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    • Easily create tasks
    • Obtain fast results
    • Adapts to the user’s needs and skills level
    • Reduces working time
    • Saves money!
    • Designed to operate with maximum intelligence
    • Automates workflows
    • Enables autonomous measurements

     

  • Robust RF Test on PCB and Ceramic

    • Replace costly and inflexible test fixtures with easy-to-use probe tips
    • Long lifetime – typically over 1,000,000 contacts
    • GS/SG footprint up to 4 GHz and GSG up to 20 GHz
    • High-power RF test: up to 30 Watts
    • Test at temperatures from -60°C to 200°C

     

  • High power, High performance probe

    • High power – 66 W at 2.4 GHz and 43 W at 5 GHz
    • Extremely low insertion loss of ≤ 0.4 dB (typical) up to 40 GHz
    • Excellent contact control and low contact resistance
    • High performance on any pad material (Al or Au)
    • Longest lifetime – typically one million (1,000,000) touchdowns

     

  • Excellent Performance – Longest Lifetime

    • Best price per contact – typically over one million (1,000,000) touchdowns
    • RF/Microwave signal is shielded and completely air isolated in the probe body
    • Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
    • Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
    • Probe on any pad material with minimal damage

     

    • Highest accuracy in test results
    • Easy setup even for less experienced users
    • Minimized coupling losses with minimal trench dimensions
    • Exclusive FormFactor-developed automated test methodology
    • Wide range of tools for capturing, logging and interpreting data
    • Enables hands-free autonomous calibration and re-calibration at multiple temperatures
    • Search First Light feature enables automated determination of initial position for optimization
    • Once aligned, all calibration functions are automated and performed through SiPh-Tool

     

    • On-wafer power device characterization up to 10,000 V DC / 600 A
    • Reduced probe and device destruction at high currents up to 20 A DC and 300 A pulse
    • Prevent thin wafers from curling and breaking
    • Accurate Rds(on) measurement at high current
    • Accurate UIS measurements at high temperature
    • Roll-out stage for full wafer access and easy wafer loading/unloading
    • Seamless integration between Velox and analyzers/measurement software
    • High-throughput wafer autoloading (standard, thinned, warped, TAIKO)
    • Easy on-screen navigation, wafer mapping, and operation of accessories with Velox
  • Enabling single-contact high-current/high-voltage test

    • Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
    • Even distribution of high current with innovative multi-fingertip design
    • Compatible with Tesla 200/300 mm power device characterization system
    • Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
    • Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
    • Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)

     

  • Rugged, 4-Port, High-Powered USB Hub

    • Ultra low noise for optimal performance of audio and video recording equipment
    • Durable cast-aluminum housing suitable for the most rugged environments
    • Oversized power source guaranteed to support current intensive USB peripherals on all 4 ports simultaneously
    • DVM probe port access for monitoring USB device load current on port 1
    • AC/DC wall adapter and USB host cable provided

     

  • 1 – 12 GHz Programmable Phase Shifters

    • USB powered and controlled

    • Includes easy to install and use GUI

    • 360 degree phase control in 1 degree increments

    • Calibrated performance for optimal accuracy

    • Phase profile upload capability

    • API DLL and example programs included

    pdf

    Data Sheets

     

  • DC – 20 GHz Programmable Digital Attenuators

    • Input power to 2 Watts

    • USB powered and controlled

    • Includes easy to install and use GUI

    • Programmable attenuation ramp

    • Operate multiple devices directly from a PC or self powered USB hub

    • Easily programmable for ATE applications

    pdf

    Data Sheets

  • 0.5-20 GHz, High Performance Programmable Signal Generators

    USB powered and controlled

    • Includes easy to install and use GUI

    • Fast switching to 20 GHz

    • Selectable internal/external 10 MHz reference

    • Phase continuous frequency sweep (LFM)

    • High-speed internal and external pulse modulation

    • Autonomous operation from USB hub or battery pack

    • Robust aluminum construction

    • API DLL and LabVIEW compatible drivers available

     

  • 20 MHz to 6 GHz Programmable Signal Generators

    • USB powered and controlled
    • Includes easy-to-install-and-use GUI
    • Programmable frequency stepping
    • Operate multiple devices directly from a PC or self-powered USB hub
    • Autonomous operation from USB hub or battery pack
    • Easily programmable for ATE applications
    • Robust aluminum construction
    • Customization available for unique requirements
    • API DLL and LabVIEW compatible drivers available
    pdf

    Download Data Sheeet

     

    • SPDT and SP4T models available
    • 10 Watt power handling capability
    • USB powered and controlled
    • Includes easy to install and use GUI
    • Manual, Internal and External switch control capability
    • Operate multiple devices directly from a PC or self powered USB hub
    • Easily programmable for ATE applications
    • Robust aluminum construction
    Lab Brick® LSW Series Switch pdf

    Data Sheets