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  • High power, High performance probe

    • High power – 66 W at 2.4 GHz and 43 W at 5 GHz
    • Extremely low insertion loss of ≤ 0.4 dB (typical) up to 40 GHz
    • Excellent contact control and low contact resistance
    • High performance on any pad material (Al or Au)
    • Longest lifetime – typically one million (1,000,000) touchdowns

     

  • Excellent Performance – Longest Lifetime

    • Best price per contact – typically over one million (1,000,000) touchdowns
    • RF/Microwave signal is shielded and completely air isolated in the probe body
    • Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
    • Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
    • Probe on any pad material with minimal damage

     

    • Highest accuracy in test results
    • Easy setup even for less experienced users
    • Minimized coupling losses with minimal trench dimensions
    • Exclusive FormFactor-developed automated test methodology
    • Wide range of tools for capturing, logging and interpreting data
    • Enables hands-free autonomous calibration and re-calibration at multiple temperatures
    • Search First Light feature enables automated determination of initial position for optimization
    • Once aligned, all calibration functions are automated and performed through SiPh-Tool

     

    • On-wafer power device characterization up to 10,000 V DC / 600 A
    • Reduced probe and device destruction at high currents up to 20 A DC and 300 A pulse
    • Prevent thin wafers from curling and breaking
    • Accurate Rds(on) measurement at high current
    • Accurate UIS measurements at high temperature
    • Roll-out stage for full wafer access and easy wafer loading/unloading
    • Seamless integration between Velox and analyzers/measurement software
    • High-throughput wafer autoloading (standard, thinned, warped, TAIKO)
    • Easy on-screen navigation, wafer mapping, and operation of accessories with Velox
  • Enabling single-contact high-current/high-voltage test

    • Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
    • Even distribution of high current with innovative multi-fingertip design
    • Compatible with Tesla 200/300 mm power device characterization system
    • Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
    • Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
    • Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)

     

  • High‐Resolution Portable TDR with Frequency‐Domain Analysis Tools

    Ideal for testing all types of microwave/RF and digital cables and connectors

    • Rugged portable TDR with S‐parameter tools
    • Resolves connector detail (<1 cm)
    • 75 μm (0.003 in.) cursor resolution
    • 16‐bit digital sampling at up to 250 KSPS
    • Stores thousands of TDR traces
    • USB host/client, 10/100 Ethernet
    • Lightweight, bright color screen
    • Internet streaming and remote control

     

  • Simplify Aging Aircraft Wiring Maintenance Using High-Resolution MOHR CT100 Series TDR Cable Analyzers

    • Designed for use with the high-resolution CT100 TDR Cable Tester
    • Ideal for TDR testing MIL-STD-1553B data bus aerospace cable assemblies
    • Detect and localize open, short, and partial cable and connector faults on the main bus and stubs
    • Detects cable and connector faults through 3+ transformer couplers
    • Simplifies troubleshooting of aging aircraft MIL-STD-1553 cable assemblies

     

    • 16K Video Generator & Analyzer
    • Dolby Vision™, HDR 10 and HDR 10+
    • validating DP 1.4a & DP 2.0 Link Layer on DP Sinks and Sources
    • Power Input +12 Vdc (AC/DC converter included)
    • Module Size/Weight TBD for Weight and Size

     
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    • Compact sized DisplayPort™ 1.2 compliant Reference Sink
    • HBR2 and MST capable Sink and Branch device
    • Cerified as the platform for DP 1.2 LL CTS Ext1 tests
    • Optional MST Debug panel and AUX Channel Monitor
    • Debug and Test Controller GUI enables monitoring and previewing any MST stream
    • User programmable EDID and DPCD

     

