Products

Excellent Performance – Longest Lifetime

• Best price per contact – typically over one million (1,000,000) touchdowns
• RF/Microwave signal is shielded and completely air isolated in the probe body
• Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
• Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
• Probe on any pad material with minimal damage

• Highest accuracy in test results
• Easy setup even for less experienced users
• Minimized coupling losses with minimal trench dimensions
• Exclusive FormFactor-developed automated test methodology
• Wide range of tools for capturing, logging and interpreting data
• Enables hands-free autonomous calibration and re-calibration at multiple temperatures
• Search First Light feature enables automated determination of initial position for optimization
• Once aligned, all calibration functions are automated and performed through SiPh-Tool

• On-wafer power device characterization up to 10,000 V DC / 600 A
• Reduced probe and device destruction at high currents up to 20 A DC and 300 A pulse
• Prevent thin wafers from curling and breaking
• Accurate Rds(on) measurement at high current
• Accurate UIS measurements at high temperature
• Roll-out stage for full wafer access and easy wafer loading/unloading
• Seamless integration between Velox and analyzers/measurement software
• High-throughput wafer autoloading (standard, thinned, warped, TAIKO)
• Easy on-screen navigation, wafer mapping, and operation of accessories with Velox

Enabling single-contact high-current/high-voltage test

• Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
• Even distribution of high current with innovative multi-fingertip design
• Compatible with Tesla 200/300 mm power device characterization system
• Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
• Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
• Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)

• Dynamic set up: During a simple frame reading, users can define elements to be acquired, recorded, visualized and surveyed in real time.
•  Macro-command: Users can write and execute complex test sequences thanks to macro-command functions.
•  Local & Distant Integration: AT-DIAG can be driven and interrogated by external software. It can also be used with a computer through Ethernet.
• Communication ports: Communication is done through RS232, NI CAN acq. Card, specific acquisition card or system.
•  Protocols: FREERUNNING, KWP2000, CAN, LIN, FlexRay, ARINC, … Possibility to implement new protocols (customized protocol, …).
•  Multi-product & Multi-protocol Communication: Communication can be set up with multiple addresses and protocols during a single test.

• 1 software for all your equipment
• 1 software for all standards
• 1 software for your electrical and EMC tests
• Advanced functions of monitoring and control
• Automated reports
• Team of specialists at your disposal

• Fast: ACA compression and parallelization allow to speed up the calculation
• Accurate: Fully validated with measurement results on real mock-up
• Innovative: New method from research labs
• Powerful: Compute very large models
• Easy: Dedicated graphical user interface with modern layout

• Fast: ACA compression and parallelization allow to speed up the calculation
• Accurate: Fully validated with measurement results on real mock-up
• Innovative: New method from research labs
• Powerful: Compute very large models
• Easy: Dedicated graphical user interface with modern layout

• Unique user interface for all tests
• Independent from any measuring device manufacturers
• Free drivers and over 500 supported devices
• Efficient and dedicated Technical support
• Wide range of supported standards (ENxx, CISPR, AUTOMOTIVE, DO160, …)
• Interface Agilent VEE™, WindowsLabView™, LabWindows CVI™, Visual C++
• Operating system: Win XP, Vista, Seven, Windows 8
• Report in MS Office™ 2003, 2007, 2010, 2013, Open office