Products

The Hioki IM3523A LCR Meter is a high-speed, reliable measurement instrument designed for production lines, providing precision and efficiency at a competitive price point. Its contact check function ensures improved measurement reliability for consistent results.

Key Features

• Measurement accuracy: ±0.05% across DC to 200 kHz
• Rapid 2 millisecond test speed
• Wide measurement range: 5 mV to 5 V, 10 μA to 50 mA
• Continuous testing under mixed conditions (C-D 120 Hz, ESR 100 kHz)
• Built-in comparator and BIN classification functions
• Contact check for enhanced measurement reliability
• Multiple measurement parameters: Z, Y, θ, X, G, B, Q, Rdc, Rs, Rp, Ls, Lp, Cs, Cp, D (tanδ)
• Interfaces: USB, LAN, EXT I/O for automation

The Hioki IM3533 LCR Meter is a precision measurement instrument designed for R&D environments and transformer, winding, and coil manufacturing. It combines high accuracy, advanced inductance analysis, and built-in DC bias to support modern compliance and production testing.

Key Features

• Measurement range from DC and 1 mHz to 200 kHz
• High accuracy of ±0.05 percent across a wide signal range
• Built-in DC bias for HDMI compliance and real-world testing
• Dedicated modes for turn ratio, mutual inductance, and inductance difference
• Continuous testing across mixed conditions such as C-D and ESR
• High precision low impedance mode for low inductance and ESR testing
• Touch screen interface with intuitive operation
• Advanced frequency sweep testing available on IM3533-01
• Cable length compensation settings for improved accuracy

The Hioki IM3536 LCR Meter is a versatile, high-precision instrument designed for both R&D and production applications. With a broad frequency range and high-speed measurements, it ensures accurate evaluation of capacitors, inductors, and coils under real-world conditions.

Key Features

• Measurement frequency: DC, 4 Hz to 8 MHz (customizable up to 10 MHz)
• High-speed measurement: 1 millisecond per test
• High-precision accuracy: ±0.05% reading
• Low-impedance measurement from 1 mΩ with excellent repeatability
• DC bias function for simulating real-use conditions
• Ideal for evaluating capacitors, inductors, and power supply components
• Interfaces: USB, GP-IB, RS-232C for automated data collection
• Cost-effective solution for both R&D and production lines

The Hioki IM7580A is a compact, high-speed impedance analyzer for 1 MHz to 300 MHz testing, ideal for both production and R&D. It works seamlessly with the IM9201 SMD fixture for reliable component testing.

Key Features:

• 1 MHz to 300 MHz frequency range
• 0.5 ms test speed
• ±0.72% basic accuracy
• Compact half-rack size with palm-sized test head
• Reliable contact check functions
• Frequency, level, and time sweeps in Analyzer Mode
• RF I-V method for precise measurement

The Hioki IM7581 is a compact, high-speed impedance analyzer designed for accurate testing from 100 kHz to 300 MHz. It’s ideal for both production and development environments.

Key Features:

• 100 kHz to 300 MHz frequency range
• 0.5 ms fastest test speed
• ±0.72% basic accuracy
• Compact half-rack size, palm-sized test head
• Reliable contact check via DCR, Hi-Z reject, or waveform judgment
• Supports frequency, level, and time sweeps in Analyzer Mode
• Uses RF I-V method for precise measurement

The Hioki Impedance Analyzer IM7587 3 GHz provides precision, speed, and versatility for impedance measurements from 1 MHz to 3 GHz, ideal for both R&D and mass production applications in electronic component testing.

