Products

Cascade SUMMIT200 Advanced 200 mm Probe Station

Key Features:

• High-accuracy electrical measurements for DC, RF, mmW, and THz applications.
• Up to 5X faster time to accurate data with automated wafer handling.
• Wide thermal range from -60°C to +300°C with IceShield™.
• PureLine™, AttoGuard®, and MicroChamber® technologies for ultra-low noise performance.
• Precision sub-micron positioning with advanced 4-axis stage and VueTrack PRO.
• Flexible platform for device characterization, FA, WLR, and design debug.
• Velox control software with modern UI, workflow guide, and automation tools.
• Ergonomic operation with quick manual wafer access and roll-out stage.

Cascade TESLA300 is a 300 mm semi- and fully-automated probe system for advanced on-wafer power device characterization, ensuring safe, precise, and high-power testing.

Key Features:

• On-wafer device testing up to 10,000 V DC / 600 A
• AttoGuard™ and FemtoGuard™ chuck technologies for low-leakage, high-accuracy measurements
• MicroVac™ chuck ensures thin wafer stability and minimal contact resistance
• TÜV-certified safety system with full enclosure and interlocks
• Wide thermal range: -60°C to +300°C with TopHat chamber
• Roll-out chuck and auxiliary mounts for flexible wafer handling
• Remote operation and full software integration with Velox and analyzers
• Material Handling Unit (MHU301) for automated wafer loading and barcode recognition

Cascade CM300xi-SiPh Probe System – 300 mm Wafer and Die-Level Photonics Testing

Key Features:

• Integrated silicon photonics wafer and die-level probing solution.
• Autonomous SiPh Measurement Assistant for hands-free calibration.
• OptoVue™ technology for real-time, in-situ optical calibrations.
• Supports vertical, horizontal edge, and wafer-level edge coupling.
• Dark, shielded, frost-free environment with SiPh TopHat.
• Thermal capability from -40°C to +125°C.
• Exclusive SiPh-Tools and Photonics Controller Interface (PCI) software.
• Partnerships with Keysight and PI for precision instrumentation.
• Easy setup and automation with Velox and Velox Dash™ interface.

Cascade CM300xi-ULN Probe System – Ultra Low Noise 300 mm Wafer Prober

Key Features:

• Ultra-low noise measurements with patented PureLine™ 3 technology.
• Ideal for flicker noise (1/f), RTN, and phase noise testing of ultra-sensitive devices.
• Fully shielded MicroChamber™ for EMI/RFI protection and frost-free low-temperature operation.
• Plug-and-Go TestCell Power Management eliminating ground-loop noise.
• Autonomous 24/7 operation with optimized motorized probe positioners.
• Wide thermal range from -65°C to +300°C with fA/fF measurement precision.
• Integrated Velox software for simple, efficient automation.

A compact and flexible semi-automated wafer probe system designed for RF/DC modeling, device characterization, and advanced measurement needs.

Key Features:

• Mechanical platen lift for safer RF set-ups and reduced operator errors
• Fully compatible with Autonomous RF/DC measurement assistants and Velox Dash™ app
• Reconfigurable platen inserts (TopHat, PCH, IceShield) for versatile test configurations
• Spacious platen design supporting RF and DC setups with ease
• Compact footprint with field-upgradable components
• Integrated Low-Volume MicroChamber and FemtoGuard thermal triaxial chuck

Key Features

• Supports wafers up to 200 mm (optional 300 mm upgrade)
• Operates at cryogenic temperatures down to 10 K
• Semi-automated with optional full automation via autoloader
• Compatible with liquid nitrogen, liquid helium, or cryo-cooler
• Ice- and condensation-free probing for stable performance
• Up to eight probe positioners or probe card integration
• Solid vibration-isolated frame for precision measurements
• Velox software with intuitive alignment and automation

Key Features

• Entry-level manual wafer probing in vacuum < 1×10⁻⁴ mbar
• Supports wafers up to 150 mm or single dies
• Up to six probe positioners for flexible testing
• Optional thermal chuck from -60°C to +300°C
• Probing possible with open chamber lid at atmosphere
• Stable, vibration-isolated frame for precise results
• Ergonomic design with hinged topside lid for easy access
• Independent control of chuck stage and positioners
• Fast, manual step-and-repeat wafer testing

