1 800 665 7301 | info@tmetrix.com

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200mm Probe Systems

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    • Re-configurable for DC, RF, mmW, FA, WLR and more
    • table and repeatable measurements over a wide thermal range
    • Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
    • Minimize AC and spectral noise
    • Manual 3-axis stage with ergonomic controls
    • Fast, accurate “hands on” wafer positioning
    • Quick, safe, and comfortable wafer access

     

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    • Comfortable and ergonomic operation
    • Thermal range ambient to +300°C
    • RF/microwave device characterization, FA and design debug
    • Seamless integration between Velox and analyzers/measurement software
    • Complete solutions using probe positioners and probe cards
    • Achieve unsurpassed RF/mmW measurement and calibration accuracy with integrated RF tools and WinCal
    • Shortest signal path test integration for accurate, thermally stable, and low-error data collection
    • Powerful automation tools, reduce total test time on wafers, singulated dies, and modules
    • Faster time to first data for standard and “hard to test” devices such as thin wafer, small pad and high power
    • Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact

     

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    • SlimVue Microscope
      • Combined eye-pieces and CCD camera mount
      • 3x zoom and quick lens exchange
      • Quick lens exchange
      • 1 um optical resolution
      • Minimized scope footprin
    • Application Specific Sigma Kits
      • Optical feedback on platen position (gauge)
      • Adaptable to any mmW/sub-THz applications
      • Seamless integration with any mmW modules and tuners
      • Fast mounting and setup change
    • THz measurement capability
      • Rock-solid mechanical design
      • Submicron stage accuracy
      • Optical feedback on platen and probe position (gauge)
      • Motorized positioner

     

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    • Three Probe Technologies
      • nfinity Probe: best for Al (Si)
      • ACP Probe: best for AU (III-Vs)
      • |Z| Probe: robust solution (long lifetime)
    • Precise Contact Solution
      •  Precision probe alignment
      • Consistent contact force and overtravel
      • Stable contact performance
    • WinCal XE Calibration Software
      • Exclusive 1-, 2-, 3-, and 4-port on-wafer calibration algorithms
      • Automated calibration monitoring
      • Unique measurement & analysis methods

     

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  • 200 mm semi-/ fully-automated production probe system

    • Up to 20 dies/sec (70,000 dies/hour) with MultiDie Testing technology
    • Faster time to data
    • Highest Z-axis resolution of any production prober
    • Highest Z-axis resolution of any production prober
    • Interfaces to all major analysis instrumentation, optics software and testers
    • Backside instrumentation, e.g.: Integrating Sphere, Fiber setup, Pressure Module
    • Highly accurate light measurement

     

     

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    • Superior Mechanics
      • Highly stable granite base
      • Excellent measurement accuracy and repeatability
    • High Flexibility
      • Re-configurable for DC, RF, mmW, FA, WLR and more
      • 40 mm platen height adjustability
      • Fast transition between wafer and package test
    • Ease of use
      •  Low-profile, straightforward design
      • Easy and ergonomic operation
    • Double-side option
      • Front or backside probing capability
      • Access to top side and bottom side of device under test (DUT)

     

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Contact ACA TMetrix Inc.

Address

3585 Laird Road, Unit 15 & 16, Mississauga ON L5L 5Z8

Phone: 1-800-665-7301

Fax: 1-905-890-1959

Email: info@tmetrix.com

About ACA TMetrix Inc.

ACA TMetrix Inc. is a leading supplier of test instruments and design tools in Canada. For over 50 years we have provided services and support for products that are manufactured by the world's leading instrument suppliers.

TMetrix Ltd. is Part of the ACA Group of Companies. Allan Crawford Associates (ACA), is one of Canada's largest distributors of electronic components, test equipment, and scientific solutions.

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