferPro Express)
  • To complete the system: cables, adapters, mounting hardware, etc.

 

REQUEST A QUOTE
SKU: IMS-K-LFN Category:



Description

FormFactor Cascade IMS-K-LFN _ Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA
for On-wafer R&D Advanced Low-Frequency Noise Measurements

FormFactor and partner Keysight applications experts will help you configure a robust, complete solution, including:

  • FormFactor probe system: CM300xi-ULN, SUMMIT200 (others available)
  • Manual, semi-automatic and fully automatic probes station options
  • FormFactor analytical probes: DCP probes (others available) on manual or motorized positioners
  • FormFactor DC automation software: Autonomous DC Measurement Assistant for unattended probing over temperature on small pads
  • Full over temperature measurements and automation from -60°C to +300°C
  • Keysight advanced low-frequency noise analyzer (A-LFNA): E4727B
  • Keysight automation and modeling software: PathWave WaferPro (WaferPro Express)
  • To complete the system: cables, adapters, mounting hardware, etc.

Industry’s Most Productive and Accurate Advanced Low-Frequency Noise Measurement System

On-wafer 1/f noise measurements are a critical component of any characterization and modeling test system. Due to the required sensitivity, such testing can be easily corrupted by interference from outside or inside the test system. Overcoming these challenges requires carefully designed equipment from the industry’s foremost test and probe solution providers, cooperating to provide highly sensitive measurements in an ultra-low spectral noise environment. Tightly integrated instrumentation from industry leader Keysight completes the system to deliver best possible measurement accuracy and repeatability.

Fastest, Safest, and Most Affordable Path to High Quality Measurements

Pre-validated, turn-key, comprehensive, integrated measurement systems from FormFactor deliver peace of mind and immediate, out-of-the-box productivity for important test applications.

These benefits are provided at no extra cost. IMS solutions from FormFactor include no markups over Keysight pricing or integration charges.

Only one advanced low-frequency noise measurement system in the world is built upon the foundations of the #1 leader in R&D instrumentation plus the #1 leader in analytical probe systems – the FormFactor IMS-K-LFN.

Applications: Low-Frequency Noise

FormFactor Cascade IMS-K-LFN Integrated system

Reviews

There are no reviews yet!

Be the first to write a review

*