Key Features:

• Frequency range: 1 MHz to 3 GHz
• Test speed: 0.5 ms
• Measurement variability: 0.07%
• Basic accuracy: ±0.65% reading
• RF I-V measurement technique
• Compact half-rack design with palm-sized test head
• Robust contact check capabilities
• Analyzer mode: frequency and level sweeps, time interval measurements

Key Features:

• PXI/cPCI JTAG controller for seamless integration into PXI-based test systems
• Supports up to 4 JTAG chains on a Unit Under Test (UUT)
• Configurable I/O pin-out for maximum flexibility across projects
• Fully compatible with other XJLink2 controllers
• TCK clock speeds up to 166 MHz
• Programmable voltage domains from 1.1 V to 3.3 V in 0.1 V steps
• Built-in voltage meter and frequency counter on all I/O pins
• Adjustable signal termination with auto-skew control
• Includes LabVIEW™ Virtual Instruments (VIs) for easy integration
• Self-contained licence for use on multiple PXI racks or servers

Key Features:

• Portable USB-C to JTAG controller with 40 I/O pins
• Supports up to 8 separate JTAG TAP chains with independent frequencies
• Compact and rugged aluminium casing for lab, production, or field use
• Configurable JTAG pin-out to suit any Unit Under Test (UUT)
• Electrical protection against –30 V to +30 V input
• Four programmable I/O voltages (1.2 V to 3.3 V, in 0.1 V steps)
• Built-in voltmeter and frequency counter on all pins
• High-speed operation with TCK up to 166 MHz
• USB bus-powered with locking Type-C connector
• Self-contained licence for maximum flexibility

Key Features:

• Compact USB JTAG controller for flexible board testing
• Supports up to 4 JTAG chains per UUT
• Lightweight, portable, and ideal for lab, production, or field use
• Configurable pin-out for easy adaptation to any PCB design
• High-speed TCK clock up to 166 MHz
• Two programmable voltages from 1.1 V to 3.3 V in 0.1 V steps
• Built-in voltmeter and frequency counter on all I/O pins
• +5 V tolerant signals with auto-skew control
• USB bus-powered, no external PSU needed
• Self-contained licence, usable on multiple PCs

Key Features

• Approved by Keysight Technologies for i3070 ICT integration
• Fully compatible with all XJTAG projects
• High-speed programming with TCK up to 166 MHz
• Supports up to 4 JTAG chain connections to UUT
• Configurable interface voltages (1.1 V to 3.3 V)
• Adjustable signal slew rate and drive strength
• Automatic signal skew control for maximum reliability
• Frequency counter on all I/O pins (up to 200 MHz input)
• Fits into one i3070 utility card slot (multiple units supported)
• Enables test + programming in a single stage to boost throughput
• Supports additional protocols including I²C, SPI, and vendor-specific interfaces
• Flexible software licensing options for stand-alone or network operation

Key Features:

• 4-port JTAG tester for simultaneous testing of up to 4 boards
• High-speed USB 2.0 interface with robust performance
• Supports up to 4 TAP chains per UUT
• Configurable JTAG pin-out for simplified connectivity
• Parallel or independent testing on each port
• Programmable voltages from 1.1 V to 3.3 V in 0.1 V steps
• Built-in voltmeter and frequency counter on all I/O pins
• Automatic signal skew control for reliable operation
• Self-contained licence for use across multiple PCs
• Ideal for production lines and PCB manufacturers

Quantify composite layer resistance and interface resistance in Li-ion battery electrode sheets

The RM2610 Electrode Resistance Measurement System is an advanced tool designed for precise quantification of composite layer resistivity and interface resistance in Li-ion battery electrode sheets. Using cutting-edge inverse problem analysis, the system isolates and calculates resistance values critical for optimizing battery performance. Its intuitive design includes a constant current source and a multi-probe setup, enabling rapid measurements and detailed analysis.

With the ability to measure resistance variations caused by material properties, composition, and manufacturing conditions, the RM2610 accelerates the development of high-performance batteries. This system supports both positive and negative electrodes and provides visual insights into uniformity and density effects. Ideal for research and manufacturing environments, the RM2610 ensures reliable, accurate measurements essential for advancing lithium-ion battery technology.

Rapid 6.4ms Super Megohm and Low Current Testing

Key Features

• 300 times better noise resistance
• Max. 1000 V output: SM7110
• Max. 2 × 10^19 Ω display
• Min. 0.1 fA resolution
• Built-in EXT I/O, RS-232C, GP-IB and USB
• Flexible, Multipurpose Design, High Resistance
• Meter/Electrometer/Picoammeter/IR Meter
• Measure resistance of materials by combining with optional electrode