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FormFactor (Cascade Microtech) High-Current Probe (HCP)

Test power devices on wafer with high-performance and low-contact resistance on smaller pads

  • Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
  • Measure devices on wafer at high-current conditions over a wide temperature range (-55°C to 300°C)
  • Small scrub minimizes damage on Al pad
  • Small footprint – tip for small pad probing down to 1 mm x 1 mm pad

 

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Description

High Current Probe

FormFactor Beaverton High-Current Probe

High Current Probe

HCP PROBE

FormFactor Beaverton’s High-Current Probe (HCP) reduces probe and/or device destruction at high currents. It supports 10 A DC and up to 100 A of pulsed current. By design, the probe tip minimizes contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger probe tip design distributes current evenly over multiple contact points and is joined by a single heat sink that pulls pull heat from the probe tip. FormFactor Beaverton High-Current Probe

HCP Probe Holder

Maximum voltage 500 V DC Maximum current (DC) 10 A
Maximum current (pulse) 100 A, 1 msec max PW, 1% max duty cycle (BNC: 40 A, 1 msec max PW, 1% max duty cycle)
Total resistance with tip 10 mΩ (typical)
Operating temperature range -55°C to 300°C
Isolation resistance > 100 GΩ at 500 V
Connector type Dual banana jack or BNC
Length of cable 1 m (BNC: 0.76 m)
Positioner compatibility Summit RF positioner

contact points and is joined by a single heat sink that pulls pull heat from the probe tip.High Current Probe Overview

Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip. FormFactor Beaverton High-Current Probe

High Current Probe Key Features 

  • Enables wafer probing up to 60A pulsed/10A DC
  • Innovative multi-fingertip design provides even distribution of current
  • Supports up to 500V
  • Replaceable Tungsten probe tips
  • Temperature range of -55 to 300ºC
  • Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
  • Prevents against thermal runaway
  • Measure devices on wafer at higher currents than ever before
  • Small scrub minimizes damage to aluminum pad
  • Small footprint – tip fits on a 1mm pad
FormFactor Beaverton High Current Probe

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ACA TMetrix Inc. is a leading supplier of test instruments and design tools in Canada. For over 50 years we have provided services and support for products that are manufactured by the world's leading instrument suppliers.

TMetrix Ltd. is Part of the ACA Group of Companies. Allan Crawford Associates (ACA), is one of Canada's largest distributors of electronic components, test equipment, and scientific solutions.

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