Showing 17–30 of 30 results


  • Cascade TESLA300 is a 300 mm semi- and fully-automated probe system for advanced on-wafer power device characterization, ensuring safe, precise, and high-power testing.

    Key Features:

    • On-wafer device testing up to 10,000 V DC / 600 A
    • AttoGuard™ and FemtoGuard™ chuck technologies for low-leakage, high-accuracy measurements
    • MicroVac™ chuck ensures thin wafer stability and minimal contact resistance
    • TÜV-certified safety system with full enclosure and interlocks
    • Wide thermal range: -60°C to +300°C with TopHat chamber
    • Roll-out chuck and auxiliary mounts for flexible wafer handling
    • Remote operation and full software integration with Velox and analyzers
    • Material Handling Unit (MHU301) for automated wafer loading and barcode recognition

     

  • Cascade CM300xi-SiPh Probe System – 300 mm Wafer and Die-Level Photonics Testing

    Key Features:

    • Integrated silicon photonics wafer and die-level probing solution.
    • Autonomous SiPh Measurement Assistant for hands-free calibration.
    • OptoVue™ technology for real-time, in-situ optical calibrations.
    • Supports vertical, horizontal edge, and wafer-level edge coupling.
    • Dark, shielded, frost-free environment with SiPh TopHat.
    • Thermal capability from -40°C to +125°C.
    • Exclusive SiPh-Tools and Photonics Controller Interface (PCI) software.
    • Partnerships with Keysight and PI for precision instrumentation.
    • Easy setup and automation with Velox and Velox Dash™ interface.

     

  • Cascade CM300xi-ULN Probe System – Ultra Low Noise 300 mm Wafer Prober

    Key Features:

    • Ultra-low noise measurements with patented PureLine™ 3 technology.
    • Ideal for flicker noise (1/f), RTN, and phase noise testing of ultra-sensitive devices.
    • Fully shielded MicroChamber™ for EMI/RFI protection and frost-free low-temperature operation.
    • Plug-and-Go TestCell Power Management eliminating ground-loop noise.
    • Autonomous 24/7 operation with optimized motorized probe positioners.
    • Wide thermal range from -65°C to +300°C with fA/fF measurement precision.
    • Integrated Velox software for simple, efficient automation.

     

  • A compact and flexible semi-automated wafer probe system designed for RF/DC modeling, device characterization, and advanced measurement needs.

    Key Features:

    • Mechanical platen lift for safer RF set-ups and reduced operator errors
    • Fully compatible with Autonomous RF/DC measurement assistants and Velox Dash™ app
    • Reconfigurable platen inserts (TopHat, PCH, IceShield) for versatile test configurations
    • Spacious platen design supporting RF and DC setups with ease
    • Compact footprint with field-upgradable components
    • Integrated Low-Volume MicroChamber and FemtoGuard thermal triaxial chuck

     

  • The MCOR Magnet Corrector Bipolar Power Supply Modules are advanced 4 quadrant power supply solutions designed for precision magnet correction and high stability current control. Built with a modular architecture, the MCOR system allows flexible configuration, scalability, and easy maintenance for complex scientific and industrial applications.

    Key Features

    • 4 quadrant bipolar output current ranging from ±1 A to ±30 A
    • Modular design supports up to 16 modules in a single 6U crate
    • Mix and match different MCOR models within the same system
    • Centralized EMCOR digital controller for full system management
    • Ethernet and USB communication interfaces for remote control
    • Single bulk power supply supports the entire crate
    • Real time monitoring of output current, ripple, and fault conditions
    • Easy replacement of individual modules without system downtime
    • Designed for precision magnet correction in research environments
    • Proven performance in leading global physics laboratories

     

  • Key Features

    • Supports wafers up to 200 mm (optional 300 mm upgrade)
    • Operates at cryogenic temperatures down to 10 K
    • Semi-automated with optional full automation via autoloader
    • Compatible with liquid nitrogen, liquid helium, or cryo-cooler
    • Ice- and condensation-free probing for stable performance
    • Up to eight probe positioners or probe card integration
    • Solid vibration-isolated frame for precision measurements
    • Velox software with intuitive alignment and automation

     

  • The PCRC-7272 Precision Current Regulator Controller is a high performance solution designed to enhance the stability and accuracy of commercial off the shelf power supplies. Built in a compact 1U rackmount design, it integrates advanced regulation, monitoring, and control features for demanding laboratory and industrial environments.

