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Products

TMetrix carries the following test and measurement products:

Showing 49–64 of 312 results


    • Channel Configurations: Available in 2, 4, and 8-channel models.
    • High Sampling Rate: Up to 12.32 GS/s in RF mode for high-frequency applications.
    • Superior Resolution: 16-bit vertical resolution for ultra-precise signal generation.
    • Waveform Memory: 4 Gpts per channel, ensuring long-duration complex waveform storage.
    • High Output Voltage: Up to 5 Vpp output voltage with ±2.5 V baseline offset (50 Ohm).

     

  • Multiple Bandwidth Options: 100 MHz, 200 MHz, and 350 MHz
    Fast Sampling Rate: Up to 2 GS/s (interleaved) for high-speed signal acquisition
    Extended Memory Depth: Up to 28 Mpts per channel for capturing intricate signal variations
    Serial Bus Trigger and Decode: Built-in support for I2C, SPI, UART, RS232, CAN, LIN
    Waveform Sequence Recorder: Capture and playback up to 80,000 recorded waveforms
    Advanced Triggering System: Includes Edge, Slope, Pulse Width, Window, Runt, Interval, and Pattern triggers
    Multi-Mode Display: Supports color temperature mapping and intensity grading for signal clarity
    MSO Upgrade Option: 16 digital channels available for mixed-signal debugging (on 4-channel models)
    Connectivity: USB, LAN, and external trigger output for remote data transfer and PC control

     

    • Bandwidth Options: 100 MHz, 200 MHz, 350 MHz, and 500 MHz.
    • Sampling Rate: Up to 2 GS/s (1 GS/s per channel in four-channel mode).
    • Memory Depth: Up to 200 Mpts in interleaved mode for extended signal capture.
    • High-Speed Capture: Waveform update rates of 120,000 wfm/s in standard mode and up to 500,000 wfm/s in sequence mode.
    • Advanced Triggers: Edge, Slope, Pulse Width, Window, Runt, Interval, Dropout, Pattern, and Serial triggering.
    • MSO Functionality: Optional 16 digital channels for mixed-signal analysis.
    • Waveform Recorder: History Mode allows users to store and replay up to 90,000 waveforms.
    • Comprehensive Math Functions: Includes FFT, differentiation, integration, and enhanced resolution modes.
    • 256-Level Intensity Grading: Color temperature display for identifying rare signal events.
    • Connectivity: USB Host, USB Device, LAN, and External Trigger support for seamless data transfer and remote control.

     

    • High Bandwidth & Sampling Rate: Models available in 200 MHz, 350 MHz, 500 MHz, and 1 GHz with up to 5 GS/s sample rate.
    • Deep Memory Capture: Up to 250 Mpts in interleaved mode, allowing detailed waveform analysis.
    • Advanced Triggering & Waveform Capture: Zone Triggering, History Mode (100,000 waveforms), and a waveform capture rate of 500,000 wfm/s.
    • Math & Measurement Functions: 9 basic math functions (FFT, addition, subtraction, multiplication, division, etc.) and 50+ automatic measurement parameters.
    • Bode Plot & Power Analysis: Standard features include Bode Plot for frequency response testing and comprehensive power analysis for applications like power quality assessment, current harmonics, inrush current, and switching loss.
    • Mixed Signal Debugging: Optional 16-channel MSO capability for digital signal acquisition.
    • Connectivity & Remote Access: USB, LAN, and embedded web server for remote control and data analysis.

     

    • Available in 4.5-digit (60,000 count) and 6.5-digit (2,200,000 count) resolutions.
    • Wide measurement range:
      • DC Voltage: Up to 1000V
      • AC Voltage: Up to 750V (True RMS)
      • Current: 10A (AC/DC)
      • Resistance: 100MΩ (2-wire/4-wire)
      • Capacitance: 2nF – 100mF
      • Temperature measurements with TC and RTD sensor support.
    • High-speed measurements:
      • T3DMM4-5: 150 readings per second
      • T3DMM6-5: 10,000 readings per second
    • Advanced mathematical functions such as Max, Min, Standard Deviation, dBm/dB, Relative Measurement, Pass/Fail Analysis, and Histograms.
    • Connectivity: USB Device, USB Host, and LAN for remote operation via SCPI commands.
    • Data Storage: 1GB NAND flash memory for saving configuration files and test data.
    • Built-in cold junction compensation for accurate temperature measurements.
    • File management system supporting U-disc and local storage for convenient data access.
    • Comprehensive user interface with a dual-display system for easy navigation.
    • Automatic measurement functions, including statistical analysis, gating, and reference functions.

     

  • The TESLA300 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables the collection of accurate high-voltage and high-current measurement data up to 3 kV (triaxial) / 10 kV (coaxial) and 200 A (standard) / 600 A (high current), with complete operator safety.

