Products

TMetrix carries the following test and measurement products:

Showing 49–64 of 319 results


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    Contact Intelligence

    • Ease of use –  Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
    • Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
    • Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.

     

     

    • Highest accuracy with backlash-free positioning
    • Drift-free measurements over temperature and time*
    • Easy, and safe swapping between arms
    • Best signal integrity using optimized probe cabling systems
    • Full thermal capability*
    • Manual or progammable

     

    • Ease of use –  Less experienced operators can perform an RF calibration up to 330 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
    • Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
    • Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
    • Calibration Monitor and Re-calibration – System will continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.

     

    • Comprehensive,
    • Turn-key Integrated Measurement System (IMS)
    • with Keysight PNA for On-wafer R&D Measurements
    • from RF to millimeter wave to Terahertz

     

  • Accurate and precise measurement of device parameters up to 3,000 V

    • Coaxial and triaxial measurements up to 3,000 V
    • High-quality construction with low-noise electrical performance
    • Replaceable probe tips in a variety of tip sizes
    • Temperature range of -55 to 300ºC
    • Triaxial measurement ensures a much better understanding of device leakage in the off state
    • Highly reliable, stable and repeatable measurements
    • Integrally designed as part of a complete measurement solution

     

  • Delivers superior guarding and shielding

    • High-quality construction with low-noise electrical performance
    • Kelvin version for convenient 4-point measurements
    • Replaceable coaxial probe tips, with choice of tip radii, and full electrical guard to the probe tip
    • SSMC 50 connectors
    • Ultra-low, fA and fF measurements from -65 º C to 150 º C

     

    • Light-tight version and EMI-shielded version for low noise and light-sensitive measurements
    • Application flexibility, ideal for use in high frequency applications
    • Sized to accommodate thermal chucks, laser cutter, and video equipment on the probe system
    • Suitable for integration with vibration isolating tables

     

    • Functional temperature range of -263 to +150°C
    • Stainless steel tip material for thermal decoupling
    • Coaxial cable with TCE matched inner and outer conductors
    • Consistent tip geometry even at cryogenic temperatures

     

  • High-performance DC Parametric Probe

    • Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
    • Guarantees fully-guarded measurements to fA and fF levels
    • Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
    • Allows probing of different pad materials and sizes
    • Fast replacement of worn probes without the need for tools

     

  • Multi-contact DC Probe with flat tip needles

    • Power bypass inductance: 8 nH
    • Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil.
    • Supports collinear and non-standard needle configurations
    • Up to 16 DC for standard; maximum of 24 DC for custom
    • Ideal for probing the entire circuit for functional test
    • DC probes can provide power or slow logic to circuit under test

     

  • Tables from simple to highly sensitive

    • Designed for use with specific Probe Systems
    • Tables to suit all facility requirements and applications
    • Stable probing, even in submicron range
    • Granite platen ensures rigidity and temperature stability
    • Can be combined with the Shield Enclosures

     

  • Multi-contact DC Probe with full-radius needles

    • Full-radius, nickel-plated tungsten needles
    • Power bypass inductance: 16 nH
    • Supports collinear and non-standard needle configurations
    • Support up to a maximum of 12 ceramic blades DC needles / contacts
    • Ideal for probing the entire circuit for functional test
    • DC probes can provide power or slow logic to circuit under test

     

  • Rugged, deep reach RF probing for modules and circuit boards

    • DC-40 GHz bandwidth
    • 10 ps rise time
    • Low insertion and return loss
    • 2 mils of tip-to-tip compliance
    • High probing angle and clearance

     

  • Perfectly matched to the |Z| Probe®

    The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.

     

     

    • SlimVue Microscope
      • Combined eye-pieces and CCD camera mount
      • 3x zoom and quick lens exchange
      • Quick lens exchange
      • 1 um optical resolution
      • Minimized scope footprin
    • Application Specific Sigma Kits
      • Optical feedback on platen position (gauge)
      • Adaptable to any mmW/sub-THz applications
      • Seamless integration with any mmW modules and tuners
      • Fast mounting and setup change
    • THz measurement capability
      • Rock-solid mechanical design
      • Submicron stage accuracy
      • Optical feedback on platen and probe position (gauge)
      • Motorized positioner

     

  • Durable multi-contact wafer probe with controlled impedance power bypass technology

    • High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz
    • RF bandwidth to 500 MHz
    • Long probe life: > 250,000 contacts
    • Beryllium-copper tips for gold pads or tungsten for aluminum pads
    • Oscillation-free testing of wide-bandwidth analog circuits
    • Use with ACP series probes to provide functional at-speed testing for known-good-die
    • Mix multiple contact types: Ground, Power (Standard or Eye-Pass), Logic/Signal
    • Low and repeatable contact resistance on aluminum pads ( < 0.25 Ω on Al, < 0.01 Ω on Au)

     


Showing 49–64 of 319 results

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