    Key Features

    • Precision current regulation using external DCCT feedback
    • Compact 1U rackmount design for space efficient installation
    • Ethernet based remote control and configuration
    • Current, voltage, and ground current read-back functionality
    • Temperature and magnetic fault interlock monitoring
    • Fault detection with latching and detailed reporting
    • Compatible with leading power supply brands including Keysight, Sorensen, TDK Lambda Genesys, and Kikusui
    • Adjustable current set point and programmable ramping control
    • Auxiliary input for enhanced output monitoring capability
    • Ground fault protection for improved operational safety

     

  • Key Features

    • Entry-level manual wafer probing in vacuum < 1×10⁻⁴ mbar
    • Supports wafers up to 150 mm or single dies
    • Up to six probe positioners for flexible testing
    • Optional thermal chuck from -60°C to +300°C
    • Probing possible with open chamber lid at atmosphere
    • Stable, vibration-isolated frame for precise results
    • Ergonomic design with hinged topside lid for easy access
    • Independent control of chuck stage and positioners
    • Fast, manual step-and-repeat wafer testing

     

  • Cascade PM300 – 300 mm Analytical Probe Station

    Key Features:

    • Industry benchmark for manual wafer probing and failure analysis.
    • Superior mechanical stability with granite base for precision and repeatability.
    • High-precision probe positioning with independent X-Y coarse and fine adjustments.
    • Configurable for DC, RF, mmW, WLR, FA, and 3D IC testing.
    • Wide thermal range: -60°C to +200°C (PM300PS) / +15°C to +300°C (PM300).
    • Optional electromagnetic shielding (PM300PS) for ultra-low-noise environments.
    • Spacious, ergonomic design supporting up to 12 positioners.
    • Upgradeable platform to support future testing needs.

     

  • Cascade TESLA300 – Advanced On-Wafer Power Device Characterization

    Key Features:

    • High-voltage and high-current testing up to 10 kV / 600 A.
    • Integrated AttoGuard™ and FemtoGuard™ technology for ultra-low leakage and capacitance.
    • MicroVac™ chuck surface for thin wafer handling and low contact resistance.
    • TÜV-certified safety system with interlocks and full enclosure.
    • Top-lift wafer loading eliminates lift pins for accurate vertical device measurements.
    • Full thermal range from -60°C to +300°C with efficient transition times.
    • Seamless integration with Keysight and Keithley analyzers.
    • Remote operation capability for safe offsite control.
    • Velox and Velox Dash™ software for intuitive automation.

     

  • The Hi-Techniques FreeStyle series of Data Acquisition Systems is a versatile, capable solution for mobile and rugged data acquisition applications. FreeStyle was designed from the ground up to make data acquisition as fast and as easy as possible. Just grab your FreeStyle and your computer and head out to the test site.

    Flexibility by Design

     

  • The Hi-Techniques Synergy series of Data Acquisition Systems integrates superior transient and streaming capability with optimized time and frequency domain performance. Add in universal signal conditioning, real-time math and you’ll see why Synergy is the ultimate Data Acquisition System for all of your mechanical, electrical, acoustic, shock and vibration measurements.

     

  • The Hi-Techniques Synergy series of Data Acquisition Systems integrates superior transient and streaming capability with optimized time and frequency domain performance. Add in universal signal conditioning, real-time math and you’ll see why Synergy is the ultimate Data Acquisition System for all of your mechanical, electrical, acoustic, shock and vibration measurements.

     


Showing 17–30 of 30 results