    • Protocol reports
    • Generation of waveforms with synchronous data acquisition
    • Modular Expandable
    • Individual Waveform Generation
    • Standard Libraries included
    • Unlimited Waveform size
    • 2 different Waveforms synchronously
    • DLL’s for LabView, Vector CANoe / CAPL, C#, C++, ANSI C, Python, etc.
    • Simulation of imported oscilloscope waveform

     

  • BOLAB revolutionizes EV testing with powerful, flexible, and modular HV Electric Vehicle Test Systems. These solutions offer high-speed testing, covering diverse profiles and budgets. Features include a modular design, adaptability, and WaveMaster Software for custom waveforms. Benefit from efficiency, precision, and cost-efficiency in EV testing. Discover the future of high-speed testing with BOLAB’s innovative solutions.

    • 20 Amp Operation: Full performance with 20 amp service
    • Automatic Power Reduction: Reduces power usage during idle periods
    • Heat Only Mode: Reduces power usage when cold temperatures are not used
    • WhisperStream Technology: quieter, smooth-sounding operation, 56 dBA
    • Frost Free Test Environment: dry air purge for tester interface, prevents condensation:
      0.5 to 3scfm (0.25 to 1.5 l/s)
    • Heated Defrost: quickly removes moisture buildup from internal chiller
    • DUT Temperature Control : Proprietary control algorithm enables DUT temperature to be directly controlled
    • Transition Rate*
      -55 to +125°C, approx. 10 seconds
      125 to -55°C, approx. 10 seconds
    • System Airflow Output*
      4 to 18scfm (1.9 to 8.5 l/s) Continuous
    • Temperature Range*
      -80 to +225°C (60Hz) No LN2 or LCO2 Required

     

    • 3 GHz RF Analog Signal Generator
    • Extremely fast switching speed of <100μs
    • AM, FM, PM Sweep & Pulse Modulation
    • Extra small, compact module platform
    • Exceptionally Low Phase Noise of -145dBc/Hz @100MHz and 10@kHz offset
    • SPI and micro-USB integrated interfaces
    • Remotely programmable via MATLAB, Python, LabVIEW
    • and other software programming environments.
    • Flixible modular platform for OEM and custom requirements
    • and applications, to satisfy specific customer demands.
    • Multi instrument synchronization capability

     

    • Vector Network Analyzer (option up to 26.5GHz)
    • WinCal XE calibration software
    • Uses best measurement practices for optimized measurements
    • Known measurement accuracy traced back to independent standards
    • Supported by the measurement experts to make you successful
    • Best in class RF performance
    • Small benchtop footprint
    • Industry standard calibration techniques
    • Extended 2 Year warranty on FormFactor products for educational customers

     

    • Re-configurable for DC, RF, mmW, FA, WLR and more
    • table and repeatable measurements over a wide thermal range
    • Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
    • Minimize AC and spectral noise
    • Manual 3-axis stage with ergonomic controls
    • Fast, accurate “hands on” wafer positioning
    • Quick, safe, and comfortable wafer access

     

    • Comfortable and ergonomic operation
    • Thermal range ambient to +300°C
    • RF/microwave device characterization, FA and design debug
    • Seamless integration between Velox and analyzers/measurement software
    • Complete solutions using probe positioners and probe cards
    • Achieve unsurpassed RF/mmW measurement and calibration accuracy with integrated RF tools and WinCal
    • Shortest signal path test integration for accurate, thermally stable, and low-error data collection
    • Powerful automation tools, reduce total test time on wafers, singulated dies, and modules
    • Faster time to first data for standard and “hard to test” devices such as thin wafer, small pad and high power
    • Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact

     

  • Genius Education Kits Overview

     

    • Flexibility
      • Temperatures range from -60°C to +300°C
      • Surfaces are nickel or gold-plated
      • Hybrid chuck design – operation with and without cooling unit
      • Field-upgradeable: On-site cold upgrades for all main prober platforms
    • Highest Efficiency for Reduced Cost of Test
      • Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
      • Up to 15% faster transition times than other systems on the market
    • Low Thermal Resistance
      • Low Thermal Resistance Technology
      • MultiSense with multiple temperature sensors
      • Best temperature accuracy and uniformity
    • Superior Electrical Performance
      • Isolated from ground
      • Includes a jack for grounding and biasing
      • Highly planar chuck surface for consistant contact force and overtravel

     

  • PureLine 3 Technology

    First automated probe station to achieve -190dB spectral noise*

    Plug In and Go

    Integrated TestCell Power Management provides fully managed and filtered AC power to the entire system, prober and instruments

    Autonomous 24/7 Operation

    Up to 4x faster flicker noise thermal testing on 30 μm pads

    Reduce Setup Time and Costs
    Exclusive low noise site survey, and system verification services

     


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