Cascade PM300 – 300 mm Analytical Probe Station

Key Features:

• Industry benchmark for manual wafer probing and failure analysis.
• Superior mechanical stability with granite base for precision and repeatability.
• High-precision probe positioning with independent X-Y coarse and fine adjustments.
• Configurable for DC, RF, mmW, WLR, FA, and 3D IC testing.
• Wide thermal range: -60°C to +200°C (PM300PS) / +15°C to +300°C (PM300).
• Optional electromagnetic shielding (PM300PS) for ultra-low-noise environments.
• Spacious, ergonomic design supporting up to 12 positioners.
• Upgradeable platform to support future testing needs.

Cascade TESLA300 – Advanced On-Wafer Power Device Characterization

Key Features:

• High-voltage and high-current testing up to 10 kV / 600 A.
• Integrated AttoGuard™ and FemtoGuard™ technology for ultra-low leakage and capacitance.
• MicroVac™ chuck surface for thin wafer handling and low contact resistance.
• TÜV-certified safety system with interlocks and full enclosure.
• Top-lift wafer loading eliminates lift pins for accurate vertical device measurements.
• Full thermal range from -60°C to +300°C with efficient transition times.
• Seamless integration with Keysight and Keithley analyzers.
• Remote operation capability for safe offsite control.
• Velox and Velox Dash™ software for intuitive automation.

The new G5.RSS series features

• High control dynamics
• An exceptional accuracy
• A nominal output voltage of up to 3000 VDC
• A wide current-voltage range with an auto-ranging factor of 3.
• You get the best value for your investment.

The Hi-Techniques FreeStyle series of Data Acquisition Systems is a versatile, capable solution for mobile and rugged data acquisition applications. FreeStyle was designed from the ground up to make data acquisition as fast and as easy as possible. Just grab your FreeStyle and your computer and head out to the test site.

Flexibility by Design

The Hi-Techniques Synergy series of Data Acquisition Systems integrates superior transient and streaming capability with optimized time and frequency domain performance. Add in universal signal conditioning, real-time math and you’ll see why Synergy is the ultimate Data Acquisition System for all of your mechanical, electrical, acoustic, shock and vibration measurements.

• Independent High Resolution Digitizers
• Up to 1 MS/s per Channel Streaming
• Remote Control, Display and Storage
• Mix and Match Input Modules
• Multiple Instrument Synchronization
• Unparalleled Analysis Capability
• Over 100 Built-in Analysis Functions
• Full Custom Analysis Capability

The Hi-Techniques Synergy series of Data Acquisition Systems integrates superior transient and streaming capability with optimized time and frequency domain performance. Add in universal signal conditioning, real-time math and you’ll see why Synergy is the ultimate Data Acquisition System for all of your mechanical, electrical, acoustic, shock and vibration measurements.

• compact and completely modular design
• high effectiveness in all operation modes, few requirements on building infrastructure
• ability to use an existing liquid cooling system directly
• optional matched liquid-to-air cooling unit TC.LAE available
• possibility of upgrading to systems of up to 1 MVA
• high level of system dynamics, ≤ 5 kHz modulation bandwidth
• non-restrictive capability of refeeding in the Q4 operation mode
• possibility of operating as an autonomous 4-Q and 3-phase quasi-analogue amplifier
• possibility of “Hardware-in-the loop”-operation (HIL mode)
• user friendly application software with pre-configured test patterns
• possibility of integrating into a complete SAS simulation and test system
• galvanic isolation available as an option without derating the simulator port data

Bidirectional (source & sink), Regenerative 0…65VDC to 0…1500VDC, 20kW up to 1.5 MW 

• cell system nominal voltage and type of chemistry
• number of cells
• internal resistance and associated parameters
• cell temperature progression
• allowed current
• charge efficiency
• energy computing and management facilities
• time-dependent and functional dependent parameters