Products

High power, High performance probe

• High power – 66 W at 2.4 GHz and 43 W at 5 GHz
• Extremely low insertion loss of ≤ 0.4 dB (typical) up to 40 GHz
• Excellent contact control and low contact resistance
• High performance on any pad material (Al or Au)
• Longest lifetime – typically one million (1,000,000) touchdowns

Excellent Performance – Longest Lifetime

• Best price per contact – typically over one million (1,000,000) touchdowns
• RF/Microwave signal is shielded and completely air isolated in the probe body
• Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
• Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
• Probe on any pad material with minimal damage

• Highest accuracy in test results
• Easy setup even for less experienced users
• Minimized coupling losses with minimal trench dimensions
• Exclusive FormFactor-developed automated test methodology
• Wide range of tools for capturing, logging and interpreting data
• Enables hands-free autonomous calibration and re-calibration at multiple temperatures
• Search First Light feature enables automated determination of initial position for optimization
• Once aligned, all calibration functions are automated and performed through SiPh-Tool

• Proven member of a modular Power Module family, more than 800 units are in service
• Precision-regulated Bi-Polar output provides up to +12 to -12 Amps for Magnet loads.
• Smooth operation through zero amps output current, no “Crossover” problems.
• All 2510 MCOR12 Power Modules are identical and interchangeable.
• Has two high-precision measurements of output current;
  • one is used to close the regulation control loop,
  • provides an independent monitoring signal to the Crate Interface Card.
• Fault sensing circuitry in the module sets a Fault Latch which inhibits the output.
• A (momentary) Sync input signal inhibits MOSFET switching when it is active (high);
  • this eliminate switching noise .
  • reduces power line noise during sensitive analog signal measurements.

• Proven member of a modular Power Module family, more than 800 units are in service
• Precision-regulated Bi-Polar output provides up to +30 to -30 Amps for Magnet loads.
• Smooth operation through zero amps output current, no “Crossover” problems.
• All 2510R30 MCOR30 Power Modules are identical and interchangeable
  • Programming Card is plugged into the replacement module.
• Each channel has a critically-damped, LC noise filter with a cut-off frequency of about 8 kHz.
• A 16-pin front panel diagnostics connector taps onto major circuit nodes which enables quick “inthe-crate” fault evaluation

• 2U Chassis – 19″ rack mount 3.48” Height, 9.60” Depth and Weight 6lb.
• Power 120V AC 60Hz
• Washable front removable air filter
• Ball Bearing AC fans provide 330 CFM
• Dual plenum design
• Cooling for 160mm,220mm depth modules
• Diverts lower warmed air to rear of Cabinet
• RM option diverts lower air to front of Cabinet

• accommodate these control schemes
• total control system interface on a single VME-standard card
• occupies the left-most slot of the crate
• monitoring voltage reference inputs, output voltages and fault conditions
• standard VMEbus-compatible 6U by 220 mm board installed
• Eurocard crate
• Two 96-pin I/O connectors

MCOR Modules

MCOR 2/6/9/12

Each module can be customized to provide maximum outputs of 2 amps, 6 amps, 9 amps, and 12 amps. Up to 16 of these can fit in a single 6U VME style crate.

MCOR 30

Each module can provide a maximum output 30 amps. Up to 8 of these can fit in a single 6U VME style crate.

• On-wafer power device characterization up to 10,000 V DC / 600 A
• Reduced probe and device destruction at high currents up to 20 A DC and 300 A pulse
• Prevent thin wafers from curling and breaking
• Accurate Rds(on) measurement at high current
• Accurate UIS measurements at high temperature
• Roll-out stage for full wafer access and easy wafer loading/unloading
• Seamless integration between Velox and analyzers/measurement software
• High-throughput wafer autoloading (standard, thinned, warped, TAIKO)
• Easy on-screen navigation, wafer mapping, and operation of accessories with Velox

Enabling single-contact high-current/high-voltage test

• Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
• Even distribution of high current with innovative multi-fingertip design
• Compatible with Tesla 200/300 mm power device characterization system
• Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
• Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
• Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)

• provides precision bi-polar output currents
• minimal zero-cross over distortion
• 19” rack mounted 6U x 220 mm crate
• crate has 17 slots; 16 (slot 0 thru 15)
• connectors
  • J1 (ExtIntlk),
  • J2 (CrateOK),
  • J3 (Input Reference Voltages),
  • J4 (Output Monitors), and
  • J9 (Bitbus)