Discount Products: Look through products available for a 25% – 50% discount in 2020. The items provided on a first come, first serve basis.
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DC Multicontact

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  • Multi-contact DC Probe with flat tip needles

    • Power bypass inductance: 8 nH
    • Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil.
    • Supports collinear and non-standard needle configurations
    • Up to 16 DC for standard; maximum of 24 DC for custom
    • Ideal for probing the entire circuit for functional test
    • DC probes can provide power or slow logic to circuit under test

     

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  • Multi-contact DC Probe with full-radius needles

    • Full-radius, nickel-plated tungsten needles
    • Power bypass inductance: 16 nH
    • Supports collinear and non-standard needle configurations
    • Support up to a maximum of 12 ceramic blades DC needles / contacts
    • Ideal for probing the entire circuit for functional test
    • DC probes can provide power or slow logic to circuit under test

     

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  • Durable multi-contact wafer probe with controlled impedance power bypass technology

    • High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz
    • RF bandwidth to 500 MHz
    • Long probe life: > 250,000 contacts
    • Beryllium-copper tips for gold pads or tungsten for aluminum pads
    • Oscillation-free testing of wide-bandwidth analog circuits
    • Use with ACP series probes to provide functional at-speed testing for known-good-die
    • Mix multiple contact types: Ground, Power (Standard or Eye-Pass), Logic/Signal
    • Low and repeatable contact resistance on aluminum pads ( < 0.25 Ω on Al, < 0.01 Ω on Au)

     

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