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  • High power, High performance probe

    • High power – 66 W at 2.4 GHz and 43 W at 5 GHz
    • Extremely low insertion loss of ≤ 0.4 dB (typical) up to 40 GHz
    • Excellent contact control and low contact resistance
    • High performance on any pad material (Al or Au)
    • Longest lifetime – typically one million (1,000,000) touchdowns

     

  • Excellent Performance – Longest Lifetime

    • Best price per contact – typically over one million (1,000,000) touchdowns
    • RF/Microwave signal is shielded and completely air isolated in the probe body
    • Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
    • Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
    • Probe on any pad material with minimal damage

     

    • Highest accuracy in test results
    • Easy setup even for less experienced users
    • Minimized coupling losses with minimal trench dimensions
    • Exclusive FormFactor-developed automated test methodology
    • Wide range of tools for capturing, logging and interpreting data
    • Enables hands-free autonomous calibration and re-calibration at multiple temperatures
    • Search First Light feature enables automated determination of initial position for optimization
    • Once aligned, all calibration functions are automated and performed through SiPh-Tool

     

  • The new G5.RSS series features

    • High control dynamics
    • An exceptional accuracy
    • A nominal output voltage of up to 3000 VDC
    • A wide current-voltage range with an auto-ranging factor of 3.
    • You get the best value for your investment.

     

    • On-wafer power device characterization up to 10,000 V DC / 600 A
    • Reduced probe and device destruction at high currents up to 20 A DC and 300 A pulse
    • Prevent thin wafers from curling and breaking
    • Accurate Rds(on) measurement at high current
    • Accurate UIS measurements at high temperature
    • Roll-out stage for full wafer access and easy wafer loading/unloading
    • Seamless integration between Velox and analyzers/measurement software
    • High-throughput wafer autoloading (standard, thinned, warped, TAIKO)
    • Easy on-screen navigation, wafer mapping, and operation of accessories with Velox
  • Enabling single-contact high-current/high-voltage test

    • Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
    • Even distribution of high current with innovative multi-fingertip design
    • Compatible with Tesla 200/300 mm power device characterization system
    • Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
    • Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
    • Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)

     

  • High‐Resolution Portable TDR with Frequency‐Domain Analysis Tools

    Ideal for testing all types of microwave/RF and digital cables and connectors

    • Rugged portable TDR with S‐parameter tools
    • Resolves connector detail (<1 cm)
    • 75 μm (0.003 in.) cursor resolution
    • 16‐bit digital sampling at up to 250 KSPS
    • Stores thousands of TDR traces
    • USB host/client, 10/100 Ethernet
    • Lightweight, bright color screen
    • Internet streaming and remote control

     

  • Simplify Aging Aircraft Wiring Maintenance Using High-Resolution MOHR CT100 Series TDR Cable Analyzers

    • Designed for use with the high-resolution CT100 TDR Cable Tester
    • Ideal for TDR testing MIL-STD-1553B data bus aerospace cable assemblies
    • Detect and localize open, short, and partial cable and connector faults on the main bus and stubs
    • Detects cable and connector faults through 3+ transformer couplers
    • Simplifies troubleshooting of aging aircraft MIL-STD-1553 cable assemblies

     

    • compact and completely modular design
    • high effectiveness in all operation modes, few requirements on building infrastructure
    • ability to use an existing liquid cooling system directly
    • optional matched liquid-to-air cooling unit TC.LAE available
    • possibility of upgrading to systems of up to 1 MVA
    • high level of system dynamics, ≤ 5 kHz modulation bandwidth
    • non-restrictive capability of refeeding in the Q4 operation mode
    • possibility of operating as an autonomous 4-Q and 3-phase quasi-analogue amplifier
    • possibility of “Hardware-in-the loop”-operation (HIL mode)
    • user friendly application software with pre-configured test patterns
    • possibility of integrating into a complete SAS simulation and test system
    • galvanic isolation available as an option without derating the simulator port data

     

  • Bidirectional (source & sink), Regenerative 0…65VDC to 0…1500VDC, 20kW up to 1.5 MW 

    • cell system nominal voltage and type of chemistry
    • number of cells
    • internal resistance and associated parameters
    • cell temperature progression
    • allowed current
    • charge efficiency
    • energy computing and management facilities
    • time-dependent and functional dependent parameters

     

    • Setting of operational parameters for each output phase: (frequency, phase, voltage, basic waveform)
    • Defining functional blocks enabling a wide variety of modulation capabilities
    • Defining, editing and storing of even complex and long test sequences
    • Preview window for output voltage waveforms
    • LC load mode, definition of complex equivalent circuits
    • Hand drawing curve tool and FOURIER tool (harmonics synthesis)
    • TC.ACS provides an extensive safety concept in order to detect unwanted or off-limit conditions very quickly and to initiate controlled limiting or even a shutdown.

     

    • compact and completely modular design
    • high effectiveness in all operation modes, few requirements on building infrastructure
    • ability to use an existing liquid cooling system directly
    • optional matched liquid-to-air cooling unit TC.LAE available
    • possibility of upgrading to systems of up to 1 MVA
    • high level of system dynamics, ≤ 5 kHz modulation bandwidth
    • non-restrictive capability of refeeding in the Q4 operation mode
    • possibility of operating as an autonomous 4-Q and 3-phase quasi-analogue amplifier
    • possibility of “Hardware-in-the loop”-operation (HIL mode)
    • user friendly application software with pre-configured test patterns
    • possibility of integrating into a complete SAS simulation and test system
    • galvanic isolation available as an option without derating the simulator port data

     

  • Photovoltaic applications, the quality and technical data of the AC-DC converter is of primary interest. Solar installations are intended for a lifetime of roughly 20 years, therefore even fractions of a percent in efficiency will represent significant amounts of energy losses.

  • Programmable Grid-tie Sink High-Power DC Supply,

  • Programmable Grid-tie Source & Sink Technology
    Wide range of power 20 to 512 kW, expandable up to several MW
    DC output voltages from 0-65 VDC up to 0-1500 VDC, +/- 40 A up to +/- 600 A

  • Next-gen Time-Domain Reflectometers replace the Tektronix® 1502C

    The new CT100 and CT100HF are the industry’s highest-resolution portable metallic TDRs, designed for testing all coaxial and twisted-pair cables and interconnects used in modern microwave/RF and digital systems. These are the only portable instruments that exceed all TDR specifications of the Tektronix® 1502C Metallic TDR Cable Tester, while providing next-generation improvements in TDR analysis, data storage, connectivity, and ergonomics.

    CT100 Series TDRs feature 8-10x sharper spatial resolution and100-1000x better Distance-to-Fault (DTF) resolution than competing TDR instruments, and have multi-GHz bandwidth similar to competing FDR (Frequency-Domain Reflectometer) instruments with similar or better cable fault sensitivity andorders-of-magnitude better DTF precision.

    These instruments’ unique combination of fast system rise-time,high-resolution time-base, and precision 16-bit impedance measurements allow you to identify and correct subtle changes in cable and connector performance before system failure. Some of the CT100 Series’ innovative features are described below. Also, please read CT100 Series Features for more information.