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  • Custom configured for your application

    • Choice of Series resistance or Termination (signal line to ground)
    • Use of High Performance RF Resistors
    • Choice of Resistor values available
    • Choice of body styles, Infinity, ACP or FPC

     

  • Wafer-level electrical measurement of mmW devices and materials up to 1.1 THz

    • Low insertion loss
    • Low contact resistance
    • 140 GHz – 1.1 THz versions
    • Probe pitch as narrow as 25 μm
    • Lithographically-defined probe tip
    • Nickel contacts

     

    • Supports up to 12 VNA ports than can be mapped to four logical ports for calibration
    • Extensive guidance, wizards and management features automate calibration setup, measurement, result data conversion and report creation
    • LRRM-SOLT, multi-line TRL and second-tier calibration methods enable precision and simple multi-port calibrations
    • Automatic load inductance compensation function ensures the most repeatable calibrations
    • Easy to use Probe to ISS/CSR matching tool
    • Additional remoting methods
    • Interface with Velox™ over LAN

     

    • Easily create tasks
    • Obtain fast results
    • Adapts to the user’s needs and skills level
    • Reduces working time
    • Saves money!
    • Designed to operate with maximum intelligence
    • Automates workflows
    • Enables autonomous measurements

     

  • Robust RF Test on PCB and Ceramic

    • Replace costly and inflexible test fixtures with easy-to-use probe tips
    • Long lifetime – typically over 1,000,000 contacts
    • GS/SG footprint up to 4 GHz and GSG up to 20 GHz
    • High-power RF test: up to 30 Watts
    • Test at temperatures from -60°C to 200°C

     

  • High power, High performance probe

    • High power – 66 W at 2.4 GHz and 43 W at 5 GHz
    • Extremely low insertion loss of ≤ 0.4 dB (typical) up to 40 GHz
    • Excellent contact control and low contact resistance
    • High performance on any pad material (Al or Au)
    • Longest lifetime – typically one million (1,000,000) touchdowns

     

  • Excellent Performance – Longest Lifetime

    • Best price per contact – typically over one million (1,000,000) touchdowns
    • RF/Microwave signal is shielded and completely air isolated in the probe body
    • Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
    • Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
    • Probe on any pad material with minimal damage

     

    • Highest accuracy in test results
    • Easy setup even for less experienced users
    • Minimized coupling losses with minimal trench dimensions
    • Exclusive FormFactor-developed automated test methodology
    • Wide range of tools for capturing, logging and interpreting data
    • Enables hands-free autonomous calibration and re-calibration at multiple temperatures
    • Search First Light feature enables automated determination of initial position for optimization
    • Once aligned, all calibration functions are automated and performed through SiPh-Tool

     

  • The new G5.RSS series features

    • High control dynamics
    • An exceptional accuracy
    • A nominal output voltage of up to 3000 VDC
    • A wide current-voltage range with an auto-ranging factor of 3.
    • You get the best value for your investment.

     

    • On-wafer power device characterization up to 10,000 V DC / 600 A
    • Reduced probe and device destruction at high currents up to 20 A DC and 300 A pulse
    • Prevent thin wafers from curling and breaking
    • Accurate Rds(on) measurement at high current
    • Accurate UIS measurements at high temperature
    • Roll-out stage for full wafer access and easy wafer loading/unloading
    • Seamless integration between Velox and analyzers/measurement software
    • High-throughput wafer autoloading (standard, thinned, warped, TAIKO)
    • Easy on-screen navigation, wafer mapping, and operation of accessories with Velox
  • Enabling single-contact high-current/high-voltage test

    • Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
    • Even distribution of high current with innovative multi-fingertip design
    • Compatible with Tesla 200/300 mm power device characterization system
    • Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
    • Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
    • Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)

     

    • Frequency Range 10 Hz – 1GHz, 3GHz or 6GHz
    • 4000x faster in your pre-certifcation work
    • compact design and +12V power supply
    • 162.5 MHz full gapless real-time analysis bandwidth
    • Weighted Real-time Spectrogram

     

    • requency Range from DC up to 40 GHz
    • 685 MHz Real-time analysis bandwidth
    • Dynamic range of more than 100 dB
    • Multi-GHz real-time scanning up to 40 GHz
    • all 6dB RBWs acc. to CISPR, MIL, DO, ANSI, FCC
    • fastest super-heterodyn receiver on the planet

     

    • compact and completely modular design
    • high effectiveness in all operation modes, few requirements on building infrastructure
    • ability to use an existing liquid cooling system directly
    • optional matched liquid-to-air cooling unit TC.LAE available
    • possibility of upgrading to systems of up to 1 MVA
    • high level of system dynamics, ≤ 5 kHz modulation bandwidth
    • non-restrictive capability of refeeding in the Q4 operation mode
    • possibility of operating as an autonomous 4-Q and 3-phase quasi-analogue amplifier
    • possibility of “Hardware-in-the loop”-operation (HIL mode)
    • user friendly application software with pre-configured test patterns
    • possibility of integrating into a complete SAS simulation and test system
    • galvanic isolation available as an option without derating the simulator port data

     

  • Bidirectional (source & sink), Regenerative 0…65VDC to 0…1500VDC, 20kW up to 1.5 MW 

    • cell system nominal voltage and type of chemistry
    • number of cells
    • internal resistance and associated parameters
    • cell temperature progression
    • allowed current
    • charge efficiency
    • energy computing and management facilities
    • time-dependent and functional dependent parameters

     

    • Setting of operational parameters for each output phase: (frequency, phase, voltage, basic waveform)
    • Defining functional blocks enabling a wide variety of modulation capabilities
    • Defining, editing and storing of even complex and long test sequences
    • Preview window for output voltage waveforms
    • LC load mode, definition of complex equivalent circuits
    • Hand drawing curve tool and FOURIER tool (harmonics synthesis)
    • TC.ACS provides an extensive safety concept in order to detect unwanted or off-limit conditions very quickly and to initiate controlled limiting or even a shutdown.