    •  HDMI 2.1 Test Equipment (FRL)
    • Enhanced Gaming Features (VRR, ALLM)
    • FEC, Forward Error Correction
    • HDCP 2.2 & HDCP 2.3 support  TMDS Support
    • Dolby Vision™ Test Tool
    • 8K@60 fps Support (12 Gbps/channel)
    • eARC Support (end of 2019)
    • DSC Support (ESTIMATED 2020)
    • UCD Console GUI for debugging
    • High level API for easy integreation

     

    • Automated tests for USB-C™ DisplayPort™ Alt Mode
    • Electrical Test to verify whole USB-C connector with single cable insert
    • Test USB 2.0 and USB 3.0
    • 4K@60 support
    • Easily set test parameters with provided Software
    • Easily run tests from the commandline
    • Unigraf’s Test System Interface (TSI) Support
    • Third Part Test Management Software
    • Support e.g. NI TestStand Support

     

    • UHD / 4K compliant test equipment
    • HDMI 2.0 and DP 1.2 input and output in one unit
    • DCP Approved HDCP 2.3 CTS Test Tool
    • HDCP 1.3 and HDCP 2.3 support
    • Sink and source video, audio and configuration parameters
    • USB 3.0 connected
    • UCD Console GUI for debugging
    • High level API for easy integration

     

    • Test DP over USB-C video and audio
    • Test USB-C Power Delivery with DP Alt Mode
    • DCP Apporved HDCP 2.3 CTS Tests
    • Verify interface signal continuity
    • 4K@60 support
    • HDCP 1.3 and HDCP 2.3 support
    • Capture video and audio, monitor and control interface parameters
    • USB signal pass-thru
    • UCD Console GUI for debugging
    • High level API for easy integration

     

     

    • VESA Certified DP 1.4 Link Layer CTS Test Tool
    • DCP Approved HDCP 2.3 CTS Tool
    • 8K and 4K Reference Sink, Source & Repeater
    • DP 1.4 / HBR3 input and output in one unit
    • USB-C input and output with supplied converter cable
    • MST support (4 streams)
    • DSC Sink, FEC and LTTPR support
    • HDCP 1.3 and HDCP 2.3 support
    • High level API for easy integration

     

  • USB-C DisplayPort Alt Mode Test Unit DP 1.4a, HBR3 & PD 3.0

    • 8K and 4K Reference Sink & Source
    • DP 1.4a Link Layer CTS for Sinks & Sources
    • HDCP 2.3 CTS for Transmitters & Receivers
    • DP 1.4a features:
      * Up to HBR3 simultaneous input and output in one unit
      * DSC Sink & Source with off-line encoding and decoding
      * FEC and LTTPR support
      * MST support (4 streams)
    • USB-C v1.3 with Power Delivery 3.0
      * DP Alt Mode
      * Capable to sink & source 9V@3A
      * PD Role swaps supported
    • USB3.2Gen2 (10Gbit/s) bypass between test interfaces
    • HDCP 1.3 and HDCP 2.3 support

     

  • Next-gen Time-Domain Reflectometers replace the Tektronix® 1502C

    The new CT100 and CT100HF are the industry’s highest-resolution portable metallic TDRs, designed for testing all coaxial and twisted-pair cables and interconnects used in modern microwave/RF and digital systems. These are the only portable instruments that exceed all TDR specifications of the Tektronix® 1502C Metallic TDR Cable Tester, while providing next-generation improvements in TDR analysis, data storage, connectivity, and ergonomics.

    CT100 Series TDRs feature 8-10x sharper spatial resolution and100-1000x better Distance-to-Fault (DTF) resolution than competing TDR instruments, and have multi-GHz bandwidth similar to competing FDR (Frequency-Domain Reflectometer) instruments with similar or better cable fault sensitivity andorders-of-magnitude better DTF precision.

    These instruments’ unique combination of fast system rise-time,high-resolution time-base, and precision 16-bit impedance measurements allow you to identify and correct subtle changes in cable and connector performance before system failure. Some of the CT100 Series’ innovative features are described below. Also, please read CT100 Series Features for more information.